Author: Publisher:
ISBN:
Category : Electric measurements
Languages : en
Pages : 68
Book Description
Handbook of Metrology and Applications
Author: Dinesh K. AswalPublisher: Springer Nature
ISBN: 9819920744
Category : Technology & Engineering
Languages : en
Pages : 2504
Book Description
This handbook provides comprehensive and up-to-date information on the topic of scientific, industrial and legal metrology. It discusses the state-of-art review of various metrological aspects pertaining to redefinition of SI Units and their implications, applications of time and frequency metrology, certified reference materials, industrial metrology, industry 4.0, metrology in additive manufacturing, digital transformations in metrology, soft metrology and cyber security, optics in metrology, nano-metrology, metrology for advanced communication, environmental metrology, metrology in biomedical engineering, legal metrology and global trade, ionizing radiation metrology, advanced techniques in evaluation of measurement uncertainty, etc. The book has contributed chapters from world’s leading metrologists and experts on the diversified metrological theme. The internationally recognized team of editors adopt a consistent and systematic approach and writing style, including ample cross reference among topics, offering readers a user-friendly knowledgebase greater than the sum of its parts, perfect for frequent consultation. Moreover, the content of this volume is highly interdisciplinary in nature, with insights from not only metrology but also mechanical/material science, optics, physics, chemistry, biomedical and more. This handbook is ideal for academic and professional readers in the traditional and emerging areas of metrology and related fields.
NBSIR.
Author: Publisher:
ISBN:
Category : Research, Industrial
Languages : en
Pages : 160
Book Description
Metrology for Inclusive Growth of India
Author: Dinesh K. AswalPublisher: Springer Nature
ISBN: 9811588724
Category : Technology & Engineering
Languages : en
Pages : 1084
Book Description
This book describes the significance of metrology for inclusive growth in India and explains its application in the areas of physical–mechanical engineering, electrical and electronics, Indian standard time measurements, electromagnetic radiation, environment, biomedical, materials and Bhartiya Nirdeshak Dravyas (BND®). Using the framework of “Aswal Model”, it connects the metrology, in association with accreditation and standards, to the areas of science and technology, government and regulatory agencies, civil society and media, and various other industries. It presents critical analyses of the contributions made by CSIR-National Physical Laboratory (CSIR-NPL), India, through its world-class science and apex measurement facilities of international equivalence in the areas of industrial growth, strategic sector growth, environmental protection, cybersecurity, sustainable energy, affordable health, international trade, policy-making, etc. The book will be useful for science and engineering students, researchers, policymakers and entrepreneurs.
Publications of the National Institute of Standards and Technology ... Catalog
Author: National Institute of Standards and Technology (U.S.)Publisher:
ISBN:
Category : Government publications
Languages : en
Pages : 464
Book Description
Technical News Bulletin
Author: Metrology for 5G and Emerging Wireless Technologies
Author: Tian Hong LohPublisher: IET
ISBN: 1839532785
Category : Technology & Engineering
Languages : en
Pages : 765
Book Description
This edited book is the first to focus on metrology for current and future wireless communication technologies. It presents a comprehensive overview of the state-of-the-art measurement capabilities, testbeds and relevant R&D activities for 5G and emerging wireless technologies at a wide range of frequencies up to THz frequency bands.
NISTIR.
Author: Advanced Mathematical And Computational Tools In Metrology And Testing X
Author: Franco PavesePublisher: World Scientific
ISBN: 9814678635
Category : Mathematics
Languages : en
Pages : 446
Book Description
This volume contains original and refereed contributions from the tenth AMCTM Conference (www.nviim.ru/AMCTM2014) held in St. Petersburg (Russia) in September 2014 on the theme of advanced mathematical and computational tools in metrology and testing.The themes in this volume reflect the importance of the mathematical, statistical and numerical tools and techniques in metrology and testing and, also keeping the challenge promoted by the Metre Convention, to access a mutual recognition for the measurement standards.
Publications
Author: United States. National Bureau of StandardsPublisher:
ISBN:
Category : Government publications
Languages : en
Pages : 788
Book Description
Terahertz Metrology
Author: Mira NaftalyPublisher: Artech House
ISBN: 1608077772
Category : Technology & Engineering
Languages : en
Pages : 386
Book Description
This new book describes modern terahertz (THz) systems and devices and presents practical techniques for accurate measurement with an emphasis on evaluating uncertainties and identifying sources of error. This is the first THz book on the market to address measurement methodologies and issues -- perfect for practitioners and aspiring practitioners wishing to learn good measurement practice and avoid pitfalls. This book provides a brief review of different THz systems and devices, followed by chapters detailing the measurement issues encountered in using each of the main types of THz systems, and a guide to performing measurements rigorously. Particular attention is given to evaluating uncertainties, and recognizing potential sources of errors. The main focus is on time-domain spectroscopy, by far the most widely used technique. Readers are also presented with examples of applications with the emphasis on utility, both in research and in industry.