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Electrical Characterization and Reliability Study of Amorphous Indium-gallium-zinc Oxide Thin-film Transistors

Electrical Characterization and Reliability Study of Amorphous Indium-gallium-zinc Oxide Thin-film Transistors PDF Author: 馮正倫
Publisher:
ISBN:
Category :
Languages : en
Pages :

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Electrical Characterization and Reliability Study of Amorphous Indium-gallium-zinc Oxide Thin-film Transistors

Electrical Characterization and Reliability Study of Amorphous Indium-gallium-zinc Oxide Thin-film Transistors PDF Author: 馮正倫
Publisher:
ISBN:
Category :
Languages : en
Pages :

Book Description


Amorphous Oxide Semiconductors

Amorphous Oxide Semiconductors PDF Author: Hideo Hosono
Publisher: John Wiley & Sons
ISBN: 1119715652
Category : Technology & Engineering
Languages : en
Pages : 644

Book Description
AMORPHOUS OXIDE SEMICONDUCTORS A singular resource on amorphous oxide semiconductors edited by a world-recognized pioneer in the field In Amorphous Oxide Semiconductors: IGZO and Related Materials for Display and Memory, the Editors deliver a comprehensive account of the current status of—and latest developments in—transparent oxide semiconductor technology. With contributions from leading international researchers and exponents in the field, this edited volume covers physical fundamentals, thin-film transistor applications, processing, circuits and device simulation, display and memory applications, and new materials relevant to amorphous oxide semiconductors. The book makes extensive use of structural diagrams of materials, energy level and energy band diagrams, device structure illustrations, and graphs of device transfer characteristics, photographs and micrographs to help illustrate the concepts discussed within. It also includes: A thorough introduction to amorphous oxide semiconductors, including discussions of commercial demand, common challenges faced during their manufacture, and materials design Comprehensive explorations of the electronic structure of amorphous oxide semiconductors, structural randomness, doping limits, and defects Practical discussions of amorphous oxide semiconductor processing, including oxide materials and interfaces for application and solution-process metal oxide semiconductors for flexible electronics In-depth examinations of thin film transistors (TFTs), including the trade-off relationship between mobility and reliability in oxide TFTs Perfect for practicing scientists, engineers, and device technologists working with transparent semiconductor systems, Amorphous Oxide Semiconductors: IGZO and Related Materials for Display and Memory will also earn a place in the libraries of students studying oxides and other non-classical and innovative semiconductor devices. WILEY SID Series in Display Technology Series Editor: Ian Sage, Abelian Services, Malvern, UK The Society for Information Display (SID) is an international society which has the aim of encouraging the development of all aspects of the field of information display. Complementary to the aims of the society, the Wiley-SID series is intended to explain the latest developments in information display technology at a professional level. The broad scope of the series addresses all facets of information displays from technical aspects through systems and prototypes to standards and ergonomics.

Analysis of Material Property and Reliability Testing of Thin-film Transistor of Amorphous Indium-Gallium-Zinc-Oxide

Analysis of Material Property and Reliability Testing of Thin-film Transistor of Amorphous Indium-Gallium-Zinc-Oxide PDF Author: 徐國修
Publisher:
ISBN:
Category :
Languages : en
Pages :

Book Description


Investigating the Electrical Characteristics of Amorphous Indium Gallium Zinc Oxide Thin Film Transistors

Investigating the Electrical Characteristics of Amorphous Indium Gallium Zinc Oxide Thin Film Transistors PDF Author: 吳昱陞
Publisher:
ISBN:
Category :
Languages : en
Pages : 99

Book Description


High Mobility and Enhanced Reliability Amorphous Indium-gallium-zinc Oxide Thin-film Transistors

High Mobility and Enhanced Reliability Amorphous Indium-gallium-zinc Oxide Thin-film Transistors PDF Author: 羅傑
Publisher:
ISBN:
Category :
Languages : en
Pages :

Book Description


Material Analysis, Electrical Characterization, and Reliability Test of Amorphous InGaZnO Thin Film Transistors

Material Analysis, Electrical Characterization, and Reliability Test of Amorphous InGaZnO Thin Film Transistors PDF Author: 戴安閎
Publisher:
ISBN:
Category :
Languages : en
Pages :

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Optical Analysis and Reliability Testing of Dual Gate Thin-film Transistor of Amorphous Indium-gallium-zinc-oxide

Optical Analysis and Reliability Testing of Dual Gate Thin-film Transistor of Amorphous Indium-gallium-zinc-oxide PDF Author: 黃冠彰
Publisher:
ISBN:
Category :
Languages : en
Pages :

Book Description


Reliability and Physical Mechanisms of Amorphous Indium Gallium Zinc Oxide Thin-Film Transistors for Advanced Display

Reliability and Physical Mechanisms of Amorphous Indium Gallium Zinc Oxide Thin-Film Transistors for Advanced Display PDF Author:
Publisher:
ISBN:
Category :
Languages : en
Pages : 179

Book Description


Electrical Characterization and Reliability Study of Amorphous IGZO TFTs

Electrical Characterization and Reliability Study of Amorphous IGZO TFTs PDF Author: 陳藏龍
Publisher:
ISBN:
Category :
Languages : en
Pages :

Book Description


Electrical Characteristics of Amorphous Indium-gallium-zinc-oxide Thin-film Transistors and Enhanced Ultra-thin-body Mosfets by Charged Buried Oxide

Electrical Characteristics of Amorphous Indium-gallium-zinc-oxide Thin-film Transistors and Enhanced Ultra-thin-body Mosfets by Charged Buried Oxide PDF Author: 林軒毅
Publisher:
ISBN:
Category :
Languages : en
Pages :

Book Description