Author: D. J. Dumin
Publisher: World Scientific
ISBN: 9789810248420
Category : Technology & Engineering
Languages : en
Pages : 292
Book Description
Presents in summary the state of our knowledge of oxide reliability.
Hot Carrier Degradation in Semiconductor Devices
Author: Tibor Grasser
Publisher: Springer
ISBN: 3319089943
Category : Technology & Engineering
Languages : en
Pages : 518
Book Description
This book provides readers with a variety of tools to address the challenges posed by hot carrier degradation, one of today’s most complicated reliability issues in semiconductor devices. Coverage includes an explanation of carrier transport within devices and book-keeping of how they acquire energy (“become hot”), interaction of an ensemble of colder and hotter carriers with defect precursors, which eventually leads to the creation of a defect, and a description of how these defects interact with the device, degrading its performance.
Publisher: Springer
ISBN: 3319089943
Category : Technology & Engineering
Languages : en
Pages : 518
Book Description
This book provides readers with a variety of tools to address the challenges posed by hot carrier degradation, one of today’s most complicated reliability issues in semiconductor devices. Coverage includes an explanation of carrier transport within devices and book-keeping of how they acquire energy (“become hot”), interaction of an ensemble of colder and hotter carriers with defect precursors, which eventually leads to the creation of a defect, and a description of how these defects interact with the device, degrading its performance.
Oxide Reliability
Author: D. J. Dumin
Publisher: World Scientific
ISBN: 9789810248420
Category : Technology & Engineering
Languages : en
Pages : 292
Book Description
Presents in summary the state of our knowledge of oxide reliability.
Publisher: World Scientific
ISBN: 9789810248420
Category : Technology & Engineering
Languages : en
Pages : 292
Book Description
Presents in summary the state of our knowledge of oxide reliability.
Scientific and Technical Aerospace Reports
Chemical Abstracts
Publications of the National Institute of Standards and Technology 1988 Catalog
Publications of the National Institute of Standards and Technology ... Catalog
Author: National Institute of Standards and Technology (U.S.)
Publisher:
ISBN:
Category :
Languages : en
Pages : 480
Book Description
Publisher:
ISBN:
Category :
Languages : en
Pages : 480
Book Description
Proceedings of the 25th International Conference on the Physics of Semiconductors Part I
Author: Norio MIURA
Publisher: Springer
ISBN:
Category : Technology & Engineering
Languages : en
Pages : 1036
Book Description
As the proceedings of the most important and prestigious conference in the field of semiconductor physics, this book contains the latest information on the progress of semiconductor physics. Almost 1000 contributed papers address the full range of current topics. The special symposium deals with the interface between the fundamentals and device applications and tries to predict the developments in semiconductor physics, semiconductor materials and device applications in the 21st century. A wide range of contributions represent the forefront of academic and industrial research.
Publisher: Springer
ISBN:
Category : Technology & Engineering
Languages : en
Pages : 1036
Book Description
As the proceedings of the most important and prestigious conference in the field of semiconductor physics, this book contains the latest information on the progress of semiconductor physics. Almost 1000 contributed papers address the full range of current topics. The special symposium deals with the interface between the fundamentals and device applications and tries to predict the developments in semiconductor physics, semiconductor materials and device applications in the 21st century. A wide range of contributions represent the forefront of academic and industrial research.
Publications
Author: United States. National Bureau of Standards
Publisher:
ISBN:
Category : Government publications
Languages : en
Pages : 360
Book Description
Publisher:
ISBN:
Category : Government publications
Languages : en
Pages : 360
Book Description
IBM Journal of Research and Development
Microelectronic Failure Analysis Desk Reference
Author:
Publisher: ASM International
ISBN: 0871707454
Category : Technology & Engineering
Languages : en
Pages : 162
Book Description
Developed by the Electronic Device Failure Analysis Society (EDFAS) Publications Committee.
Publisher: ASM International
ISBN: 0871707454
Category : Technology & Engineering
Languages : en
Pages : 162
Book Description
Developed by the Electronic Device Failure Analysis Society (EDFAS) Publications Committee.