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Author: Waltraud Kahle Publisher: John Wiley & Sons ISBN: 111930752X Category : Mathematics Languages : en Pages : 242
Book Description
"Degradation process" refers to many types of reliability models, which correspond to various kinds of stochastic processes used for deterioration modeling. This book focuses on the case of a univariate degradation model with a continuous set of possible outcomes. The envisioned univariate models have one single measurable quantity which is assumed to be observed over time. The first three chapters are each devoted to one degradation model. The last chapter illustrates the use of the previously described degradation models on some real data sets. For each of the degradation models, the authors provide probabilistic results and explore simulation tools for sample paths generation. Various estimation procedures are also developed.
Author: Waltraud Kahle Publisher: John Wiley & Sons ISBN: 111930752X Category : Mathematics Languages : en Pages : 242
Book Description
"Degradation process" refers to many types of reliability models, which correspond to various kinds of stochastic processes used for deterioration modeling. This book focuses on the case of a univariate degradation model with a continuous set of possible outcomes. The envisioned univariate models have one single measurable quantity which is assumed to be observed over time. The first three chapters are each devoted to one degradation model. The last chapter illustrates the use of the previously described degradation models on some real data sets. For each of the degradation models, the authors provide probabilistic results and explore simulation tools for sample paths generation. Various estimation procedures are also developed.
Author: Waltraud Kahle Publisher: John Wiley & Sons ISBN: 111930749X Category : Mathematics Languages : en Pages : 244
Book Description
"Degradation process" refers to many types of reliability models, which correspond to various kinds of stochastic processes used for deterioration modeling. This book focuses on the case of a univariate degradation model with a continuous set of possible outcomes. The envisioned univariate models have one single measurable quantity which is assumed to be observed over time. The first three chapters are each devoted to one degradation model. The last chapter illustrates the use of the previously described degradation models on some real data sets. For each of the degradation models, the authors provide probabilistic results and explore simulation tools for sample paths generation. Various estimation procedures are also developed.
Author: Dimitris Kiritsis Publisher: Springer Science & Business Media ISBN: 0857293206 Category : Technology & Engineering Languages : en Pages : 997
Book Description
Engineering Asset Management discusses state-of-the-art trends and developments in the emerging field of engineering asset management as presented at the Fourth World Congress on Engineering Asset Management (WCEAM). It is an excellent reference for practitioners, researchers and students in the multidisciplinary field of asset management, covering such topics as asset condition monitoring and intelligent maintenance; asset data warehousing, data mining and fusion; asset performance and level-of-service models; design and life-cycle integrity of physical assets; deterioration and preservation models for assets; education and training in asset management; engineering standards in asset management; fault diagnosis and prognostics; financial analysis methods for physical assets; human dimensions in integrated asset management; information quality management; information systems and knowledge management; intelligent sensors and devices; maintenance strategies in asset management; optimisation decisions in asset management; risk management in asset management; strategic asset management; and sustainability in asset management.
Author: M.S. Nikulin Publisher: Birkhäuser ISBN: 9780817649234 Category : Mathematics Languages : en Pages : 416
Book Description
This volume is a collection of invited chapters covering recent advances in accelerated life testing and degradation models. The book covers a wide range of applications to areas such as reliability, quality control, the health sciences, economics and finance. It is an excellent reference for researchers and practitioners in applied probability and statistics, industrial statistics, the health sciences, quality control, economics, and finance.
Author: Ding-Geng (Din) Chen Publisher: Springer ISBN: 9811051941 Category : Mathematics Languages : en Pages : 382
Book Description
This book focuses on the statistical aspects of the analysis of degradation data. In recent years, degradation data analysis has come to play an increasingly important role in different disciplines such as reliability, public health sciences, and finance. For example, information on products’ reliability can be obtained by analyzing degradation data. In addition, statistical modeling and inference techniques have been developed on the basis of different degradation measures. The book brings together experts engaged in statistical modeling and inference, presenting and discussing important recent advances in degradation data analysis and related applications. The topics covered are timely and have considerable potential to impact both statistics and reliability engineering.
Author: Waltraud Kahle Publisher: John Wiley & Sons ISBN: 1848218885 Category : Mathematics Languages : en Pages : 238
Book Description
"Degradation process" refers to many types of reliability models, which correspond to various kinds of stochastic processes used for deterioration modeling. This book focuses on the case of a univariate degradation model with a continuous set of possible outcomes. The envisioned univariate models have one single measurable quantity which is assumed to be observed over time. The first three chapters are each devoted to one degradation model. The last chapter illustrates the use of the previously described degradation models on some real data sets. For each of the degradation models, the authors provide probabilistic results and explore simulation tools for sample paths generation. Various estimation procedures are also developed.
Author: Osamu Ueda Publisher: Artech House Publishers ISBN: Category : Science Languages : en Pages : 376
Book Description
In developing III-V optical devices for use in optical fiber communication systems, digital-audio systems, and optical printers, reliability is paramount. Understanding the origins and causes of degradation is critical to successful design. This unique book focuses specifically on helping researchers and engineers involved in III-V compound semiconductor thin film growth and processing better understand the mechanism of degradation and details the major degradation modes of optical devices fabricated from three different systems. The book explains the character of defects and imperfections induced during material growth and fabrication, presents techniques for failure analysis, and describes methods for elimination of defect-generating mechanisms. More than 200 illustrations and 40 equations help clarify important concepts.
Author: Alistair B Forbes Publisher: World Scientific ISBN: 981327431X Category : Mathematics Languages : en Pages : 458
Book Description
This volume contains original, refereed contributions by researchers from institutions and laboratories across the world that are involved in metrology and testing. They were adapted from presentations made at the eleventh edition of the Advanced Mathematical and Computational Tools in Metrology and Testing conference held at the University of Strathclyde, Glasgow, in September 2017, organized by IMEKO Technical Committee 21, the National Physical Laboratory, UK, and the University of Strathclyde. The papers present new modeling approaches, algorithms and computational methods for analyzing data from metrology systems and for evaluation of the measurement uncertainty, and describe their applications in a wide range of measurement areas.This volume is useful to all researchers, engineers and practitioners who need to characterize the capabilities of measurement systems and evaluate measurement data. Through the papers written by experts working in leading institutions, it covers the latest computational approaches and describes applications to current measurement challenges in engineering, environment and life sciences.
Author: Toshio Nakagawa Publisher: Springer Science & Business Media ISBN: 1846284422 Category : Technology & Engineering Languages : en Pages : 191
Book Description
This is the first monograph which presents shock and damage models in reliability from introduction to application. Stochastic processes are introduced before current developments are surveyed. The practical applications of shock and damage models are demonstrated using case studies. The author is a leading researcher in this field with more than thirty years of experience. Reliability engineers and managers of maintenance work will find this book a broad reference.
Author: Ilia B. Frenkel Publisher: John Wiley & Sons ISBN: 1118701895 Category : Technology & Engineering Languages : en Pages : 449
Book Description
This complete resource on the theory and applications of reliability engineering, probabilistic models and risk analysis consolidates all the latest research, presenting the most up-to-date developments in this field. With comprehensive coverage of the theoretical and practical issues of both classic and modern topics, it also provides a unique commemoration to the centennial of the birth of Boris Gnedenko, one of the most prominent reliability scientists of the twentieth century. Key features include: expert treatment of probabilistic models and statistical inference from leading scientists, researchers and practitioners in their respective reliability fields detailed coverage of multi-state system reliability, maintenance models, statistical inference in reliability, systemability, physics of failures and reliability demonstration many examples and engineering case studies to illustrate the theoretical results and their practical applications in industry Applied Reliability Engineering and Risk Analysis is one of the first works to treat the important areas of degradation analysis, multi-state system reliability, networks and large-scale systems in one comprehensive volume. It is an essential reference for engineers and scientists involved in reliability analysis, applied probability and statistics, reliability engineering and maintenance, logistics, and quality control. It is also a useful resource for graduate students specialising in reliability analysis and applied probability and statistics. Dedicated to the Centennial of the birth of Boris Gnedenko, renowned Russian mathematician and reliability theorist
Author: Waltraud Kahle
Author: Waltraud Kahle
Author: Waltraud Kahle
Author: Dimitris Kiritsis
Author: M.S. Nikulin
Author: Ding-Geng (Din) Chen
Author: Waltraud Kahle
Author: Osamu Ueda
Author: Alistair B Forbes
Author: Toshio Nakagawa
Author: Ilia B. Frenkel