Electrical & Electronics Abstracts PDF Download

Author:
Publisher:
ISBN:
Category : Electrical engineering
Languages : en
Pages : 1860

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Author:
Publisher:
ISBN:
Category : Research
Languages : en
Pages : 1686

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Sections 1-2. Keyword Index.--Section 3. Personal author index.--Section 4. Corporate author index.-- Section 5. Contract/grant number index, NTIS order/report number index 1-E.--Section 6. NTIS order/report number index F-Z.

Author: Institute of Electrical and Electronics Engineers
Publisher:
ISBN:
Category : Electric engineering
Languages : en
Pages : 944

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Issues for 1973- cover the entire IEEE technical literature.

Author:
Publisher:
ISBN:
Category : Optics
Languages : en
Pages : 662

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Author: Robert B. Northrop
Publisher: CRC Press
ISBN: 1000055132
Category : Technology & Engineering
Languages : en
Pages : 952

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Weighing in on the growth of innovative technologies, the adoption of new standards, and the lack of educational development as it relates to current and emerging applications, the third edition of Introduction to Instrumentation and Measurements uses the authors’ 40 years of teaching experience to expound on the theory, science, and art of modern instrumentation and measurements (I&M). What’s New in This Edition: This edition includes material on modern integrated circuit (IC) and photonic sensors, micro-electro-mechanical (MEM) and nano-electro-mechanical (NEM) sensors, chemical and radiation sensors, signal conditioning, noise, data interfaces, and basic digital signal processing (DSP), and upgrades every chapter with the latest advancements. It contains new material on the designs of micro-electro-mechanical (MEMS) sensors, adds two new chapters on wireless instrumentation and microsensors, and incorporates extensive biomedical examples and problems. Containing 13 chapters, this third edition: Describes sensor dynamics, signal conditioning, and data display and storage Focuses on means of conditioning the analog outputs of various sensors Considers noise and coherent interference in measurements in depth Covers the traditional topics of DC null methods of measurement and AC null measurements Examines Wheatstone and Kelvin bridges and potentiometers Explores the major AC bridges used to measure inductance, Q, capacitance, and D Presents a survey of sensor mechanisms Includes a description and analysis of sensors based on the giant magnetoresistive effect (GMR) and the anisotropic magnetoresistive (AMR) effect Provides a detailed analysis of mechanical gyroscopes, clinometers, and accelerometers Contains the classic means of measuring electrical quantities Examines digital interfaces in measurement systems Defines digital signal conditioning in instrumentation Addresses solid-state chemical microsensors and wireless instrumentation Introduces mechanical microsensors (MEMS and NEMS) Details examples of the design of measurement systems Introduction to Instrumentation and Measurements is written with practicing engineers and scientists in mind, and is intended to be used in a classroom course or as a reference. It is assumed that the reader has taken core EE curriculum courses or their equivalents.

Author: Hugo Weichel
Publisher: SPIE Press
ISBN: 9780819404879
Category : Science
Languages : en
Pages : 114

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Author: Anton J. Schleiss
Publisher: CRC Press
ISBN: 1315736918
Category : Technology & Engineering
Languages : en
Pages : 300

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Despite the mechanisms of reservoir sedimentation being well known for a long time, sustainable and preventive measures are rarely taken into consideration in the design of new reservoirs. To avoid operational problems of powerhouses, sedimentation is often treated for existing reservoirs with measures which are efficient only for a limited time.Th

Author: Kjell J. Gåsvik
Publisher: John Wiley & Sons
ISBN: 0470846704
Category : Technology & Engineering
Languages : en
Pages : 372

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Book Description
New material on computerized optical processes, computerized ray tracing, and the fast Fourier transform, Bibre-Bragg sensors, and temporal phase unwrapping. * New introductory sections to all chapters. * Detailed discussion on lasers and laser principles, including an introduction to radiometry and photometry. * Thorough coverage of the CCD camera.

Author: Iwaki Akiyama
Publisher: Springer Science & Business Media
ISBN: 140208823X
Category : Science
Languages : en
Pages : 491

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Book Description
The 29th International Symposium on Acoustical Imaging was held in Shonan Village, Kanagawa, Japan, April 15-18, 2007. This interdisciplinary Symposium has been taking place every two years since 1968 and forms a unique forum for advanced research, covering new technologies, developments, methods and theories in all areas of acoustics. In the course of the years the volumes in the Acoustical Imaging Series have developed and become well-known and appreciated reference works. Offering both a broad perspective on the state-of-the-art in the field as well as an in-depth look at its leading edge research, this Volume 29 in the Series contains again an excellent collection of seventy papers presented in nine major categories: (1) Strain Imaging, (2) Biological and Medical Applications, (3) Acoustic Microscopy, (4) Non-Destructive Evaluation and Industrial Applications, (5) Components and Systems, (6) Geophysics and Underwater Imaging, (7) Physics and Mathematics, (8) Medical Image Analysis, (9) FDTD method and Other Numerical Simulations.

Author: Larry C. Andrews
Publisher: SPIE-International Society for Optical Engineering
ISBN:
Category : Science
Languages : en
Pages : 820

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Book Description
Since publication of the first edition of this text in 1998, there have been several new, important developments in the theory of beam wave propagation through a random medium, which have been incorporated into this second edition. Also new to this edition are models for the scintillation index under moderate-to-strong irradiance fluctuations; models for aperture averaging based on ABCD ray matrices; beam wander and its effects on scintillation; theory of partial coherence of the source; models of rough targets for ladar applications; phase fluctuations; analysis of other beam shapes; plus expanded analysis of free-space optical communication systems and imaging systems.