Author: David F. SiemsPublisher:
ISBN:
Category : Rocks
Languages : en
Pages : 26
Book Description
Determination of Thirty Elements in Geological Materials by Energy-dispersive X-ray Fluorescence Spectrometry
Author: David F. SiemsEnergy Dispersive X-ray Fluorescence Analysis
Author: Bohdan DziunikowskiPublisher: Pwn
ISBN:
Category : Analytical chemistry
Languages : en
Pages : 460
Book Description
Hardbound. In Volume IIC of the series, G.L. Macdonald contributed a chapter on X-Ray Spectrometry in which the principles of X-ray fluorescence analysis were presented with great clarity. Since that contribution appeared in 1971 tremendous developments have taken place with one of the most important new features being the appearance of energy-dispersive methods.This new volume gives a detailed and up-to-date account of this important technique. It covers the various physical and technical problems associated with this analytical method, with emphasis on explaining the interferences due to matrix and particle size effects. Methods for overcoming these interferences are described and other sources of errors and the processing of measurement data are discussed. Also described are numerous applications of EDXRF analysis in a variety of fields including geological prospecting and mining, trace element analysis, biology, medicine, environmental pollution con
Energy-dispersive X-ray Fluorescence Spectrometry Using the Kevex 7000 System
Author: Françoise ElsassPublisher:
ISBN:
Category : X-ray spectroscopy
Languages : en
Pages : 64
Book Description
A method of quantitative analysis of trace elements in silicate rocks by energy-dispersive X-ray fluorescence spectroscopy
Author: John C. JacksonPublisher:
ISBN:
Category : Trace elements
Languages : en
Pages : 72
Book Description
Energy Dispersive Spectrometry of Common Rock Forming Minerals
Author: Kenneth P. SeverinPublisher: Springer Science & Business Media
ISBN: 1402028415
Category : Science
Languages : en
Pages : 228
Book Description
This book provides a very basic introduction to electron microscopy and energy dispersive spectrometry (EDS). It has the largest compiled collection of EDS spectra ever published and covers most common rock forming minerals. In addition, it provides a key to help the novice wade through the large number of spectra.
New Publications of the Geological Survey
Author: Geological Survey (U.S.)Publisher:
ISBN:
Category : Geology
Languages : en
Pages : 746
Book Description
Automated Energy-dispersive X-ray Determination of Trace Elements in Stream Sediments
Author: James M. HanselPublisher:
ISBN:
Category : Fluorescence spectroscopy
Languages : en
Pages : 14
Book Description
Glass Reference Standards for the Trace-element Analysis of Geological Materials--compilation of Interlaboratory Data
Author: A. T. MyersPublisher:
ISBN:
Category : Analytical geochemistry
Languages : en
Pages : 42
Book Description
X-Ray Fluorescence Spectrometry and Related Techniques
Author: Eva MarguiPublisher: Momentum Press
ISBN: 1606503936
Category : Technology & Engineering
Languages : en
Pages : 149
Book Description
X-ray fluorescence spectrometry (XRF) is a well-established analytical technique for qualitative and quantitative elemental analysis of a wide variety of routine quality control and research samples. Among its many desirable features, it delivers true multi-element character analysis, acceptable speed and economy, easy of automation, and the capacity to analyze solid samples. This remarkable contribution to this field provides a comprehensive and up-to-date account of basic principles, recent developments, instrumentation, sample preparation procedures, and applications of XRF analysis. If you are a professional in materials science, analytic chemistry, or physics, you will benefit from not only the review of basics, but also the newly developed technologies with XRF. Those recent technological advances, including the design of low-power micro- focus tubes and novel X-ray optics and detectors, have made it possible to extend XRF to the analysis of low-Z elements and to obtain 2D or 3D information on a micrometer-scale. And, the recent development and commercialization of bench top and portable instrumentation, offering extreme simplicity of operation in a low-cost design, have extended the applications of XRF to many more analytical problems.
Analyzing Materials Using Joint X-ray Fluorescence and Diffraction Spectra
Author: Anton I. MikhailovPublisher: Cambridge Scholars Publishing
ISBN: 1527543897
Category : Science
Languages : en
Pages : 250
Book Description
This book presents a complex approach to material composition determination based on the analysis of the joint X-ray spectrum, including fluorescence, scattering, and diffraction reflections. It considers fluorescence, scattered, and diffracted radiations within the common problem of analytical spectrum formation. The complex methods for analyzing the material composition by joint spectra of fluorescence, Compton scattering and diffraction proposed here allow for a widening of the area of the application of X-ray methods. The book will be useful for specialists in the field of solid state physics, as well as advanced and post-graduate students.