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Author: Hjalti Skúlason Publisher: ISBN: Category : Intermolecular forces Languages : en Pages : 536
Book Description
"The phenomenon of adhesion appears in various applications of everyday life, ranging from PostIt NotesTM and Scotch TapeTM, to the assembly of aircraft and space shuttles. However, adhesion on the molecular scale is fundamentally different from the adhesion that we experience in the macroscopic world. While macroscopic objects require special adhesives or glues to bind them together, microsca1e and nanoscale objects and molecules commonly have a high affinity to adhere to each other. A detailed description of intermolecular forces is therefore of key importance in order to understand a wide range of phenomena, ranging from macroscopic properties of materials to molecular recognition. Two key aspects of the atomic force microscope (AFM), namely its sensitivity to sub-nanoNewton forces and its very sharp probe, offer the opportunity to measure interactions between very small numbers of molecules. Through chemical tailoring of both substrates and AFM probes with self-assembled mono layers (SAMs), measurements of forces acting between specific functional groups can be measured. Furthermore, the force required to rupture a single chemical bond can be obtained by a detailed analysis of the histograms of rupture forces. A new model was derived to examine the relationship between the various experimental variables and the shape of histograms of rupture forces when discrete chemical bonds are formed between the AFM probe and substrate. Calculations based on the model demonstrated that in measurements aimed at detecting single bond rupture forces, strict limits are put on the size of the AFM probe, the relative magnitude of the interfacial energies and the bond formation probability. These results were used in two experimental systems where the single bond rupture force was successfully measured: 0) the abstraction of a single Au-S complex from an Au coated AFM probe; and (ill the rupture of a single charge-transfer (cI) complex between tetramethylphenylenediamine (TMPO) and tetracyanoquinodimethane (TCNQ). Measurements involving only one molecule at a time were conducted using polymer chains chemically grafted to the AFM probe and substrate. In these measurements, the effect of the solvent on the elasticity of the polyethylene-propylene oligomers was directly observed in the force-elongation profile"--Leaves iii-iv.
Author: Hjalti Skúlason Publisher: ISBN: Category : Intermolecular forces Languages : en Pages : 536
Book Description
"The phenomenon of adhesion appears in various applications of everyday life, ranging from PostIt NotesTM and Scotch TapeTM, to the assembly of aircraft and space shuttles. However, adhesion on the molecular scale is fundamentally different from the adhesion that we experience in the macroscopic world. While macroscopic objects require special adhesives or glues to bind them together, microsca1e and nanoscale objects and molecules commonly have a high affinity to adhere to each other. A detailed description of intermolecular forces is therefore of key importance in order to understand a wide range of phenomena, ranging from macroscopic properties of materials to molecular recognition. Two key aspects of the atomic force microscope (AFM), namely its sensitivity to sub-nanoNewton forces and its very sharp probe, offer the opportunity to measure interactions between very small numbers of molecules. Through chemical tailoring of both substrates and AFM probes with self-assembled mono layers (SAMs), measurements of forces acting between specific functional groups can be measured. Furthermore, the force required to rupture a single chemical bond can be obtained by a detailed analysis of the histograms of rupture forces. A new model was derived to examine the relationship between the various experimental variables and the shape of histograms of rupture forces when discrete chemical bonds are formed between the AFM probe and substrate. Calculations based on the model demonstrated that in measurements aimed at detecting single bond rupture forces, strict limits are put on the size of the AFM probe, the relative magnitude of the interfacial energies and the bond formation probability. These results were used in two experimental systems where the single bond rupture force was successfully measured: 0) the abstraction of a single Au-S complex from an Au coated AFM probe; and (ill the rupture of a single charge-transfer (cI) complex between tetramethylphenylenediamine (TMPO) and tetracyanoquinodimethane (TCNQ). Measurements involving only one molecule at a time were conducted using polymer chains chemically grafted to the AFM probe and substrate. In these measurements, the effect of the solvent on the elasticity of the polyethylene-propylene oligomers was directly observed in the force-elongation profile"--Leaves iii-iv.
Author: Ernst Meyer Publisher: Springer Nature ISBN: 3030370895 Category : Science Languages : en Pages : 330
Book Description
Written by three leading experts in the field, this textbook describes and explains all aspects of the scanning probe microscopy. Emphasis is placed on the experimental design and procedures required to optimize the performance of the various methods. Scanning Probe Microscopy covers not only the physical principles behind scanning probe microscopy but also questions of instrumental designs, basic features of the different imaging modes, and recurring artifacts. The intention is to provide a general textbook for all types of classes that address scanning probe microscopy. Third year undergraduates and beyond should be able to use it for self-study or as textbook to accompany a course on probe microscopy. Furthermore, it will be valuable as reference book in any scanning probe microscopy laboratory. Novel applications and the latest important results are also presented, and the book closes with a look at the future prospects of scanning probe microscopy, also discussing related techniques in nanoscience. Ideally suited as an introduction for graduate students, the book will also serve as a valuable reference for practising researchers developing and using scanning probe techniques.
Author: G Ali Mansoori Publisher: World Scientific Publishing Company ISBN: 9813102047 Category : Technology & Engineering Languages : en Pages : 358
Book Description
This invaluable book provides a pointed introduction to the fascinating subject of bottom-up nanotechnology with emphasis on the molecular-based study of condensed matter in small systems. Nanotechnology has its roots in the landmark lecture delivered by the famous Nobel Laureate physicist, Richard Feynman, on 29 December 1959 entitled “There's Plenty of Room at the Bottom.” By the mid-1980s, it had gained real momentum with the invention of scanning probe microscopes. Today, nanotechnology promises to have a revolutionary impact on the way things are designed and manufactured in the future.Principles of Nanotechnology is self-contained and unified in presentation. It may be used as a textbook by graduate students and even ambitious undergraduates in engineering, and the biological and physical sciences who already have some familiarity with quantum and statistical mechanics. It is also suitable for experts in related fields who require an overview of the fundamental topics in nanotechnology. The explanations in the book are detailed enough to capture the interest of the curious reader, and complete enough to provide the necessary background material needed to go further into the subject and explore the research literature. Due to the interdisciplinary nature of nanotechnology, a comprehensive glossary is included detailing abbreviations, chemical formulae, concepts, definitions, equations and theories.
Author: Simonpietro Agnello Publisher: John Wiley & Sons ISBN: 1119697328 Category : Technology & Engineering Languages : en Pages : 500
Book Description
SPECTROSCOPY FOR MATERIALS CHARACTERIZATION Learn foundational and advanced spectroscopy techniques from leading researchers in physics, chemistry, surface science, and nanoscience In Spectroscopy for Materials Characterization, accomplished researcher Simonpietro Agnello delivers a practical and accessible compilation of various spectroscopy techniques taught and used to today. The book offers a wide-ranging approach taught by leading researchers working in physics, chemistry, surface science, and nanoscience. It is ideal for both new students and advanced researchers studying and working with spectroscopy. Topics such as confocal and two photon spectroscopy, as well as infrared absorption and Raman and micro-Raman spectroscopy, are discussed, as are thermally stimulated luminescence and spectroscopic studies of radiation effects on optical materials. Each chapter includes a basic introduction to the theory necessary to understand a specific technique, details about the characteristic instrumental features and apparatuses used, including tips for the appropriate arrangement of a typical experiment, and a reproducible case study that shows the discussed techniques used in a real laboratory. Readers will benefit from the inclusion of: Complete and practical case studies at the conclusion of each chapter to highlight the concepts and techniques discussed in the material Citations of additional resources ideal for further study A thorough introduction to the basic aspects of radiation matter interaction in the visible-ultraviolet range and the fundamentals of absorption and emission A rigorous exploration of time resolved spectroscopy at the nanosecond and femtosecond intervals Perfect for Master and Ph.D. students and researchers in physics, chemistry, engineering, and biology, Spectroscopy for Materials Characterization will also earn a place in the libraries of materials science researchers and students seeking a one-stop reference to basic and advanced spectroscopy techniques.
Author: Andrew Zangwill Publisher: Cambridge University Press ISBN: 1316583260 Category : Science Languages : en Pages : 470
Book Description
Physics at Surfaces is a unique graduate-level introduction to the physics and chemical physics of solid surfaces, and atoms and molecules that interact with solid surfaces. A subject of keen scientific inquiry since the last century, surface physics emerged as an independent discipline only in the late 1960s as a result of the development of ultra-high vacuum technology and high speed digital computers. With these tools, reliable experimental measurements and theoretical calculations could at last be compared. Progress in the last decade has been truly striking. This volume provides a synthesis of the entire field of surface physics from the perspective of a modern condensed matter physicist with a healthy interest in chemical physics. The exposition intertwines experiment and theory whenever possible, although there is little detailed discussion of technique. This much-needed text will be invaluable to graduate students and researchers in condensed matter physics, physical chemistry and materials science working in, or taking graduate courses in, surface science.
Author: Tomasz Tański Publisher: BoD – Books on Demand ISBN: 1789851696 Category : Science Languages : en Pages : 116
Book Description
Atomic force microscopy is a surface analytical technique used in air, liquids or a vacuum to generate very high-resolution topographic images of a surface, down to atomic resolution. This book is not only for students but also for professional engineers who are working in the industry as well as specialists. This book aims to provide the reader with a comprehensive overview of the new trends, research results and development of atomic force microscopy. The chapters for this book have been written by respected and well-known researchers and specialists from different countries. We hope that after studying this book, you will have objective knowledge about the possible uses of atomic force microscopy in many scientific aspects of our civilisation.
Author: Dror Sarid Publisher: Oxford University Press, USA ISBN: 019509204X Category : Scanning force microscopy Languages : en Pages : 284
Book Description
This edition updates the survey of the many rapidly developing subjects concerning the mapping of a variety of forces across surfaces, including basic theory, instrumentation, and applications. It also includes important new research in STM and a thoroughly revised bibliography.
Author: Jiye Cai Publisher: Springer ISBN: 9811315108 Category : Science Languages : en Pages : 244
Book Description
The book addresses new achievements in AFM instruments – e.g. higher speed and higher resolution – and how AFM is being combined with other new methods like NSOM, STED, STORM, PALM, and Raman. This book explores the latest advances in atomic force microscopy and related techniques in molecular and cell biology. Atomic force microscopy (AFM) can be used to detect the superstructures of the cell membrane, cell morphology, cell skeletons and their mechanical properties. Opening up new fields of in-situ dynamic study for living cells, enzymatic reactions, fibril growth and biomedical research, these combined techniques will yield valuable new insights into molecule and cell biology. This book offers a valuable resource for students and researchers in the fields of biochemistry, cell research and chemistry etc.
Author: Hjalti Skúlason
Author: Hjalti Skúlason
Author: Dmitri Vitalievich Vezenov
Author: Ernst Meyer
Author: G Ali Mansoori
Author: Simonpietro Agnello
Author: Andrew Zangwill
Author: James A. Schwarz
Author: Tomasz Tański
Author: Dror Sarid
Author: Jiye Cai