Radiation Effects in Advanced Semiconductor Materials and Devices PDF Download
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Author: C. Claeys Publisher: Springer Science & Business Media ISBN: 3662049740 Category : Science Languages : en Pages : 424
Book Description
This wide-ranging book summarizes the current knowledge of radiation defects in semiconductors, outlining the shortcomings of present experimental and modelling techniques and giving an outlook on future developments. It also provides information on the application of sensors in nuclear power plants.
Author: C. Claeys Publisher: Springer Science & Business Media ISBN: 3662049740 Category : Science Languages : en Pages : 424
Book Description
This wide-ranging book summarizes the current knowledge of radiation defects in semiconductors, outlining the shortcomings of present experimental and modelling techniques and giving an outlook on future developments. It also provides information on the application of sensors in nuclear power plants.
Author: Shin-ichi Nakashima Publisher: CRC Press ISBN: Category : Design Languages : en Pages : 1158
Book Description
The special advantages of silicon carbide and related materials such as III-V nitrides in applications in hostile environments and for blue-light-emitting diodes continue to stimulate research and development activity. The International Conference on Silicon Carbide and related Materials is now the established forum for exchanging information on advances in this subject. This volume includes both invited and contributed papers covering the whole field of silicon carbide and related materials research, from the fundamental physics of these materials, through their growth, control of properties, characterization, surface and interface modification, device processing and fabrication, to simulation and modelling. Materials scientists, electronic engineers and solid state physicists who work with these materials, as well as those who are contemplating research in this expanding field, will find this a unique single source of information.
Author: C. Claeys
Author: C. Claeys
Author: Materials Research Society. Meeting
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Author: Shin-ichi Nakashima
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