Digital Systems Testing and Testable Design PDF Download

Author: Miron Abramovici
Publisher: Wiley-IEEE Press
ISBN: 9780780310629
Category : Technology & Engineering
Languages : en
Pages : 672

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Book Description
This updated printing of the leading text and reference in digital systems testing and testable design provides comprehensive, state-of-the-art coverage of the field. Included are extensive discussions of test generation, fault modeling for classic and new technologies, simulation, fault simulation, design for testability, built-in self-test, and diagnosis. Complete with numerous problems, this book is a must-have for test engineers, ASIC and system designers, and CAD developers, and advanced engineering students will find this book an invaluable tool to keep current with recent changes in the field.

Author: Zainalabedin Navabi
Publisher: Springer Science & Business Media
ISBN: 1441975489
Category : Technology & Engineering
Languages : en
Pages : 452

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Book Description
This book is about digital system testing and testable design. The concepts of testing and testability are treated together with digital design practices and methodologies. The book uses Verilog models and testbenches for implementing and explaining fault simulation and test generation algorithms. Extensive use of Verilog and Verilog PLI for test applications is what distinguishes this book from other test and testability books. Verilog eliminates ambiguities in test algorithms and BIST and DFT hardware architectures, and it clearly describes the architecture of the testability hardware and its test sessions. Describing many of the on-chip decompression algorithms in Verilog helps to evaluate these algorithms in terms of hardware overhead and timing, and thus feasibility of using them for System-on-Chip designs. Extensive use of testbenches and testbench development techniques is another unique feature of this book. Using PLI in developing testbenches and virtual testers provides a powerful programming tool, interfaced with hardware described in Verilog. This mixed hardware/software environment facilitates description of complex test programs and test strategies.

Author: Parag K. Lala
Publisher: Springer Nature
ISBN: 303179785X
Category : Technology & Engineering
Languages : en
Pages : 99

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Book Description
An Introduction to Logic Circuit Testing provides a detailed coverage of techniques for test generation and testable design of digital electronic circuits/systems. The material covered in the book should be sufficient for a course, or part of a course, in digital circuit testing for senior-level undergraduate and first-year graduate students in Electrical Engineering and Computer Science. The book will also be a valuable resource for engineers working in the industry. This book has four chapters. Chapter 1 deals with various types of faults that may occur in very large scale integration (VLSI)-based digital circuits. Chapter 2 introduces the major concepts of all test generation techniques such as redundancy, fault coverage, sensitization, and backtracking. Chapter 3 introduces the key concepts of testability, followed by some ad hoc design-for-testability rules that can be used to enhance testability of combinational circuits. Chapter 4 deals with test generation and response evaluation techniques used in BIST (built-in self-test) schemes for VLSI chips. Table of Contents: Introduction / Fault Detection in Logic Circuits / Design for Testability / Built-in Self-Test / References

Author: Laung-Terng Wang
Publisher: Elsevier
ISBN: 0080474799
Category : Technology & Engineering
Languages : en
Pages : 809

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Book Description
This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume. - Most up-to-date coverage of design for testability. - Coverage of industry practices commonly found in commercial DFT tools but not discussed in other books. - Numerous, practical examples in each chapter illustrating basic VLSI test principles and DFT architectures.

Author: Louis J. Gullo
Publisher: John Wiley & Sons
ISBN: 1119578515
Category : Technology & Engineering
Languages : en
Pages : 400

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Book Description
How to design for optimum maintenance capabilities and minimize the repair time Design for Maintainability offers engineers a wide range of tools and techniques for incorporating maintainability into the design process for complex systems. With contributions from noted experts on the topic, the book explains how to design for optimum maintenance capabilities while simultaneously minimizing the time to repair equipment. The book contains a wealth of examples and the most up-to-date maintainability design practices that have proven to result in better system readiness, shorter downtimes, and substantial cost savings over the entire system life cycle, thereby, decreasing the Total Cost of Ownership. Design for Maintainability offers a wealth of design practices not covered in typical engineering books, thus allowing readers to think outside the box when developing maintainability design requirements. The books principles and practices can help engineers to dramatically improve their ability to compete in global markets and gain widespread customer satisfaction. This important book: Offers a complete overview of maintainability engineering as a system engineering discipline Includes contributions from authors who are recognized leaders in the field Contains real-life design examples, both good and bad, from various industries Presents realistic illustrations of good maintainability design principles Provides discussion of the interrelationships between maintainability with other related disciplines Explores trending topics in technologies Written for design and logistics engineers and managers, Design for Maintainability is a comprehensive resource containing the most reliable and innovative techniques for improving maintainability when designing a system or product.

Author: Hideo Fujiwara
Publisher: MIT Press
ISBN:
Category : Logic circuits
Languages : en
Pages : 314

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Book Description
Design for testability techniques offer one approach toward alleviating this situation by adding enough extra circuitry to a circuit or chip to reduce the complexity of testing.

Author: Samiha Mourad
Publisher: John Wiley & Sons
ISBN: 9780471319313
Category : Technology & Engineering
Languages : en
Pages : 444

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Book Description
A pragmatic approach to testing electronic systems As we move ahead in the electronic age, rapid changes in technology pose an ever-increasing number of challenges in testing electronic products. Many practicing engineers are involved in this arena, but few have a chance to study the field in a systematic way-learning takes place on the job. By covering the fundamental disciplines in detail, Principles of Testing Electronic Systems provides design engineers with the much-needed knowledge base. Divided into five major parts, this highly useful reference relates design and tests to the development of reliable electronic products; shows the main vehicles for design verification; examines designs that facilitate testing; and investigates how testing is applied to random logic, memories, FPGAs, and microprocessors. Finally, the last part offers coverage of advanced test solutions for today's very deep submicron designs. The authors take a phenomenological approach to the subject matter while providing readers with plenty of opportunities to explore the foundation in detail. Special features include: * An explanation of where a test belongs in the design flow * Detailed discussion of scan-path and ordering of scan-chains * BIST solutions for embedded logic and memory blocks * Test methodologies for FPGAs * A chapter on testing system on a chip * Numerous references

Author: N. K. Jha
Publisher: Cambridge University Press
ISBN: 9780521773560
Category : Computers
Languages : en
Pages : 1016

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Book Description
Device testing represents the single largest manufacturing expense in the semiconductor industry, costing over $40 billion a year. The most comprehensive and wide-ranging book of its kind, Testing of Digital Systems covers everything you need to know about this vitally important subject. Starting right from the basics, the authors take the reader through every key area, including detailed treatment of the latest techniques such as system-on-a-chip and IDDQ testing. Written for students and engineers, it is both an excellent senior/graduate level textbook and a valuable reference.

Author: Paul H. Bardell
Publisher: Wiley-Interscience
ISBN:
Category : Technology & Engineering
Languages : en
Pages : 376

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Book Description
This handbook provides ready access to all of the major concepts, techniques, problems, and solutions in the emerging field of pseudorandom pattern testing. Until now, the literature in this area has been widely scattered, and published work, written by professionals in several disciplines, has treated notation and mathematics in ways that vary from source to source. This book opens with a clear description of the shortcomings of conventional testing as applied to complex digital circuits, revewing by comparison the principles of design for testability of more advanced digital technology. Offers in-depth discussions of test sequence generation and response data compression, including pseudorandom sequence generators; the mathematics of shift-register sequences and their potential for built-in testing. Also details random and memory testing and the problems of assessing the efficiency of such tests, and the limitations and practical concerns of built-in testing.

Author: Parag K. Lala
Publisher: John Wiley & Sons
ISBN: 0470072962
Category : Computers
Languages : en
Pages : 450

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Book Description
PRINCIPLES OF MODERN DIGITAL DESIGN FROM UNDERLYING PRINCIPLES TO IMPLEMENTATION—A THOROUGH INTRODUCTION TO DIGITAL LOGIC DESIGN With this book, readers discover the connection between logic design principles and theory and the logic design and optimization techniques used in practice. Therefore, they not only learn how to implement current design techniques, but also how these techniques were developed and why they work. With a deeper understanding of the underlying principles, readers become better problem-solvers when faced with new and difficult digital design challenges. Principles of Modern Digital Design begins with an examination of number systems and binary code followed by the fundamental concepts of digital logic. Next, readers advance to combinational logic design. Armed with this foundation, they are then introduced to VHDL, a powerful language used to describe the function of digital circuits and systems. All the major topics needed for a thorough understanding of modern digital design are presented, including: Fundamentals of synchronous sequential circuits and synchronous sequential circuit design Combinational logic design using VHDL Counter design Sequential circuit design using VHDL Asynchronous sequential circuits VHDL-based logic design examples are provided throughout the book to illustrate both the underlying principles and practical design applications. Each chapter is followed by exercises that enable readers to put their skills into practice by solving realistic digital design problems. An accompanying website with Quartus II software enables readers to replicate the book’s examples and perform the exercises. This book can be used for either a two- or one-semester course for undergraduate students in electrical and computer engineering and computer science. Its thorough explanation of theory, coupled with examples and exercises, enables both students and practitioners to master and implement modern digital design techniques with confidence.