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Author: Stanford University Stanford Electronics Laboratories. Digital Systems Laboratory Publisher: ISBN: Category : Languages : en Pages : 40
Book Description
Testing for intermittent faults in digital circuits has been given significant attention in the past few years. However, very little theoretical work was done regarding their detection in sequential circuits.
Author: Stanford University Stanford Electronics Laboratories. Digital Systems Laboratory Publisher: ISBN: Category : Languages : en Pages : 40
Book Description
Testing for intermittent faults in digital circuits has been given significant attention in the past few years. However, very little theoretical work was done regarding their detection in sequential circuits.
Author: Stanford University Stanford Electronics Laboratories. Digital Systems Laboratory Publisher: ISBN: Category : Digital electronics Languages : en Pages : 54
Author: Stanford University Stanford Electronics Laboratories. Digital Systems Laboratory Publisher: ISBN: Category : Integrated circuits Languages : en Pages : 36
Author: Jeng-Chuan Kau Publisher: ISBN: Category : Asynchronous circuits Languages : en Pages : 86
Book Description
"As the asynchronous sequential circuit has become more and more important to digital systems in recent years high reliability and simple maintenance of the circuit is stressed. This paper presents a fault-detection algorithm which will be applicable to most of the practical asynchronous sequential circuits. The asynchronous sequential circuit is treated from the combinatoric point of view. First the minimal set of states, both stable states and unstable states, sufficient to detect all possible faults of the circuit is found from the fault table. Then a test sequence is generated to go through these states. It is assumed that testing outputs can be added. Simple and systematic techniques are also presented for the construction of fault table and the generation of test sequence. The usefulness of this algorithm increases as the density of the stable states associated with the circuit increases"--Abstract, leaf ii.
Author: Stanford University Stanford Electronics Laboratories. Digital Systems Laboratory
Author: Stanford University Stanford Electronics Laboratories. Digital Systems Laboratory
Author: Samir Kamal
Author: Edward George Sable
Author: Stanford University Stanford Electronics Laboratories. Digital Systems Laboratory
Author: J. Rettig
Author: Arthur D. Friedman
Author: Stanford University Stanford Electronics Laboratories. Digital Systems Laboratory
Author: Donald Whitesell Hartman
Author: Stanford University Stanford Electronics Laboratories. Digital Systems Laboratory
Author: Jeng-Chuan Kau