Author: United States. Division of Vocational EducationPublisher:
ISBN:
Category : Electrical engineering
Languages : en
Pages : 120
Book Description
Electronic Technology
Author: Electron Beam Pasteurization and Complementary Food Processing Technologies
Author: Suresh PillaiPublisher: Elsevier
ISBN: 1782421084
Category : Technology & Engineering
Languages : en
Pages : 355
Book Description
Food safety is a constant challenge for the food industry, and food irradiation technology has developed significantly since its introduction, moving from isotope irradiation to the use of electron beam technology. Electron Beam Pasteurization and Complementary Food Processing Technologies explores the application of electron beam pasteurization in conjunction with other food processing technologies to improve the safety and quality of food. Part one provides an overview of the issues surrounding electron beam pasteurization in food processing. Part two looks at different thermal and non-thermal food processing technologies that complement irradiation. Finally, a case study section on the commercial applications of e-beam processing provides examples from industry.
Energy Data Base
Author: A Rigorous Correction Procedure for Quantitative Electron Probe Microanalysis (COR 2)
Author: Jean HénocPublisher:
ISBN:
Category : Electron probe microanalysis
Languages : en
Pages : 136
Book Description
Mobile Alternative Demilitarization Technologies
Author: F.W. HolmPublisher: Springer Science & Business Media
ISBN: 9401155267
Category : Science
Languages : en
Pages : 285
Book Description
FRANCIS W. HOLM 7102 Meadow Lane, Chevy Chase, MD 20815 The North Atlantic Treaty Organization (NATO) sponsored an Advanced Research Workshop (ARW) in Prague, Czech Republic, on 1-2 July 1996, to collect and study information on mobile alternative and supplemental demilitarization technologies and to report these fmdings. The mobile, or transportable, technologies identified for assessment at the workshop are alternatives to incineration technology for destruction of munitions, chemical warfare agent, and associated materials and debris. Although the discussion focused on the treatment of metal parts and explosive or energetic material, requirements for decontamination of other materials were discussed. The mobile alternative technologies are grouped into three categories based on process bulk operating temperature: low (0-200 C), medium (200-600 C), and high (600- 3,500 C). Reaction types considered include hydrolysis, biodegradation, electrochemical oxidation, gas-phase high-temperature reduction, stearn reforming, gasification, sulfur reactions, solvated electron chemistry, sodium reactions, supercritical water oxidation, wet air oxidation, and plasma torch technology. These categories represent a broad spectrum of processes, some of which have been studied only in the laboratory and some of which are in commercial use for destruction of hazardous and toxic wastes. Some technologies have been developed and used for specific commercial applications; however, in all cases, research, development, test, and evaluation (RDT &E) is necessary to assure that each technology application is effective for destroying chemical warfare materiel.
Potential Applicability of Assembled Chemical Weapons Assessment Technologies to RCRA Waste Streams and Contaminated Media
Author: Publisher: DIANE Publishing
ISBN: 1428902074
Category : Chemical agents (Munitions)
Languages : en
Pages : 88
Book Description
A Simple Correction Procedure for Quantitative Electron Probe Microanalysis
Author: Publisher:
ISBN:
Category : Electron probe microanalysis
Languages : en
Pages : 60
Book Description
Market Intelligence Report: Connectors
Author: Publisher: Global Sources
ISBN: 9789627853718
Category :
Languages : en
Pages : 170
Book Description
Use of Monte Carlo Calculations in Electron Probe Microanalysis and Scanning Electron Microscopy
Author: Kurt F. J. HeinrichPublisher:
ISBN:
Category : Electron probe microanalysis
Languages : en
Pages : 180
Book Description
Automated Scanning Low-energy Electron Probe (ASLEEP) for Semiconductor Wafer Diagnostics
Author: A. ChristouPublisher:
ISBN:
Category : Probes (Electronic instruments).
Languages : en
Pages : 44
Book Description