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Author: Miron Abramovici Publisher: Wiley-IEEE Press ISBN: 9780780310629 Category : Technology & Engineering Languages : en Pages : 672
Book Description
This updated printing of the leading text and reference in digital systems testing and testable design provides comprehensive, state-of-the-art coverage of the field. Included are extensive discussions of test generation, fault modeling for classic and new technologies, simulation, fault simulation, design for testability, built-in self-test, and diagnosis. Complete with numerous problems, this book is a must-have for test engineers, ASIC and system designers, and CAD developers, and advanced engineering students will find this book an invaluable tool to keep current with recent changes in the field.
Author: Miron Abramovici Publisher: Wiley-IEEE Press ISBN: 9780780310629 Category : Technology & Engineering Languages : en Pages : 672
Book Description
This updated printing of the leading text and reference in digital systems testing and testable design provides comprehensive, state-of-the-art coverage of the field. Included are extensive discussions of test generation, fault modeling for classic and new technologies, simulation, fault simulation, design for testability, built-in self-test, and diagnosis. Complete with numerous problems, this book is a must-have for test engineers, ASIC and system designers, and CAD developers, and advanced engineering students will find this book an invaluable tool to keep current with recent changes in the field.
Author: Zainalabedin Navabi Publisher: Springer Science & Business Media ISBN: 1441975489 Category : Technology & Engineering Languages : en Pages : 452
Book Description
This book is about digital system testing and testable design. The concepts of testing and testability are treated together with digital design practices and methodologies. The book uses Verilog models and testbenches for implementing and explaining fault simulation and test generation algorithms. Extensive use of Verilog and Verilog PLI for test applications is what distinguishes this book from other test and testability books. Verilog eliminates ambiguities in test algorithms and BIST and DFT hardware architectures, and it clearly describes the architecture of the testability hardware and its test sessions. Describing many of the on-chip decompression algorithms in Verilog helps to evaluate these algorithms in terms of hardware overhead and timing, and thus feasibility of using them for System-on-Chip designs. Extensive use of testbenches and testbench development techniques is another unique feature of this book. Using PLI in developing testbenches and virtual testers provides a powerful programming tool, interfaced with hardware described in Verilog. This mixed hardware/software environment facilitates description of complex test programs and test strategies.
Author: Parag K. Lala Publisher: Springer Nature ISBN: 303179785X Category : Technology & Engineering Languages : en Pages : 99
Book Description
An Introduction to Logic Circuit Testing provides a detailed coverage of techniques for test generation and testable design of digital electronic circuits/systems. The material covered in the book should be sufficient for a course, or part of a course, in digital circuit testing for senior-level undergraduate and first-year graduate students in Electrical Engineering and Computer Science. The book will also be a valuable resource for engineers working in the industry. This book has four chapters. Chapter 1 deals with various types of faults that may occur in very large scale integration (VLSI)-based digital circuits. Chapter 2 introduces the major concepts of all test generation techniques such as redundancy, fault coverage, sensitization, and backtracking. Chapter 3 introduces the key concepts of testability, followed by some ad hoc design-for-testability rules that can be used to enhance testability of combinational circuits. Chapter 4 deals with test generation and response evaluation techniques used in BIST (built-in self-test) schemes for VLSI chips. Table of Contents: Introduction / Fault Detection in Logic Circuits / Design for Testability / Built-in Self-Test / References
Author: Laung-Terng Wang Publisher: Elsevier ISBN: 0080474799 Category : Technology & Engineering Languages : en Pages : 809
Book Description
This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume. - Most up-to-date coverage of design for testability. - Coverage of industry practices commonly found in commercial DFT tools but not discussed in other books. - Numerous, practical examples in each chapter illustrating basic VLSI test principles and DFT architectures.
Author: Louis J. Gullo Publisher: John Wiley & Sons ISBN: 1119578515 Category : Technology & Engineering Languages : en Pages : 400
Book Description
How to design for optimum maintenance capabilities and minimize the repair time Design for Maintainability offers engineers a wide range of tools and techniques for incorporating maintainability into the design process for complex systems. With contributions from noted experts on the topic, the book explains how to design for optimum maintenance capabilities while simultaneously minimizing the time to repair equipment. The book contains a wealth of examples and the most up-to-date maintainability design practices that have proven to result in better system readiness, shorter downtimes, and substantial cost savings over the entire system life cycle, thereby, decreasing the Total Cost of Ownership. Design for Maintainability offers a wealth of design practices not covered in typical engineering books, thus allowing readers to think outside the box when developing maintainability design requirements. The books principles and practices can help engineers to dramatically improve their ability to compete in global markets and gain widespread customer satisfaction. This important book: Offers a complete overview of maintainability engineering as a system engineering discipline Includes contributions from authors who are recognized leaders in the field Contains real-life design examples, both good and bad, from various industries Presents realistic illustrations of good maintainability design principles Provides discussion of the interrelationships between maintainability with other related disciplines Explores trending topics in technologies Written for design and logistics engineers and managers, Design for Maintainability is a comprehensive resource containing the most reliable and innovative techniques for improving maintainability when designing a system or product.
Author: Mark Zwolinski Publisher: Pearson Education ISBN: 0137046316 Category : Technology & Engineering Languages : en Pages : 458
Book Description
The Definitive, Up-to-Date Guide to Digital Design with SystemVerilog: Concepts, Techniques, and Code To design state-of-the-art digital hardware, engineers first specify functionality in a high-level Hardware Description Language (HDL)—and today’s most powerful, useful HDL is SystemVerilog, now an IEEE standard. Digital System Design with SystemVerilog is the first comprehensive introduction to both SystemVerilog and the contemporary digital hardware design techniques used with it. Building on the proven approach of his bestselling Digital System Design with VHDL, Mark Zwolinski covers everything engineers need to know to automate the entire design process with SystemVerilog—from modeling through functional simulation, synthesis, timing simulation, and verification. Zwolinski teaches through about a hundred and fifty practical examples, each with carefully detailed syntax and enough in-depth information to enable rapid hardware design and verification. All examples are available for download from the book's companion Web site, zwolinski.org. Coverage includes Using electronic design automation tools with programmable logic and ASIC technologies Essential principles of Boolean algebra and combinational logic design, with discussions of timing and hazards Core modeling techniques: combinational building blocks, buffers, decoders, encoders, multiplexers, adders, and parity checkers Sequential building blocks: latches, flip- flops, registers, counters, memory, and sequential multipliers Designing finite state machines: from ASM chart to D flip-flops, next state, and output logic Modeling interfaces and packages with SystemVerilog Designing testbenches: architecture, constrained random test generation, and assertion-based verification Describing RTL and FPGA synthesis models Understanding and implementing Design-for-Test Exploring anomalous behavior in asynchronous sequential circuits Performing Verilog-AMS and mixed-signal modeling Whatever your experience with digital design, older versions of Verilog, or VHDL, this book will help you discover SystemVerilog’s full power and use it to the fullest.
Author: Hideo Fujiwara Publisher: MIT Press ISBN: Category : Logic circuits Languages : en Pages : 314
Book Description
Design for testability techniques offer one approach toward alleviating this situation by adding enough extra circuitry to a circuit or chip to reduce the complexity of testing.
Author: N. K. Jha Publisher: Cambridge University Press ISBN: 9780521773560 Category : Computers Languages : en Pages : 1016
Book Description
Device testing represents the single largest manufacturing expense in the semiconductor industry, costing over $40 billion a year. The most comprehensive and wide-ranging book of its kind, Testing of Digital Systems covers everything you need to know about this vitally important subject. Starting right from the basics, the authors take the reader through every key area, including detailed treatment of the latest techniques such as system-on-a-chip and IDDQ testing. Written for students and engineers, it is both an excellent senior/graduate level textbook and a valuable reference.
Author: M. Bushnell Publisher: Springer Science & Business Media ISBN: 0306470403 Category : Technology & Engineering Languages : en Pages : 690
Book Description
The modern electronic testing has a forty year history. Test professionals hold some fairly large conferences and numerous workshops, have a journal, and there are over one hundred books on testing. Still, a full course on testing is offered only at a few universities, mostly by professors who have a research interest in this area. Apparently, most professors would not have taken a course on electronic testing when they were students. Other than the computer engineering curriculum being too crowded, the major reason cited for the absence of a course on electronic testing is the lack of a suitable textbook. For VLSI the foundation was provided by semiconductor device techn- ogy, circuit design, and electronic testing. In a computer engineering curriculum, therefore, it is necessary that foundations should be taught before applications. The field of VLSI has expanded to systems-on-a-chip, which include digital, memory, and mixed-signalsubsystems. To our knowledge this is the first textbook to cover all three types of electronic circuits. We have written this textbook for an undergraduate “foundations” course on electronic testing. Obviously, it is too voluminous for a one-semester course and a teacher will have to select from the topics. We did not restrict such freedom because the selection may depend upon the individual expertise and interests. Besides, there is merit in having a larger book that will retain its usefulness for the owner even after the completion of the course. With equal tenacity, we address the needs of three other groups of readers.
Author: Chang Publisher: John Wiley & Sons ISBN: 9788126511129 Category : Languages : en Pages : 526
Book Description
This book presents an integrated approach to digital design principles, processes, and implementations to help the reader design increasingly complex systems within shorter design cycles. It also introduces digital design concepts, VHDL coding, VHDL simulation, synthesis commands, and strategies together. · VHDL and Digital Circuit Primitives· VHDL Simulation and Synthesis Environment and Design Process· Basic Combinational Circuits· Basic Binary Arithmetic Circuits· Basic Sequential Circuits· Registers· Clock and Reset Circuits· Dual-Port RAM, FIFO, and DRAM Modeling· A Design Case Study: Finite Impulse Response Filter ASIC Design· A Design Case Study: A Microprogram Controller Design· Error Detection and Correction· Fixed-Point Multiplication· Fixed-Point Division· Floating-Point Arithmetic
Author: Miron Abramovici
Author: Miron Abramovici
Author: Zainalabedin Navabi
Author: Parag K. Lala
Author: Laung-Terng Wang
Author: Louis J. Gullo
Author: Mark Zwolinski
Author: Hideo Fujiwara
Author: N. K. Jha
Author: M. Bushnell
Author: Chang