Author: V. SwaminathanPublisher: Mrs Proceedings
ISBN:
Category : Science
Languages : en
Pages : 304
Book Description
The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.
Degradation Mechanisms in III-V Compound Semiconductor Devices and Structures: Volume 184
Author: V. SwaminathanPublisher: Mrs Proceedings
ISBN:
Category : Science
Languages : en
Pages : 304
Book Description
The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.
Degradation mechanisms in III - V compound semiconductor devices and structures
Author: V. SwaminathanMaterials Research Society Symposium Proceedings: Volume 184, Degradation Mechanisms in III-V Compound Semiconductor Devices and Structures
Author: V. SwaminathanPublisher:
ISBN:
Category :
Languages : en
Pages : 300
Book Description
This volume presents results from a Materials Research Society symposium aimed at one of the most important, yet often overlooked, areas in modern III-V device technology, namely the cause and effects of device degradation. Invited papers were presented on reliability calculations and protocols, the effects of various defects on device performance and the stability of layered structures and metallization. This topic is still one in which individual companies are reluctant to share their hard-earned data on reliability and degradation mechanisms, since these constitute a commercial advantage in many cases. It is clearly an area to which too little attention has been paid to date at international forums and it is expected that this will delineate the critical features of device and material degradation. Of continuing interest are the effects of stress and recombination-enhancement on the degradation of electronic and photonic devices, the role of defects in enhancing diffusion of dopants and lattice constituents and the reliability of metals on III-V materials. All of these subjects were covered in individual sessions within the symposium.
Reliability and Degradation of III-V Optical Devices
Author: Osamu UedaPublisher: Artech House Publishers
ISBN:
Category : Science
Languages : en
Pages : 376
Book Description
In developing III-V optical devices for use in optical fiber communication systems, digital-audio systems, and optical printers, reliability is paramount. Understanding the origins and causes of degradation is critical to successful design. This unique book focuses specifically on helping researchers and engineers involved in III-V compound semiconductor thin film growth and processing better understand the mechanism of degradation and details the major degradation modes of optical devices fabricated from three different systems. The book explains the character of defects and imperfections induced during material growth and fabrication, presents techniques for failure analysis, and describes methods for elimination of defect-generating mechanisms. More than 200 illustrations and 40 equations help clarify important concepts.
Compound Semiconductor Strained-Layer Superlattices
Author: R.M. BiefeldPublisher: Trans Tech Publications Ltd
ISBN: 3035739714
Category : Technology & Engineering
Languages : en
Pages : 237
Book Description
-Effect of Internal Piezoelectric Fields on the Electronic Structure and Optical Properties of Strained-Layer Superlattices -Metastability in Semiconductor Strained-Layer Structures -The Morphology of MOCVD-Grown Semiconductor Multilayers -Electrical Transport Studies of InGaAs/GaAs Strained-Layer Quantum-Well Structures -Device Structures Based on GaAsP/InGaAs Strained Layer Superlattices and Their Stability -The Preparation and Infrared Properties of In (AsSb) Strained-Layer Superlattices -Ion Implantation of III-V Compound Semiconductor Strained-Layer Semiconductors Systems -II-VI Strained-Layer Semiconductor Superlattices
Physics Briefs
Author: State-of-the-Art Program on Compound Semiconductors 52 (SOTAPOCS 52)
Author: M. E. OverbergPublisher: The Electrochemical Society
ISBN: 1566778328
Category : Science
Languages : en
Pages : 232
Book Description
The papers included in this issue of ECS Transactions were originally presented in the symposium ¿State-of-the-Art Program on Compound Semiconductors 52 (SOTAPOCS 52)¿, held during the 218th meeting of The Electrochemical Society, in Las Vegas, Nevada from October 10 to 15, 2010.
Materials and Reliability Handbook for Semiconductor Optical and Electron Devices
Author: Osamu UedaPublisher: Springer Science & Business Media
ISBN: 1461443377
Category : Science
Languages : en
Pages : 618
Book Description
Materials and Reliability Handbook for Semiconductor Optical and Electron Devices provides comprehensive coverage of reliability procedures and approaches for electron and photonic devices. These include lasers and high speed electronics used in cell phones, satellites, data transmission systems and displays. Lifetime predictions for compound semiconductor devices are notoriously inaccurate due to the absence of standard protocols. Manufacturers have relied on extrapolation back to room temperature of accelerated testing at elevated temperature. This technique fails for scaled, high current density devices. Device failure is driven by electric field or current mechanisms or low activation energy processes that are masked by other mechanisms at high temperature. The Handbook addresses reliability engineering for III-V devices, including materials and electrical characterization, reliability testing, and electronic characterization. These are used to develop new simulation technologies for device operation and reliability, which allow accurate prediction of reliability as well as the design specifically for improved reliability. The Handbook emphasizes physical mechanisms rather than an electrical definition of reliability. Accelerated aging is useful only if the failure mechanism is known. The Handbook also focuses on voltage and current acceleration stress mechanisms.
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Author: Hyungtak Kim
Author: