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Author: Liang Dai Publisher: Springer Science & Business Media ISBN: 9781402072383 Category : Computers Languages : en Pages : 186
Book Description
Design of High-Performance CMOS Voltage-Controlled Oscillators presents a phase noise modeling framework for CMOS ring oscillators. The analysis considers both linear and nonlinear operation. It indicates that fast rail-to-rail switching has to be achieved to minimize phase noise. Additionally, in conventional design the flicker noise in the bias circuit can potentially dominate the phase noise at low offset frequencies. Therefore, for narrow bandwidth PLLs, noise up conversion for the bias circuits should be minimized. We define the effective Q factor (Qeff) for ring oscillators and predict its increase for CMOS processes with smaller feature sizes. Our phase noise analysis is validated via simulation and measurement results. The digital switching noise coupled through the power supply and substrate is usually the dominant source of clock jitter. Improving the supply and substrate noise immunity of a PLL is a challenging job in hostile environments such as a microprocessor chip where millions of digital gates are present.
Author: Liang Dai Publisher: Springer Science & Business Media ISBN: 9781402072383 Category : Computers Languages : en Pages : 186
Book Description
Design of High-Performance CMOS Voltage-Controlled Oscillators presents a phase noise modeling framework for CMOS ring oscillators. The analysis considers both linear and nonlinear operation. It indicates that fast rail-to-rail switching has to be achieved to minimize phase noise. Additionally, in conventional design the flicker noise in the bias circuit can potentially dominate the phase noise at low offset frequencies. Therefore, for narrow bandwidth PLLs, noise up conversion for the bias circuits should be minimized. We define the effective Q factor (Qeff) for ring oscillators and predict its increase for CMOS processes with smaller feature sizes. Our phase noise analysis is validated via simulation and measurement results. The digital switching noise coupled through the power supply and substrate is usually the dominant source of clock jitter. Improving the supply and substrate noise immunity of a PLL is a challenging job in hostile environments such as a microprocessor chip where millions of digital gates are present.
Author: Sorin Voinigescu Publisher: Cambridge University Press ISBN: 0521873029 Category : Technology & Engineering Languages : en Pages : 921
Book Description
A transistor-level, design-intensive overview of high speed and high frequency monolithic integrated circuits for wireless and broadband systems from 2 GHz to 200 GHz, this comprehensive text covers high-speed, RF, mm-wave, and optical fibre circuits using nanoscale CMOS, SiGe BiCMOS, and III-V technologies. Step-by-step design methodologies, end-of chapter problems, and practical simulation and design projects are provided, making this an ideal resource for senior undergraduate and graduate courses in circuit design. With an emphasis on device-circuit topology interaction and optimization, it gives circuit designers and students alike an in-depth understanding of device structures and process limitations affecting circuit performance.
Author: Liang Dai Publisher: Springer Science & Business Media ISBN: 1461511453 Category : Technology & Engineering Languages : en Pages : 170
Book Description
Design of High-Performance CMOS Voltage-Controlled Oscillators presents a phase noise modeling framework for CMOS ring oscillators. The analysis considers both linear and nonlinear operation. It indicates that fast rail-to-rail switching has to be achieved to minimize phase noise. Additionally, in conventional design the flicker noise in the bias circuit can potentially dominate the phase noise at low offset frequencies. Therefore, for narrow bandwidth PLLs, noise up conversion for the bias circuits should be minimized. We define the effective Q factor (Qeff) for ring oscillators and predict its increase for CMOS processes with smaller feature sizes. Our phase noise analysis is validated via simulation and measurement results. The digital switching noise coupled through the power supply and substrate is usually the dominant source of clock jitter. Improving the supply and substrate noise immunity of a PLL is a challenging job in hostile environments such as a microprocessor chip where millions of digital gates are present.
Author: Howard Cam Luong Publisher: Springer ISBN: 3319158740 Category : Technology & Engineering Languages : en Pages : 214
Book Description
This book provides in-depth coverage of transformer-based design techniques that enable CMOS oscillators and frequency dividers to achieve state-of-the-art performance. Design, optimization, and measured performance of oscillators and frequency dividers for different applications are discussed in detail, focusing on not only ultra-low supply voltage but also ultra-wide frequency tuning range and locking range. This book will be an invaluable reference for anyone working or interested in CMOS radio-frequency or mm-Wave integrated circuits and systems.
Author: Ganapati Panda Publisher: Springer ISBN: 9811319065 Category : Technology & Engineering Languages : en Pages : 802
Book Description
The book discusses the latest developments and outlines future trends in the fields of microelectronics, electromagnetics and telecommunication. It contains original research works presented at the International Conference on Microelectronics, Electromagnetics and Telecommunication (ICMEET 2018), organised by GVP College of Engineering (A), Andhra Pradesh, India. The respective papers were written by scientists, research scholars and practitioners from leading universities, engineering colleges and R&D institutes from all over the world, and share the latest breakthroughs in and promising solutions to the most important issues facing today’s society.
Author: Manoj Singh Gaur Publisher: Springer ISBN: 3642420249 Category : Computers Languages : en Pages : 403
Book Description
This book constitutes the refereed proceedings of the 17th International Symposium on VLSI Design and Test, VDAT 2013, held in Jaipur, India, in July 2013. The 44 papers presented were carefully reviewed and selected from 162 submissions. The papers discuss the frontiers of design and test of VLSI components, circuits and systems. They are organized in topical sections on VLSI design, testing and verification, embedded systems, emerging technology.
Author: Liang Dai
Author: Liang Dai
Author: Sorin Voinigescu
Author: Liang Dai
Author: Monika Bhardwaj
Author: Massimo Pirazzini
Author: Howard Cam Luong
Author: Ganapati Panda
Author: Bin Wan
Author: Donald J. Wilson
Author: Manoj Singh Gaur