Author: Publisher:
ISBN:
Category : Rapid thermal processing
Languages : en
Pages : 914
Book Description
Rapid Thermal and Integrated Processing
Author: Publisher:
ISBN:
Category : Rapid thermal processing
Languages : en
Pages : 914
Book Description
Selected Topics in Group IV and II-VI Semiconductors
Author: E.H.C. ParkerPublisher: Newnes
ISBN: 0444596437
Category : Technology & Engineering
Languages : en
Pages : 465
Book Description
This book contains the proceedings of two symposia which brought together crystal growers, chemists and physicists from across the world. The first part is concerned with silicon molecular beam epitaxy and presents an overview of the most research being done in the field. Part two discusses the problems dealing with purification, doping and defects of II-VI materials, mainly of the important semiconductors CdTe and ZnSe. The focus is on materials science issues which are the key for a better understanding of these materials and for any industrial application.
Rapid Thermal and Integrated Processing VII
Author: Materials Research SocietyPublisher:
ISBN:
Category : Chemical vapor deposition
Languages : en
Pages : 432
Book Description
Basic Properties of III-V Devices – Understanding Mysterious Trapping Phenomena
Author: Kompa, GünterPublisher: kassel university press GmbH
ISBN: 3862195414
Category : Compound semiconductors
Languages : en
Pages : 762
Book Description
Trapping effects in III-V devices pose a great challenge to any microwave device modeler. Understanding their physical origins is of prime importance to create physics-related reliable device models. The treatment of trapping phenomena is commonly beyond the classical higher-education level of communication engineers. This book provides any basic material needed to understand trapping effects occurring primarily in GaAs and GaN power HEMT devices. As the text material covers interdisciplinary topics such as crystal defects and localized charges, trap centers and trap dynamics, deep-level transient spectroscopy, and trap centers in passivation layers, the book will be of interest to graduate students of electrical engineering, communication engineering, and physics as well as materials, device, and circuit engineers in research and industry.
Dissertation Abstracts International
Author: Publisher:
ISBN:
Category : Dissertations, Academic
Languages : en
Pages : 854
Book Description
SiO2 and Its Interfaces: Volume 105
Author: S. T. PantelidesPublisher: Mrs Proceedings
ISBN:
Category : Science
Languages : en
Pages : 360
Book Description
The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.
American Doctoral Dissertations
Author: Publisher:
ISBN:
Category : Dissertation abstracts
Languages : en
Pages : 848
Book Description
IBM Journal of Research and Development
Author: Abstracts
Author: Materials Research Society. MeetingPublisher:
ISBN:
Category : Materials science
Languages : en
Pages : 504
Book Description
Electrical & Electronics Abstracts
Author: Publisher:
ISBN:
Category : Electrical engineering
Languages : en
Pages : 2304
Book Description