Author: Samir KamalPublisher:
ISBN:
Category : Computers
Languages : en
Pages : 328
Book Description
Diagnosis of Intermittent Faults in Digital Systems
Author: Samir KamalPublisher:
ISBN:
Category : Computers
Languages : en
Pages : 328
Book Description
Detection of Intermittent Faults in Sequential Circuits
Author: Stanford University Stanford Electronics Laboratories. Digital Systems LaboratoryPublisher:
ISBN:
Category :
Languages : en
Pages : 40
Book Description
Testing for intermittent faults in digital circuits has been given significant attention in the past few years. However, very little theoretical work was done regarding their detection in sequential circuits.
Fault Diagnosis of Digital Systems
Author: Herbert Y. ChangPublisher: Krieger Publishing Company
ISBN:
Category : Computers
Languages : en
Pages : 186
Book Description
Testing for multiple intermittent failures in combinational circuits by maximizing the probability of fault detection
Author: Stanford University Stanford Electronics Laboratories. Digital Systems LaboratoryPublisher:
ISBN:
Category : Integrated circuits
Languages : en
Pages : 36
Book Description
Testing for single intermittent failures in combinational circuits by maximizing the probability of fault detection
Author: Stanford University Stanford Electronics Laboratories. Digital Systems LaboratoryPublisher:
ISBN:
Category : Digital electronics
Languages : en
Pages : 54
Book Description
Model and Random Testing Properties of Intermittent Faults in Combinational Circuits
Author: Stanford University Stanford Electronics Laboratories. Digital Systems LaboratoryPublisher:
ISBN:
Category :
Languages : en
Pages : 28
Book Description
Optimal random testing of single intermittent failures in combinational circuits
Author: Stanford University Stanford Electronics Laboratories. Digital Systems LaboratoryPublisher:
ISBN:
Category : Integrated circuits
Languages : en
Pages : 30
Book Description
Intermittent/transient Faults in Computer Systems: Executive Summary
Author: An Analysis of the Effects of Intermittent Faults on Digital Systems
Author: Richard Jay SpillmanPublisher:
ISBN:
Category : Digital counters
Languages : en
Pages : 192
Book Description
Testing and Diagnosis of VLSI and ULSI
Author: F. LombardiPublisher: Springer Science & Business Media
ISBN: 9400914172
Category : Technology & Engineering
Languages : en
Pages : 531
Book Description
This volume contains a collection of papers presented at the NATO Advanced Study Institute on ·Testing and Diagnosis of VLSI and ULSI" held at Villa Olmo, Como (Italy) June 22 -July 3,1987. High Density technologies such as Very-Large Scale Integration (VLSI), Wafer Scale Integration (WSI) and the not-so-far promises of Ultra-Large Scale Integration (ULSI), have exasperated the problema associated with the testing and diagnosis of these devices and systema. Traditional techniques are fast becoming obsolete due to unique requirements such as limited controllability and observability, increasing execution complexity for test vector generation and high cost of fault simulation, to mention just a few. New approaches are imperative to achieve the highly sought goal of the • three months· turn around cycle time for a state-of-the-art computer chip. The importance of testing and diagnostic processes is of primary importance if costs must be kept at acceptable levels. The objective of this NATO-ASI was to present, analyze and discuss the various facets of testing and diagnosis with respect to both theory and practice. The contents of this volume reflect the diversity of approaches currently available to reduce test and diagnosis time. These approaches are described in a concise, yet clear way by renowned experts of the field. Their contributions are aimed at a wide readership: the uninitiated researcher will find the tutorial chapters very rewarding. The expert wiII be introduced to advanced techniques in a very comprehensive manner.