Author: Kevin Harding
Publisher: Taylor & Francis
ISBN: 1439854823
Category : Science
Languages : en
Pages : 497
Book Description
Due to their speed, data density, and versatility, optical metrology tools play important roles in today's high-speed industrial manufacturing applications. Handbook of Optical Dimensional Metrology provides useful background information and practical examples to help readers understand and effectively use state-of-the-art optical metrology methods
Handbook of Optical Dimensional Metrology
Author: Kevin Harding
Publisher: Taylor & Francis
ISBN: 1439854823
Category : Science
Languages : en
Pages : 497
Book Description
Due to their speed, data density, and versatility, optical metrology tools play important roles in today's high-speed industrial manufacturing applications. Handbook of Optical Dimensional Metrology provides useful background information and practical examples to help readers understand and effectively use state-of-the-art optical metrology methods
Publisher: Taylor & Francis
ISBN: 1439854823
Category : Science
Languages : en
Pages : 497
Book Description
Due to their speed, data density, and versatility, optical metrology tools play important roles in today's high-speed industrial manufacturing applications. Handbook of Optical Dimensional Metrology provides useful background information and practical examples to help readers understand and effectively use state-of-the-art optical metrology methods
Fundamentals of Dimensional Metrology
Handbook of Dimensional Measurement
Author: Francis T. Farago
Publisher: Industrial Press Inc.
ISBN: 9780831130534
Category : Education
Languages : en
Pages : 608
Book Description
Nineteen Fact-Filled Charters that contain authoritative treatment of all aspects of dimensional measurement technology make Handbook of Dimensional Measurement the most readable and comprehensive guide available for engineers and technicians engages in the various stages of industrial production. Design engineers, manufacturing engineers, tool and gage makers, quality control specialists, and reliability experts will find a wealth of practical data as well as complete coverage - both basic and advanced - of dimensional measurement techniques and equipment. The Third Edition of this classic book has been completely revised to include the computer and electronics revolution in metrology. Virtually every type of measurement instrument and machine, even the newest devices, can be found in these pages. Hundreds of changes, and additions and scores of new illustrations have been incorporated to assure that Handbook of Dimensional Measurement retains its status as the standard reference for the practitioner of dimensional measurement.
Publisher: Industrial Press Inc.
ISBN: 9780831130534
Category : Education
Languages : en
Pages : 608
Book Description
Nineteen Fact-Filled Charters that contain authoritative treatment of all aspects of dimensional measurement technology make Handbook of Dimensional Measurement the most readable and comprehensive guide available for engineers and technicians engages in the various stages of industrial production. Design engineers, manufacturing engineers, tool and gage makers, quality control specialists, and reliability experts will find a wealth of practical data as well as complete coverage - both basic and advanced - of dimensional measurement techniques and equipment. The Third Edition of this classic book has been completely revised to include the computer and electronics revolution in metrology. Virtually every type of measurement instrument and machine, even the newest devices, can be found in these pages. Hundreds of changes, and additions and scores of new illustrations have been incorporated to assure that Handbook of Dimensional Measurement retains its status as the standard reference for the practitioner of dimensional measurement.
Practical Optical Dimensional Metrology
Author: Kevin G. Harding
Publisher: SPIE-International Society for Optical Engineering
ISBN: 9781510622937
Category : Metrology
Languages : en
Pages : 0
Book Description
Provides basic explanations of the operation and application of the most common methods in the field and in commercial use. The first half of the book presents a working knowledge of the mechanism and limitations of optical dimensional measurement methods. The book concludes with a series of manufacturing application examples.
Publisher: SPIE-International Society for Optical Engineering
ISBN: 9781510622937
Category : Metrology
Languages : en
Pages : 0
Book Description
Provides basic explanations of the operation and application of the most common methods in the field and in commercial use. The first half of the book presents a working knowledge of the mechanism and limitations of optical dimensional measurement methods. The book concludes with a series of manufacturing application examples.
Information Modeling for Interoperable Dimensional Metrology
Author: Y Zhao
Publisher: Springer Science & Business Media
ISBN: 1447121678
Category : Technology & Engineering
Languages : en
Pages : 380
Book Description
Dimensional metrology is an essential part of modern manufacturing technologies, but the basic theories and measurement methods are no longer sufficient for today's digitized systems. The information exchange between the software components of a dimensional metrology system not only costs a great deal of money, but also causes the entire system to lose data integrity. Information Modeling for Interoperable Dimensional Metrology analyzes interoperability issues in dimensional metrology systems and describes information modeling techniques. It discusses new approaches and data models for solving interoperability problems, as well as introducing process activities, existing and emerging data models, and the key technologies of dimensional metrology systems. Written for researchers in industry and academia, as well as advanced undergraduate and postgraduate students, this book gives both an overview and an in-depth understanding of complete dimensional metrology systems. By covering in detail the theory and main content, techniques, and methods used in dimensional metrology systems, Information Modeling for Interoperable Dimensional Metrology enables readers to solve real-world dimensional measurement problems in modern dimensional metrology practices.
Publisher: Springer Science & Business Media
ISBN: 1447121678
Category : Technology & Engineering
Languages : en
Pages : 380
Book Description
Dimensional metrology is an essential part of modern manufacturing technologies, but the basic theories and measurement methods are no longer sufficient for today's digitized systems. The information exchange between the software components of a dimensional metrology system not only costs a great deal of money, but also causes the entire system to lose data integrity. Information Modeling for Interoperable Dimensional Metrology analyzes interoperability issues in dimensional metrology systems and describes information modeling techniques. It discusses new approaches and data models for solving interoperability problems, as well as introducing process activities, existing and emerging data models, and the key technologies of dimensional metrology systems. Written for researchers in industry and academia, as well as advanced undergraduate and postgraduate students, this book gives both an overview and an in-depth understanding of complete dimensional metrology systems. By covering in detail the theory and main content, techniques, and methods used in dimensional metrology systems, Information Modeling for Interoperable Dimensional Metrology enables readers to solve real-world dimensional measurement problems in modern dimensional metrology practices.
Dimensional Metrology, Subject-classified with Abstracts Through 1964
Distributed Large-Scale Dimensional Metrology
Author: Fiorenzo Franceschini
Publisher: Springer Science & Business Media
ISBN: 0857295438
Category : Technology & Engineering
Languages : en
Pages : 241
Book Description
The field of large-scale dimensional metrology (LSM) deals with objects that have linear dimensions ranging from tens to hundreds of meters. It has recently attracted a great deal of interest in many areas of production, including the automotive, railway, and shipbuilding sectors. Distributed Large-Scale Dimensional Metrology introduces a new paradigm in this field that reverses the classical metrological approach: measuring systems that are portable and can be easily moved around the location of the measured object, which is preferable to moving the object itself. Distributed Large-Scale Dimensional Metrology combines the concepts of distributed systems and large scale metrology at the application level. It focuses on the latest insights and challenges of this new generation of systems from the perspective of the designers and developers. The main topics are: coverage of measuring area, sensors calibration, on-line diagnostics, probe management, and analysis of metrological performance. The general descriptions of each topic are further enriched by specific examples concerning the use of commercially available systems or the development of new prototypes. This will be particularly useful for professional practitioners such as quality engineers, manufacturing and development engineers, and procurement specialists, but Distributed Large-Scale Dimensional Metrology also has a wealth of information for interested academics.
Publisher: Springer Science & Business Media
ISBN: 0857295438
Category : Technology & Engineering
Languages : en
Pages : 241
Book Description
The field of large-scale dimensional metrology (LSM) deals with objects that have linear dimensions ranging from tens to hundreds of meters. It has recently attracted a great deal of interest in many areas of production, including the automotive, railway, and shipbuilding sectors. Distributed Large-Scale Dimensional Metrology introduces a new paradigm in this field that reverses the classical metrological approach: measuring systems that are portable and can be easily moved around the location of the measured object, which is preferable to moving the object itself. Distributed Large-Scale Dimensional Metrology combines the concepts of distributed systems and large scale metrology at the application level. It focuses on the latest insights and challenges of this new generation of systems from the perspective of the designers and developers. The main topics are: coverage of measuring area, sensors calibration, on-line diagnostics, probe management, and analysis of metrological performance. The general descriptions of each topic are further enriched by specific examples concerning the use of commercially available systems or the development of new prototypes. This will be particularly useful for professional practitioners such as quality engineers, manufacturing and development engineers, and procurement specialists, but Distributed Large-Scale Dimensional Metrology also has a wealth of information for interested academics.
Engineering Metrology and Measurements
Author: Raghavendra,
Publisher: OUP India
ISBN: 9780198085492
Category : Technology & Engineering
Languages : en
Pages : 0
Book Description
Engineering Metrology and Measurements is a textbook designed for students of mechanical, production and allied disciplines to facilitate learning of various shop-floor measurement techniques and also understand the basics of mechanical measurements.
Publisher: OUP India
ISBN: 9780198085492
Category : Technology & Engineering
Languages : en
Pages : 0
Book Description
Engineering Metrology and Measurements is a textbook designed for students of mechanical, production and allied disciplines to facilitate learning of various shop-floor measurement techniques and also understand the basics of mechanical measurements.
Applied Metrology for Manufacturing Engineering
Author: Ammar Grous
Publisher: John Wiley & Sons
ISBN: 1118622596
Category : Technology & Engineering
Languages : en
Pages : 570
Book Description
Applied Metrology for Manufacturing Engineering, stands out from traditional works due to its educational aspect. Illustrated by tutorials and laboratory models, it is accessible to users of non-specialists in the fields of design and manufacturing. Chapters can be viewed independently of each other. This book focuses on technical geometric and dimensional tolerances as well as mechanical testing and quality control. It also provides references and solved examples to help professionals and teachers to adapt their models to specific cases. It reflects recent developments in ISO and GPS standards and focuses on training that goes hand in hand with the progress of practical work and workshops dealing with measurement and dimensioning.
Publisher: John Wiley & Sons
ISBN: 1118622596
Category : Technology & Engineering
Languages : en
Pages : 570
Book Description
Applied Metrology for Manufacturing Engineering, stands out from traditional works due to its educational aspect. Illustrated by tutorials and laboratory models, it is accessible to users of non-specialists in the fields of design and manufacturing. Chapters can be viewed independently of each other. This book focuses on technical geometric and dimensional tolerances as well as mechanical testing and quality control. It also provides references and solved examples to help professionals and teachers to adapt their models to specific cases. It reflects recent developments in ISO and GPS standards and focuses on training that goes hand in hand with the progress of practical work and workshops dealing with measurement and dimensioning.
Handbook of Optical Metrology
Author: Toru Yoshizawa
Publisher: CRC Press
ISBN: 1351831844
Category : Technology & Engineering
Languages : en
Pages : 866
Book Description
Handbook of Optical Metrology: Principles and Applications begins by discussing key principles and techniques before exploring practical applications of optical metrology. Designed to provide beginners with an introduction to optical metrology without sacrificing academic rigor, this comprehensive text: Covers fundamentals of light sources, lenses, prisms, and mirrors, as well as optoelectronic sensors, optical devices, and optomechanical elements Addresses interferometry, holography, and speckle methods and applications Explains Moiré metrology and the optical heterodyne measurement method Delves into the specifics of diffraction, scattering, polarization, and near-field optics Considers applications for measuring length and size, displacement, straightness and parallelism, flatness, and three-dimensional shapes This new Second Edition is fully revised to reflect the latest developments. It also includes four new chapters—nearly 100 pages—on optical coherence tomography for industrial applications, interference microscopy for surface structure analysis, noncontact dimensional and profile metrology by video measurement, and optical metrology in manufacturing technology.
Publisher: CRC Press
ISBN: 1351831844
Category : Technology & Engineering
Languages : en
Pages : 866
Book Description
Handbook of Optical Metrology: Principles and Applications begins by discussing key principles and techniques before exploring practical applications of optical metrology. Designed to provide beginners with an introduction to optical metrology without sacrificing academic rigor, this comprehensive text: Covers fundamentals of light sources, lenses, prisms, and mirrors, as well as optoelectronic sensors, optical devices, and optomechanical elements Addresses interferometry, holography, and speckle methods and applications Explains Moiré metrology and the optical heterodyne measurement method Delves into the specifics of diffraction, scattering, polarization, and near-field optics Considers applications for measuring length and size, displacement, straightness and parallelism, flatness, and three-dimensional shapes This new Second Edition is fully revised to reflect the latest developments. It also includes four new chapters—nearly 100 pages—on optical coherence tomography for industrial applications, interference microscopy for surface structure analysis, noncontact dimensional and profile metrology by video measurement, and optical metrology in manufacturing technology.