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Author: Geoffrey McLachlan Publisher: John Wiley & Sons ISBN: 0471725285 Category : Mathematics Languages : en Pages : 526
Book Description
The Wiley-Interscience Paperback Series consists of selected books that have been made more accessible to consumers in an effort to increase global appeal and general circulation. With these new unabridged softcover volumes, Wiley hopes to extend the lives of these works by making them available to future generations of statisticians, mathematicians, and scientists. "For both applied and theoretical statisticians as well as investigators working in the many areas in which relevant use can be made of discriminant techniques, this monograph provides a modern, comprehensive, and systematic account of discriminant analysis, with the focus on the more recent advances in the field." –SciTech Book News ". . . a very useful source of information for any researcher working in discriminant analysis and pattern recognition." –Computational Statistics Discriminant Analysis and Statistical Pattern Recognition provides a systematic account of the subject. While the focus is on practical considerations, both theoretical and practical issues are explored. Among the advances covered are regularized discriminant analysis and bootstrap-based assessment of the performance of a sample-based discriminant rule, and extensions of discriminant analysis motivated by problems in statistical image analysis. The accompanying bibliography contains over 1,200 references.
Author: Geoffrey McLachlan Publisher: John Wiley & Sons ISBN: 0471725285 Category : Mathematics Languages : en Pages : 526
Book Description
The Wiley-Interscience Paperback Series consists of selected books that have been made more accessible to consumers in an effort to increase global appeal and general circulation. With these new unabridged softcover volumes, Wiley hopes to extend the lives of these works by making them available to future generations of statisticians, mathematicians, and scientists. "For both applied and theoretical statisticians as well as investigators working in the many areas in which relevant use can be made of discriminant techniques, this monograph provides a modern, comprehensive, and systematic account of discriminant analysis, with the focus on the more recent advances in the field." –SciTech Book News ". . . a very useful source of information for any researcher working in discriminant analysis and pattern recognition." –Computational Statistics Discriminant Analysis and Statistical Pattern Recognition provides a systematic account of the subject. While the focus is on practical considerations, both theoretical and practical issues are explored. Among the advances covered are regularized discriminant analysis and bootstrap-based assessment of the performance of a sample-based discriminant rule, and extensions of discriminant analysis motivated by problems in statistical image analysis. The accompanying bibliography contains over 1,200 references.
Author: Andrew R. Webb Publisher: John Wiley & Sons ISBN: 0470854782 Category : Mathematics Languages : en Pages : 516
Book Description
Statistical pattern recognition is a very active area of study andresearch, which has seen many advances in recent years. New andemerging applications - such as data mining, web searching,multimedia data retrieval, face recognition, and cursivehandwriting recognition - require robust and efficient patternrecognition techniques. Statistical decision making and estimationare regarded as fundamental to the study of pattern recognition. Statistical Pattern Recognition, Second Edition has been fullyupdated with new methods, applications and references. It providesa comprehensive introduction to this vibrant area - with materialdrawn from engineering, statistics, computer science and the socialsciences - and covers many application areas, such as databasedesign, artificial neural networks, and decision supportsystems. * Provides a self-contained introduction to statistical patternrecognition. * Each technique described is illustrated by real examples. * Covers Bayesian methods, neural networks, support vectormachines, and unsupervised classification. * Each section concludes with a description of the applicationsthat have been addressed and with further developments of thetheory. * Includes background material on dissimilarity, parameterestimation, data, linear algebra and probability. * Features a variety of exercises, from 'open-book' questions tomore lengthy projects. The book is aimed primarily at senior undergraduate and graduatestudents studying statistical pattern recognition, patternprocessing, neural networks, and data mining, in both statisticsand engineering departments. It is also an excellent source ofreference for technical professionals working in advancedinformation development environments. For further information on the techniques and applicationsdiscussed in this book please visit ahref="http://www.statistical-pattern-recognition.net/"www.statistical-pattern-recognition.net/a
Author: Geoffrey McLachlan Publisher: Wiley-Interscience ISBN: Category : Computers Languages : en Pages : 556
Book Description
Reflecting also the increasingly image-based nature of data, especially in remote sensing, the book outlines extensions of discriminant analysis motivated by problems in statistical image analysis." "The sequence of chapters is clearly and logically developed, beginning with a general introduction to discriminant analysis in Chapter 1.
Author: Keinosuke Fukunaga Publisher: Elsevier ISBN: 0080478654 Category : Computers Languages : en Pages : 606
Book Description
This completely revised second edition presents an introduction to statistical pattern recognition. Pattern recognition in general covers a wide range of problems: it is applied to engineering problems, such as character readers and wave form analysis as well as to brain modeling in biology and psychology. Statistical decision and estimation, which are the main subjects of this book, are regarded as fundamental to the study of pattern recognition. This book is appropriate as a text for introductory courses in pattern recognition and as a reference book for workers in the field. Each chapter contains computer projects as well as exercises.
Author: Geoffrey J. McLachlan Publisher: John Wiley & Sons ISBN: 0471725285 Category : Mathematics Languages : en Pages : 552
Book Description
The Wiley-Interscience Paperback Series consists of selected books that have been made more accessible to consumers in an effort to increase global appeal and general circulation. With these new unabridged softcover volumes, Wiley hopes to extend the lives of these works by making them available to future generations of statisticians, mathematicians, and scientists. "For both applied and theoretical statisticians as well as investigators working in the many areas in which relevant use can be made of discriminant techniques, this monograph provides a modern, comprehensive, and systematic account of discriminant analysis, with the focus on the more recent advances in the field." –SciTech Book News ". . . a very useful source of information for any researcher working in discriminant analysis and pattern recognition." –Computational Statistics Discriminant Analysis and Statistical Pattern Recognition provides a systematic account of the subject. While the focus is on practical considerations, both theoretical and practical issues are explored. Among the advances covered are regularized discriminant analysis and bootstrap-based assessment of the performance of a sample-based discriminant rule, and extensions of discriminant analysis motivated by problems in statistical image analysis. The accompanying bibliography contains over 1,200 references.
Author: I.K. Sethi Publisher: Elsevier ISBN: 148329787X Category : Computers Languages : en Pages : 286
Book Description
With the growing complexity of pattern recognition related problems being solved using Artificial Neural Networks, many ANN researchers are grappling with design issues such as the size of the network, the number of training patterns, and performance assessment and bounds. These researchers are continually rediscovering that many learning procedures lack the scaling property; the procedures simply fail, or yield unsatisfactory results when applied to problems of bigger size. Phenomena like these are very familiar to researchers in statistical pattern recognition (SPR), where the curse of dimensionality is a well-known dilemma. Issues related to the training and test sample sizes, feature space dimensionality, and the discriminatory power of different classifier types have all been extensively studied in the SPR literature. It appears however that many ANN researchers looking at pattern recognition problems are not aware of the ties between their field and SPR, and are therefore unable to successfully exploit work that has already been done in SPR. Similarly, many pattern recognition and computer vision researchers do not realize the potential of the ANN approach to solve problems such as feature extraction, segmentation, and object recognition. The present volume is designed as a contribution to the greater interaction between the ANN and SPR research communities.
Author: Diane Wolff Publisher: Springer Science & Business Media ISBN: 146159331X Category : Computers Languages : en Pages : 226
Book Description
An attempt is made in this book to give scientists a detailed working knowledge of the powerful mathematical tools available to aid in data interpretation, especially when con fronted with large data sets incorporating many parameters. A minimal amount of com puter knowledge is necessary for successful applications, and we have tried conscien tiously to provide this in the appropriate sections and references. Scientific data are now being produced at rates not believed possible ten years ago. A major goal in any sci entific investigation should be to obtain a critical evaluation of the data generated in a set of experiments in order to extract whatever useful scientific information may be present. Very often, the large number of measurements present in the data set does not make this an easy task. The goals of this book are thus fourfold. The first is to create a useful reference on the applications of these statistical pattern recognition methods to the sciences. The majority of our discussions center around the fields of chemistry, geology, environmen tal sciences, physics, and the biological and medical sciences. In Chapter IV a section is devoted to each of these fields. Since the applications of pattern recognition tech niques are essentially unlimited, restricted only by the outer limitations of.
Author: Keinosuke Fukunaga Publisher: Elsevier ISBN: 0323162789 Category : Technology & Engineering Languages : en Pages : 386
Book Description
Introduction to Statistical Pattern Recognition introduces the reader to statistical pattern recognition, with emphasis on statistical decision and estimation. Pattern recognition problems are discussed in terms of the eigenvalues and eigenvectors. Comprised of 11 chapters, this book opens with an overview of the formulation of pattern recognition problems. The next chapter is devoted to linear algebra, with particular reference to the properties of random variables and vectors. Hypothesis testing and parameter estimation are then discussed, along with error probability estimation and linear classifiers. The following chapters focus on successive approaches where the classifier is adaptively adjusted each time one sample is observed; feature selection and linear mapping for one distribution and multidistributions; and problems of nonlinear mapping. The final chapter describes a clustering algorithm and considers criteria for both parametric and nonparametric clustering. This monograph will serve as a text for the introductory courses of pattern recognition as well as a reference book for practitioners in the fields of mathematics and statistics.
Author: Geoffrey McLachlan
Author: Geoffrey McLachlan
Author: Andrew R. Webb
Author: Geoffrey McLachlan
Author: Keinosuke Fukunaga
Author: Geoffrey J. McLachlan
Author: Chi-hau Chen
Author: Brian D. Ripley
Author: I.K. Sethi
Author: Diane Wolff
Author: Keinosuke Fukunaga