Disordered Materials and Interfaces: Volume 407 PDF Download

Author: Herman Z. Cummins
Publisher:
ISBN:
Category : Science
Languages : en
Pages : 450

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Book Description
This book focuses on the fractal aspects of materials and disordered systems. Disorder plays a critical role in many naturally occurring and manufactured materials, both at the microscopic level (e.g., glasses) and the macroscopic level (e.g., foams, dendritic alloys, porous rock). The book addresses the dynamical processes involved in the formation and characterization of a wide range of disordered materials. Topics include: porous media; colloids; chemical reactions; dynamical aspects of the liquid-glass transition; disordered materials and surfaces and scaling and nanostructures.

Author: Eric D. Jones
Publisher:
ISBN:
Category : Technology & Engineering
Languages : en
Pages : 450

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Book Description
While the effects of spontaneous ordering or composition modulation on the properties of semiconductors and optoelectronic devices have been studied with great interest over the past several years, an understanding of the physics and chemistry of these two related phenomena is still in its infancy. This book brings together researchers from around the world to address issues concerning the physics, chemistry and growth parameters for spontaneous ordering and composition modulation. Developments in the use of artificial patterning to obtain new structured materials on a microscopic scale are featured. Advances in characterization techniques are also presented. Topics include: spontaneous ordering; self-assembled structures and quantum dots; self-organized epitaxial structures; composition modulation studies and optoelectronic materials.

Author: Raymond T. Tung
Publisher:
ISBN:
Category : Technology & Engineering
Languages : en
Pages : 680

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Book Description
Tremendous advances have been made in the use of silicides as contacts and interconnects in micro-electronic devices and as active layers in sensors. A flourish of novel fabrication concepts and characterization techniques has led to high-quality silicide devices and a better understanding of the electronic and micrometallurgical properties of their interfaces. However, the shrinking physical dimensions of ULSI devices beyond the deep submicron regime now poses new and serious materials challenges for the development of manufacturable silicide processes. Scientists and engineers from materials science, physics, chemistry, device, processing and other disciplines come together in this book to examine the current issues facing silicide thin-film applications. Topics include: silicide fundamentals - energetics and kinetics; processing of silicide thin films; ULSI issues; CVD silicides; semiconducting silicides; processing of germano-silicide thin films; silicides and analogs for IR detection; interfaces, surfaces and epitaxy; novel structures and techniques and properties of silicide thin films.

Author:
Publisher:
ISBN:
Category : Microelectronics
Languages : en
Pages : 616

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Book Description

Author: James S. Speck
Publisher:
ISBN:
Category : Science
Languages : en
Pages : 588

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Book Description
Our understanding and control of epitaxial oxide heterostructures has progressed along multiple frontiers including magnetic, dielectric, ferroelectric, and superconducting oxide materials. This has resulted in both independent rediscovery and the successful borrowing of ideas from ceramic science, solid-state physics, and semiconductor epitaxy. A new field of materials science has emerged which aims at the use of the intrinsic properties of various oxide materials in single-crystal thin-film form. Exploiting the potential of these materials, however, will only be possible if many fundamental and engineering questions can be answered. This book represents continued progress toward fulfilling that promise. Technical information on epitaxial oxide thin films from industry, academia and government laboratories is presented. Topics include: dielectrics; ferroelectrics; optics; superconductors; magnetics; magnetoresistance.

Author: Thomas B. Brill
Publisher:
ISBN:
Category : Science
Languages : en
Pages : 478

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Book Description
Energetic materials are distinguished from other materials primarily by the fact that rapid, exothermic reactions can be induced with the release of gaseous products. This complex phenomenon cuts across many boundaries of chemistry (synthesis, kinetics, thermodynamics, spectroscopy, quantum and molecular dynamics calculations, etc.) and engineering physics (shock and detonation waves, hydrodynamics, fracture and solid mechanics, defects, etc.). This volume offers the latest chemistry advancements in understanding the complex dynamic processes in these materials in the condensed phase. The focus is on fundamental research into the rates and pathways of rapid exothermic reactions, product specification, diagnostic methods, molecular processes of energy transfer, and molecular processes at extreme pressure and temperature. Many novel materials are discussed.

Author: Nicola Senesi
Publisher: John Wiley & Sons
ISBN: 0470511192
Category : Science
Languages : en
Pages : 340

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Book Description
This book aims to provide the scientific community with a novel and valuable approach based on fractal geometry concepts on the important properties and processes of diverse environmental systems. The interpretation of complex environmental systems using modern fractal approaches is compared and contrasted with the more classical approaches. The book will provide the fundamental knowledge necessary for solving practical environmental problems. Furthermore, it examinea how the fractal approach has been applied in order to understand the structure and reactivity of natural, environmental systems including flocs, sediments, soils, microorganisms and humic substances.

Author: William F. Filter
Publisher:
ISBN:
Category : Technology & Engineering
Languages : en
Pages : 616

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Book Description
MRS books on materials reliability in microelectronics have become the snapshot of progress in this field. Reduced feature size, increased speed, and larger area are all factors contributing to the continual performance and functionality improvements in integrated circuit technology. These same factors place demands on the reliability of the individual components that make up the IC. Achieving increased reliability requires an improved understanding of both thin-film and patterned-feature materials properties and their degradation mechanisms, how materials and processes used to fabricate ICs interact, and how they may be tailored to enable reliability improvements. This book focuses on the physics and materials science of microelectronics reliability problems rather than the traditional statistical, accelerated electrical testing aspects. Studies are grouped into three large sections covering electromigration, gate oxide reliability and mechanical stress behavior. Topics include: historical summary; reliability issues for Cu metallization; characterization of electromigration phenomena; modelling; microstructural evolution and influences; oxide and device reliability; thin oxynitride dielectrics; noncontact diagnostics; stress effects in thin films and interconnects and microbeam X-ray techniques for stress measurements.

Author: Efthimios Kaxiras
Publisher:
ISBN:
Category : Technology & Engineering
Languages : en
Pages : 642

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Book Description
Significant advances have been made towards understanding the properties of materials through theoretical approaches. These approaches are based either on first-principles quantum mechanical formulations or semi-empirical formulations, and have benefitted from increases in computational power. The advent of parallel computing has propelled the theoretical approaches to a new level of realism in modelling physical systems of interest. The theoretical methods and simulation techniques that are cur- rently under development are certain to become powerful tools in understanding, exploring and predicting the properties of existing and novel materials. This book discusses critically current developments in computations and simulational approaches specifically aimed at addressing real materials problems, with an emphasis on parallel computing and shows the most successful applications of computational and simulational work to date. Topics include: advances in computational methods; parallel algorithms and applications; fracture, brittle/ductile behavior and large-scale defects; thermodynamic stability of materials; surfaces and interfaces of materials; and complex materials simulations.

Author: J. J. Lewandowski
Publisher:
ISBN:
Category : Technology & Engineering
Languages : en
Pages : 336

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Book Description
Layered materials and systems based on metallic, intermetallic, polymeric and ceramic constituents have become increasingly important in meeting the structural requirements of current and future high-performance products. This book brings together investigators from industry, academia and government to focus on the structural applications of layered systems. Thermal barrier coatings, aircraft structural components and wear-resistant coatings for a wide variety of applications are highlighted. Processing techniques such as EB deposition, reactive sputter deposition, sedimentation processing, pressureless cosintering and rapid prototyping via laminated object manufacturing are also covered. And while microstability issues are addressed, they appear to be a critical area where further investigation is required. The largest number of papers focus on the mechanical behavior and modelling of layered systems and reveal significant effects of layer thickness, spacing and constituent properties on the fracture and fatigue behavior of such systems. Topics include: applications; processing; stability issues and mechanical behavior.