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Author: Eric Peter Goodwin Publisher: ISBN: Category : Languages : en Pages : 357
Book Description
The second interferometer is a Mach-Zehnder interferometer with a tunable HeNe laser light source. This interferometer measures the optical path length (OPL) of the test sample in the cuvette in transmission as a function of five wavelengths in the visible spectrum. This is done using phase-shifting interferometry. Multiple thickness regions are used to solve 2pi phase ambiguities in the OPL.
Author: Eric Peter Goodwin Publisher: ISBN: Category : Languages : en Pages : 357
Book Description
The second interferometer is a Mach-Zehnder interferometer with a tunable HeNe laser light source. This interferometer measures the optical path length (OPL) of the test sample in the cuvette in transmission as a function of five wavelengths in the visible spectrum. This is done using phase-shifting interferometry. Multiple thickness regions are used to solve 2pi phase ambiguities in the OPL.
Author: Yang Zhao Publisher: ISBN: Category : Languages : en Pages : 194
Book Description
"Measuring physical dimensions has always been one of the challenges for optical metrology. Specifically, the thickness is often a prerequisite piece of information for other optical properties when characterizing components and materials. For example, when measuring the index of refraction of materials using interferometric methods, the direct measurement is optical path length difference. To acquire index of refraction with high accuracy, the thickness must be predetermined with correspondingly high accuracy as well. In this dissertation, a prototype low-coherence interferometer system is developed through several design iterations to measure the absolute thickness map of a plane-parallel samples in a nondestructive manner. The prototype system is built with all off-the-shelf components in a configuration that combines a Twyman-Green interferometer and a Sagnac interferometer. The repeatability and accuracy of the measured thickness are characterized to be less than one micrometer. Based on the information acquired from the development of the prototype system, a permanent low-coherence interferometer system is designed and built to achieve a higher accuracy in thickness measurements, on the level of a hundred nanometers. A comprehensive uncertainty model is established for the thickness measurement using the low-coherence interferometer system. Additionally, this system is also capable of measuring the topography of both surfaces of the sample, as well as the wedge of the sample. This low-coherence dimensional metrology uses only the reflection signals from the sample surfaces. Thus, the measured physical dimensions are independent of the index of refraction, transparency, transmission, or homogeneity of the sample. In addition, a laser Sagnac interferometer is designed and built by repurposing the test arm of the low-coherence interferometer. The laser Sagnac interferometer provides a non-contact bulk index of refraction metrology for solid materials. The uncertainty model for the index of refraction measurement is detailed with analytical solutions. The laser Sagnac interferometer requires relatively simple sample preparation and fast turn-around time, which is suitable for applications in optical material research"--Pages x-xi.
Author: W. H. Steel Publisher: Cambridge University Press ISBN: 9780521311625 Category : Science Languages : en Pages : 328
Book Description
Enlarged and updated in 1983, this is the second edition of Dr Steel's popular textbook on interferometry. The text has been revised throughout and major additions have been made to reflect the phenomenal growth of laser techniques and applications. The book provides a general treatment that brings together the many different applications of the interference of light waves, light being used in its most general sense to include all electromagnetic radiation. The applications can cover precise measurement of length, the testing of optical components against a computed hologram, measurements of atmospheric pollution by infrared spectroscopy and many of the methods of radio astronomy and the measurement of size of visible stars. These apparently unrelated methods have a common theory, which the book presents and extends to each main field of application. It shows workers in one field how their problems relate to those in other fields, where they may have been solved already. The book will be found useful by anyone whose work involves one of the many applications of interferometric techniques.
Author: Eric Peter Goodwin
Author: Eric Peter Goodwin
Author: J. L. M. Nijholt
Author: Michael Robert Gluszczak
Author: Julius Lambertus Maria Nijholt
Author: Yang Zhao
Author: Carl Barus
Author: William B. Jollie (LT, USAF.)
Author: W. H. Steel
Author: James Dyson
Author: Richard O. Gilmer