Electron Diffraction and Microscopy Studies of the Structure of Grain Boundaries in Silicon. MSC Report PDF Download
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Author: Publisher: ISBN: Category : Languages : en Pages :
Book Description
The diffraction effects expected from the periodic structure of twist boundaries in Si were determined by an examination of the reciprocal lattice of these boundaries. Methods of analysis were developed to distinguish between the real diffraction spots due to the periodic boundary structure and those due to double diffraction effects. The electron microscope images for the boundaries studied in Si bicrystals frequently were complex and contained Moire fringes which provided no information on the actual boundary structure. By analyzing the electron diffraction patterns from these boundaries for the presence of new diffraction spots it was possible to show that all the .sigma.1 (001), .sigma.1 (111), and .sigma.3 (111) twist boundaries examined have a periodic structure.
Author: Publisher: ISBN: Category : Languages : en Pages :
Book Description
The diffraction effects expected from the periodic structure of twist boundaries in Si were determined by an examination of the reciprocal lattice of these boundaries. Methods of analysis were developed to distinguish between the real diffraction spots due to the periodic boundary structure and those due to double diffraction effects. The electron microscope images for the boundaries studied in Si bicrystals frequently were complex and contained Moire fringes which provided no information on the actual boundary structure. By analyzing the electron diffraction patterns from these boundaries for the presence of new diffraction spots it was possible to show that all the .sigma.1 (001), .sigma.1 (111), and .sigma.3 (111) twist boundaries examined have a periodic structure.
Author: Valerie Randle Publisher: ISBN: 9780203736401 Category : Electronic books Languages : en Pages :
Book Description
"As the selection of material for particular engineering properties becomes increasingly important in keeping costs down, methods for evaluating material properties also become more relevant. One such method examines the geometry of grain boundaries, which reveals much about the properties of the material.Studying material properties from their geometrical measurements, The Measurement of Grain Boundary Geometry provides a framework for a specialized application of electron microscopy for metals and alloys and, by extension, for ceramics, minerals, and semiconductors. The book presents an overview of the developments in the theory of grain boundary geometry and its practical applications in material engineering. It also covers the tunneling electron microscope (TEM), experimental aspects of data collection, data processing, and examples from actual investigations. Each step of the analysis process is clearly described, from data collection through processing, analysis, representation, and display to applications. The book also includes a glossary of terms.Exploring both the experimental and analytical aspects of the subject, this practical reference guide is essential for researchers and students involved in material properties, whether in physics, materials science, metallurgy, or physical chemistry."--Provided by publisher.
Author: P. E. J. Flewitt Publisher: Wiley ISBN: 9780471979517 Category : Technology & Engineering Languages : en Pages : 0
Book Description
Over recent years the understanding of grain boundaries, interphase boundaries and free surfaces has advanced greatly, leading to a clear recognition that these discontinuities make a significant contribution to the physical and mechanical properties of materials from multiphase metals and alloys to electronic materials. Grain Boundaries -Their Microstructure and Chemistry discusses the interrelationship between microstructure and chemistry of the grain boundary, with particular emphasis on the influence of the environment (air, liquid and liquid metal) and composition (bulk and impurity). This highly practical volume presents a brief background to interphase and grain boundaries, before considering in detail grain boundary composition and composition changes, and how grain boundary composition affects material properties. Very recent advances in techniques such as electron energy loss spectroscopy, high-resolution transmission electron microscopy and atom probe, and the facinating new insights into grain boundary, microstructure that they have revealed, are also discussed. Grain Boundaries - Their Microstructure and Chemistry is an indispensable text for design and safety engineers in many industries, including power and aerospace, as well as for materials scientists and engineers in academia and research institutes.
Author: Vicki J. Keast Publisher: ISBN: Category : Electron microscopy Languages : en Pages : 316
Book Description
Changes in the electronic structure, and hence bonding, at the grain boundaries in the presence of the segregants has been examined using the electron energy loss near edge structure (ELNES). In the embrittling systems of S-doped Ni and Sb-doped Cu, extra intensity in the ionization edge, just above the edge onset, was observed and is consistent with earlier measurements on Bi-doped Cu. No effect was seen with segregation of the non-embrittling Ag. The embrittling impurities are believed to reduce cohesion at the grain boundaries by changing the shape of the d-band, through bond rehybridization, and it is this change in shape that is observed as the extra intensity in the ELNES.
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Author: Cornell University. College of Engineering
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Author: Wilfried Reinhold Wagner
Author: Valerie Randle
Author: Fu-Rong Chen
Author: P. E. J. Flewitt
Author: Vicki J. Keast