Author: Publisher:
ISBN:
Category :
Languages : en
Pages : 5
Book Description
Direct Index of Refraction Measurement at Extreme Ultraviolet Wavelength Region with a Novel Interferometer
Author: Coherence Techniques at Extreme Ultraviolet Wavelengths
Author: Zhang ZhangOptics Letters
Author: Optical Thin Films and Coatings
Author: Angela PiegariPublisher: Woodhead Publishing
ISBN: 0081020996
Category : Technology & Engineering
Languages : en
Pages : 862
Book Description
Optical Thin Films and Coatings: From Materials to Applications, Second Edition, provides an overview of thin film materials and their properties, design and manufacture across a wide variety of application areas. Sections explore their design and manufacture and their unconventional features, including the scattering properties of random structures in thin films, optical properties at short wavelengths, thermal properties and color effects. Other chapters focus on novel materials, including organic optical coatings, surface multiplasmonics, optical thin films containing quantum dots, and optical coatings, including laser components, solar cells, displays and lighting, and architectural and automotive glass. The book presents a technical resource for researchers and engineers working with optical thin films and coatings. It is also ideal for professionals in the security, automotive, space and other industries who need an understanding of the topic. Provides thorough review of applications of optical coatings including laser components, solar cells, glazing, displays and lighting One-stop reference that addresses deposition techniques, properties, and applications of optical thin films and coatings Novel methods, suggestions for analysis, and applications makes this a valuable resource for experts in the field as well
Measurements of the Index of Refraction of Glass at High Temperatures
Author: Chauncey George PetersPublisher:
ISBN:
Category : Glass
Languages : en
Pages : 28
Book Description
Tunable Coherent Radiation at Soft X-ray Wavelengths
Author: Kristine Marie RosfjordPublisher:
ISBN:
Category :
Languages : en
Pages : 268
Book Description
Dual Interferometer System for Measuring Index of Refraction
Author: Eric Peter GoodwinPublisher:
ISBN:
Category :
Languages : en
Pages : 357
Book Description
The second interferometer is a Mach-Zehnder interferometer with a tunable HeNe laser light source. This interferometer measures the optical path length (OPL) of the test sample in the cuvette in transmission as a function of five wavelengths in the visible spectrum. This is done using phase-shifting interferometry. Multiple thickness regions are used to solve 2pi phase ambiguities in the OPL.
An Interferometric Measurement of Index of Refraction
Author: Michael S. ShumatePublisher:
ISBN:
Category : Electronic dissertations
Languages : en
Pages : 77
Book Description
Of the several common methods for measurement of the index of refraction of solid optical materials, only one, the minimum deviation method, can conveniently be used for materials whose refractive index exceeds 1.8. The minimum deviation method requires that a large prism of the optical material be constructed; this is not always possible or feasible for some crystalline optical materials that are of current interest. A method for measurement of index of refraction is presented which requires a thin flat plate of the optical material and is unlimited in the range of refractive index it can cover. The method uses a two-beam interferometer to determine the optical path length through the flat plate by tipping away from normal incidence through a measured angle. It may be used in the visible portion of the spectrum directly, or extended to other spectral regions with the use of a suitable detector. (Author).
Extreme Ultraviolet Interferometry
Author: Kenneth Alan GoldbergPublisher:
ISBN:
Category :
Languages : en
Pages : 548
Book Description
Design of a Michelson Interferometer for Quantitative Refraction Index Profile Measurements
Author: Julius Lambertus Maria NijholtPublisher:
ISBN: 9789056230562
Category :
Languages : en
Pages : 52
Book Description