Effects of Low Energy Protons and High Energy Electrons on Silicon PDF Download

Author: J. R. Carter
Publisher:
ISBN:
Category : Electrons
Languages : en
Pages : 68

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Author:
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ISBN:
Category : Aeronautics
Languages : en
Pages : 1126

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Lists citations with abstracts for aerospace related reports obtained from world wide sources and announces documents that have recently been entered into the NASA Scientific and Technical Information Database.

Author:
Publisher:
ISBN:
Category : Nuclear energy
Languages : en
Pages : 1110

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Author: D. W. Aitken
Publisher:
ISBN:
Category :
Languages : en
Pages : 21

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The measured response characteristics of lithium drifted silicon radiation detectors at 295 deg. K and 79 deg. K are presented for protons with energies from 31.5 to 350 MeV; for positive pions with energies from 50.2 to 206 MeV; and for electrons with energies from 265 keV to 767.2MeV. Analysis of the energy loss spectra confirms that the energy is being deposited by the protons and pions in the silicon purely through collision losses, whereas it appears that the silicon absorbs additional energy lost by the high energy electrons through interaction of the bremsstrahlung radiation in the depletion region. The charge collection efficiency determined by gamma rays is shown to agree with the charge collection efficiency determined by minimum ionizing particles. Nonlinear effects caused by unequal electron and hole trapping lengths and surface effects lead to reduced charge collection efficiencies for low energy electrons which do not completely penetrate the detector depletion region, in agreement with theory and with observations in the x-ray region. Apparent recombination effects also lead to reduced charge collection efficiencies at low field or for protons with energies below about 100 MeV under constant bias conditions. The present data support the conclusion that the charge conversion factor at any one temperature is constant to with 1% for electrons, pions and protons over the entire energy span measured. (Author).

Author: United States. National Aeronautics and Space Administration Scientific and Technical Information Division
Publisher:
ISBN:
Category : Aeronautics
Languages : en
Pages : 2300

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Author: Lennart Lindborg
Publisher: CRC Press
ISBN: 1482217430
Category : Science
Languages : en
Pages : 204

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Experimental microdosimetry deals with the measurement of charged particle energy deposition in tissue equivalent volumes, ranging in size from nanometres to micrometres. Microdosimetry is employed to improve our understanding of the relationship between radiation energy deposition, the resulting biological effects, and the appropriate quantities to be used in characterizing and quantifying radiation quality. Although many reviews and contributions to the field have been published over the past fifty years, this new book is the first to provide a single, up to date, and easily accessible account of experimental microdosimetry. This book is designed to be used in medical, radiation, and health physics courses and by Master’s and PhD students. In addition to serving as an introductory text to the field for graduate students, this book will also be of interest as a teaching and reference resource for graduate supervisors and established researchers. Drs. Lennart Lindborg and Anthony Waker have spent a life-time career in experimental microdosimetry research in academic, industrial and regulatory environments and have observed the development of the field from its early days as a recognized discipline; they bring to this book particular knowledge and experience in the design, construction, operation and use of tissue equivalent gas ionization counters and chambers.

Author: H. Y. Tada
Publisher:
ISBN:
Category : Solar batteries
Languages : en
Pages : 828

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Author: United States. National Aeronautics and Space Administration. Scientific and Technical Information Division
Publisher:
ISBN:
Category : Aeronautics
Languages : en
Pages : 1156

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Author: United States. National Aeronautics and Space Administration. Scientific and Technical Information Division
Publisher:
ISBN:
Category : Aeronautics
Languages : en
Pages : 2084

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Book Description

Author: Donald T. Hawkins
Publisher: Springer Science & Business Media
ISBN: 1468413872
Category : Science
Languages : en
Pages : 305

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Book Description
Auger electron spectroscopy is rapidly developing into the single most powerful analytical technique in basic and applied science.for investigating the chemical and structural properties of solids. Its ex plosive growth beginning in 1967 was triggered by the development of Auger analyzers capable of de tecting one atom layer of material in a fraction of a second. Continued growth was guaranteed firstly by the commercial availability of apparatus which combined the capabilities of scanning electron mi croscopy and ion-mill depth profiling with Auger analysis, and secondly by the increasing need to know the atomistics of many processes in fundamental research and engineering applications. The expanding use of Auger analysis was accompanied by an increase in the number of publications dealing with it. Because of the developing nature of Auger spectroscopy, the articles have appeared in many different sources covering diverse disciplines, so that it is extremely difficult to discover just what has or has not been subjected to Auger analysis. In this situation, a comprehensive bibliography is obviou-sly useful to those both inside and outside the field. For those in the field, this bibliography should be a wonderful time saver for locating certain references, in researching a particular topic, or when considering various aspects of instrumentation or data analysis. This bibliography not only provides the most complete listing of references pertinent to surface Auger analysis available today, but it is also a basis for extrapolating from past trends to future expectations.