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Author: I. Bezverkhyy Publisher: ISBN: 9783037853979 Category : Diffusion Languages : en Pages : 0
Book Description
The International Conference on Diffusion in Materials (DIMAT) is the benchmark conference series for diffusion in solids. DIMAT 2011 was organized by the University of Bourgogne in association with CNRS, Dijon (France). The conference showcased new results concerning theoretical tools as well as applied research approaches. Diffusion processes affect all types of materials: nanomaterials, materials for energy, metallurgy, glasses and ceramics, but each requires its own numerical tools.Volume is indexed by Thomson Reuters CPCI-S (WoS). This volume comprises most of the contributions presented at DIMAT 2011: 4 plenary lectures delivered by famous high-level scientists plus 88 contributions in the form of keynote lectures, talks and posters.
Author: I. Bezverkhyy Publisher: ISBN: 9783037853979 Category : Diffusion Languages : en Pages : 0
Book Description
The International Conference on Diffusion in Materials (DIMAT) is the benchmark conference series for diffusion in solids. DIMAT 2011 was organized by the University of Bourgogne in association with CNRS, Dijon (France). The conference showcased new results concerning theoretical tools as well as applied research approaches. Diffusion processes affect all types of materials: nanomaterials, materials for energy, metallurgy, glasses and ceramics, but each requires its own numerical tools.Volume is indexed by Thomson Reuters CPCI-S (WoS). This volume comprises most of the contributions presented at DIMAT 2011: 4 plenary lectures delivered by famous high-level scientists plus 88 contributions in the form of keynote lectures, talks and posters.
Author: Pier Carlo Braga Publisher: Springer Science & Business Media ISBN: 1592596479 Category : Science Languages : en Pages : 388
Book Description
The natural, biological, medical, and related sciences would not be what they are today without the microscope. After the introduction of the optical microscope, a second breakthrough in morphostructural surface analysis occurred in the 1940s with the development of the scanning electron microscope (SEM), which, instead of light (i. e. , photons) and glass lenses, uses electrons and electromagnetic lenses (magnetic coils). Optical and scanning (or transmission) electron microscopes are called “far-field microscopes” because of the long distance between the sample and the point at which the image is obtained in comparison with the wavelengths of the photons or electrons involved. In this case, the image is a diffraction pattern and its resolution is wavelength limited. In 1986, a completely new type of microscopy was proposed, which, without the use of lenses, photons, or electrons, directly explores the sample surface by means of mechanical scanning, thus opening up unexpected possibilities for the morphostructural and mechanical analysis of biological specimens. These new scanning probe microscopes are based on the concept of near-field microscopy, which overcomes the problem of the limited diffraction-related resolution inherent in conventional microscopes. Located in the immediate vicinity of the sample itself (usually within a few nanometers), the probe records the intensity, rather than the interference signal, thus significantly improving resolution. Since the most we- known microscopes of this type operate using atomic forces, they are frequently referred to as atomic force microscopes (AFMs).
Author: François Brisset Publisher: EDP Sciences ISBN: 2759803481 Category : Science Languages : fr Pages : 930
Book Description
Aussi bien essentielle dans les milieux académiques qu'industriels, la microscopie électronique à balayage et les microanalyses associéessont au coeur de la recherche scientifique et industrielle. L'ensemble des bases théoriques, les principales caractéristiques techniques, ainsi que des compléments pratiques d'utilisation et d'entretien liés à ces disciplines sont développés dans cet ouvrage. Les microscopes électroniques sous haut vide ou vide contrôlé sont exposées profondément, les microanalyses EDS et WDS de dernières générations également. À coté de ces piliers structurants, d'autres techniques d'analyse ou d'observation sont abordées, telles l'analyse EBSD et l'imagerie 3D, le FIB, les simulations de Monte-Carlo et les essais in-situ, etc. Ce volume en langue française est le seul traitant du sujet de façon aussi exhaustive ; il représente la version actualisée et totalement refondue d'une précédente édition de 1979 aujourd'hui épuisée ; il regroupe enfin les cours dispensés lors de l'école d'été de Saint Martin d'Hères en 2006, organisée par le Groupement National de Microscopie Électronique à Balayage et de microAnalyses (GN-MEBA). Ce livre est particulièrement recommandé aux expérimentateurs mais intéressera aussi les spécialistes en science des matériaux (durs ou mous, conducteurs ou non-conducteurs, stratifiés, etc.) désireux de s'investir dans toutes ces techniques d'imagerie et d'analyse, afin d'en exploiter pleinement les forts potentiels. Il a été écrit par les enseignants de l'école d'été, tous chercheurs ou ingénieurs et spécialistes dans leur domaine. Cet ouvrage s'inscrit dans une collection de publications du GN-MEBA consacrée aux principes, aux techniques expérimentales et aux méthodes de calcul et de simulation en Microscopie Électronique à Balayage et en microanalyses.
Author: Victor J Morris Publisher: World Scientific ISBN: 190897821X Category : Science Languages : en Pages : 423
Book Description
Atomic force microscopy (AFM) is part of a range of emerging microscopic methods for biologists which offer the magnification range of both the light and electron microscope, but allow imaging under the 'natural' conditions usually associated with the light microscope. To biologists, AFM offers the prospect of high resolution images of biological material, images of molecules and their interactions even under physiological conditions, and the study of molecular processes in living systems. This book provides a realistic appreciation of the advantages and limitations of the technique and the present and future potential for improving the understanding of biological systems.The second edition of this bestseller has been updated to describe the latest developments in this exciting field, including a brand new chapter on force spectroscopy. The dramatic developments of AFM over the past ten years from a simple imaging tool to the multi-faceted, nano-manipulating technique that it is today are conveyed in a lively and informative narrative, which provides essential reading for students and experienced researchers alike./a
Author: Peter Eaton Publisher: OUP Oxford ISBN: 0191576670 Category : Science Languages : en Pages : 256
Book Description
Atomic force microscopy (AFM) is an amazing technique that allies a versatile methodology (that allows measurement of samples in liquid, vacuum or air) to imaging with unprecedented resolution. But it goes one step further than conventional microscopic techniques; it allows us to make measurements of magnetic, electrical or mechanical properties of the widest possible range of samples, with nanometre resolution. This book will demystify AFM for the reader, making it easy to understand, and to use. It is written by authors who together have more than 30 years experience in the design, construction, and use of AFMs and will explain why the microscopes are made the way they are, how they should be used, what data they can produce, and what can be done with the data. Illustrative examples from the physical sciences, materials science, life sciences, nanotechnology and industry demonstrate the different capabilities of the technique.
Author: Armand Vance Publisher: ISBN: 9781681172125 Category : Atomic force microscopy Languages : en Pages : 0
Book Description
The atomic force microscope (AFM) is one kind of scanning probe microscopes (SPM). SPMs are designed to measure local properties, such as height, friction, magnetism, with a probe. To acquire an image, the SPM raster-scans the probe over a small area of the sample, measuring the local property simultaneously. The information is gathered by "feeling" or "touching" the surface with a mechanical probe. Piezoelectric elements that facilitate tiny but accurate and precise movements on (electronic) command enable very precise scanning. Compared to competitive technologies such as optical microscopy and electron microscopy, the major difference between these and the atomic-force microscope is that the latter does not use lenses or beam irradiation. Therefore, it does not suffer from a limitation of space resolution due to diffraction limit and aberration, and it is not necessary to prepare a space for guiding the beam (by creating a vacuum) or to stain the sample. Piezo-ceramics position the tip with high resolution. Piezoelectric ceramics are a class of materials that expand or contract when in the presence of a voltage gradient. Piezo-ceramics make it possible to create three-dimensional positioning devices of arbitrarily high precision. In contact mode, AFMs use feedback to regulate the force on the sample. The AFM not only measures the force on the sample but also regulates it, allowing acquisition of images at very low forces. The feedback loop consists of the tube scanner that controls the height of the tip; the cantilever and optical lever, which measures the local height of the sample; and a feedback circuit that attempts to keep the cantilever deflection constant by adjusting the voltage applied to the scanner. The atomic force microscope is a powerful tool that is invaluable if to measure incredibly small samples with a great degree of accuracy. Unlike rival technologies it does not require either a vacuum or the sample to undergo treatment that might damage it. At the limits of operation however, researchers have demonstrated atomic resolution in high vacuum and even liquid environments. The book entitled Atomic Force Microscopy covers the applications and theories of atomic force microscope.
Author: I. Bezverkhyy
Author: I. Bezverkhyy
Author: Pier Carlo Braga
Author: François Brisset
Author: 
Author: Victor J Morris
Author: Peter Eaton
Author: Delhi Guillaumin
Author: Edgar Clayton Teague
Author: Armand Vance
Author: Jean-François Bresse