Defect and Fault Tolerance in VLSI Systems PDF Download
Are you looking for read ebook online? Search for your book and save it on your Kindle device, PC, phones or tablets. Download Defect and Fault Tolerance in VLSI Systems PDF full book. Access full book title Defect and Fault Tolerance in VLSI Systems by C.H. Stapper. Download full books in PDF and EPUB format.
Author: C.H. Stapper Publisher: Springer Science & Business Media ISBN: 1475799578 Category : Technology & Engineering Languages : en Pages : 313
Book Description
Higher circuit densities, increasingly more complex application ohjectives, and advanced packaging technologies have suhstantially increased the need to incorporate defect-tolerance and fault-tolerance in the design of VLSI and WSI systems. The goals of defect-tolerance and fault-tolerance are yield enhancement and improved reliahility. The emphasis on this area has resulted in a new field of interdisciplinary scientific research. I n fact, advanced methods of defect/fault control and tolerance are resulting in enhanced manufacturahility and productivity of integrated circuit chips, VI.SI systems, and wafer scale integrated circuits. In 1987, Dr. W. Moore organized an "International Workshop on Designing for Yield" at Oxford University. Edited papers of that workshop were published in reference [II. The participants in that workshop agreed that meetings of this type should he con tinued. preferahly on a yearly hasis. It was Dr. I. Koren who organized the "IEEE Inter national Workshop on Defect and Fault Tolerance in VLSI Systems" in Springfield Massachusetts the next year. Selected papers from that workshop were puhlished as the first volume of this series [21.
Author: Israel Koren Publisher: Springer Science & Business Media ISBN: 1461567998 Category : Computers Languages : en Pages : 362
Book Description
This book contains an edited selection of papers presented at the International Workshop on Defect and Fault Tolerance in VLSI Systems held October 6-7, 1988 in Springfield, Massachusetts. Our thanks go to all the contributors and especially the members of the program committee for the difficult and time-consuming work involved in selecting the papers that were presented in the workshop and reviewing the papers included in this book. Thanks are also due to the IEEE Computer Society (in particular, the Technical Committee on Fault-Tolerant Computing and the Technical Committee on VLSI) and the University of Massachusetts at Amherst for sponsoring the workshop, and to the National Science Foundation for supporting (under grant number MIP-8803418) the keynote address and the distribution of this book to all workshop attendees. The objective of the workshop was to bring t. ogether researchers and practition ers from both industry and academia in the field of defect tolerance and yield en ha. ncement in VLSI to discuss their mutual interests in defect-tolerant architectures and models for integrated circuit defects, faults, and yield. Progress in this area was slowed down by the proprietary nature of yield-related data, and by the lack of appropriate forums for disseminating such information. The goal of this workshop was therefore to provide a forum for a dialogue and exchange of views. A follow-up workshop in October 1989, with C. H. Stapper from IBM and V. K. Jain from the University of South Florida as general co-chairmen, is being organized.
Author: C.H. Stapper Publisher: Springer Science & Business Media ISBN: 1475799578 Category : Technology & Engineering Languages : en Pages : 313
Book Description
Higher circuit densities, increasingly more complex application ohjectives, and advanced packaging technologies have suhstantially increased the need to incorporate defect-tolerance and fault-tolerance in the design of VLSI and WSI systems. The goals of defect-tolerance and fault-tolerance are yield enhancement and improved reliahility. The emphasis on this area has resulted in a new field of interdisciplinary scientific research. I n fact, advanced methods of defect/fault control and tolerance are resulting in enhanced manufacturahility and productivity of integrated circuit chips, VI.SI systems, and wafer scale integrated circuits. In 1987, Dr. W. Moore organized an "International Workshop on Designing for Yield" at Oxford University. Edited papers of that workshop were published in reference [II. The participants in that workshop agreed that meetings of this type should he con tinued. preferahly on a yearly hasis. It was Dr. I. Koren who organized the "IEEE Inter national Workshop on Defect and Fault Tolerance in VLSI Systems" in Springfield Massachusetts the next year. Selected papers from that workshop were puhlished as the first volume of this series [21.
Author: Israel Koren Publisher: Elsevier ISBN: 0080492681 Category : Computers Languages : en Pages : 399
Book Description
Fault-Tolerant Systems is the first book on fault tolerance design with a systems approach to both hardware and software. No other text on the market takes this approach, nor offers the comprehensive and up-to-date treatment that Koren and Krishna provide. This book incorporates case studies that highlight six different computer systems with fault-tolerance techniques implemented in their design. A complete ancillary package is available to lecturers, including online solutions manual for instructors and PowerPoint slides. Students, designers, and architects of high performance processors will value this comprehensive overview of the field. - The first book on fault tolerance design with a systems approach - Comprehensive coverage of both hardware and software fault tolerance, as well as information and time redundancy - Incorporated case studies highlight six different computer systems with fault-tolerance techniques implemented in their design - Available to lecturers is a complete ancillary package including online solutions manual for instructors and PowerPoint slides
Author: Israel Koren Publisher: Springer ISBN: 9780306432248 Category : Computers Languages : en Pages : 362
Book Description
This book contains an edited selection of papers presented at the International Workshop on Defect and Fault Tolerance in VLSI Systems held October 6-7, 1988 in Springfield, Massachusetts. Our thanks go to all the contributors and especially the members of the program committee for the difficult and time-consuming work involved in selecting the papers that were presented in the workshop and reviewing the papers included in this book. Thanks are also due to the IEEE Computer Society (in particular, the Technical Committee on Fault-Tolerant Computing and the Technical Committee on VLSI) and the University of Massachusetts at Amherst for sponsoring the workshop, and to the National Science Foundation for supporting (under grant number MIP-8803418) the keynote address and the distribution of this book to all workshop attendees. The objective of the workshop was to bring t. ogether researchers and practition ers from both industry and academia in the field of defect tolerance and yield en ha. ncement in VLSI to discuss their mutual interests in defect-tolerant architectures and models for integrated circuit defects, faults, and yield. Progress in this area was slowed down by the proprietary nature of yield-related data, and by the lack of appropriate forums for disseminating such information. The goal of this workshop was therefore to provide a forum for a dialogue and exchange of views. A follow-up workshop in October 1989, with C. H. Stapper from IBM and V. K. Jain from the University of South Florida as general co-chairmen, is being organized.
Author: Robert Aitken Publisher: ISBN: 9780769522418 Category : Technology & Engineering Languages : en Pages : 524
Book Description
DFT 2004 showcases the latest research results in the in the field of defect and fault tolerance in VLSI systems. Its papers cover yield, defect and fault tolerance, error correction, and circuit/system reliability and dependability.
Author: Daniel Sorin Publisher: Springer Nature ISBN: 3031017234 Category : Technology & Engineering Languages : en Pages : 103
Book Description
For many years, most computer architects have pursued one primary goal: performance. Architects have translated the ever-increasing abundance of ever-faster transistors provided by Moore's law into remarkable increases in performance. Recently, however, the bounty provided by Moore's law has been accompanied by several challenges that have arisen as devices have become smaller, including a decrease in dependability due to physical faults. In this book, we focus on the dependability challenge and the fault tolerance solutions that architects are developing to overcome it. The two main purposes of this book are to explore the key ideas in fault-tolerant computer architecture and to present the current state-of-the-art - over approximately the past 10 years - in academia and industry. Table of Contents: Introduction / Error Detection / Error Recovery / Diagnosis / Self-Repair / The Future
Author: Olga Goloubeva Publisher: Springer Science & Business Media ISBN: 0387329374 Category : Technology & Engineering Languages : en Pages : 238
Book Description
This book presents the theory behind software-implemented hardware fault tolerance, as well as the practical aspects needed to put it to work on real examples. By evaluating accurately the advantages and disadvantages of the already available approaches, the book provides a guide to developers willing to adopt software-implemented hardware fault tolerance in their applications. Moreover, the book identifies open issues for researchers willing to improve the already available techniques.
Author: Swee-Huay Heng Publisher: Springer ISBN: 3642176194 Category : Computers Languages : en Pages : 366
Book Description
The 9th International Conference on Cryptology and Network Security (CANS 2010) was held in Kuala Lumpur, Malaysia during December 12–14, 2010. The conference was co-organized by the Multimedia University (MMU), Malaysia, and Universiti Tunku Abdul Rahman (UTAR), Malaysia. The conference received 64 submissions from 22 countries, out of which 21 were accepted after a careful and thorough review process. These proceedings also contain abstracts for two invited talks. All submissions were reviewed by at least three members of the Program Committee; those authored or co-authored by Program Committee members were reviewed by at least ?ve reviewers. P- gram Committee members were allowed to use external reviewers to assist with their reviews, but remained responsible for the contents of the review and r- resenting papers during the discussion and decision making. The review phase was followed by a 10-day discussion phase in which each paper with at least one supporting review was discussed, additional experts were consulted where needed, and ?nal decisions were made. We thank the Program Committee for their hard work in selecting the p- gram. We also thank the external reviewers who assisted with reviewing and the CANS Steering Committee for their help. We thank Shai Halevi for use of his Web-Submission-and-Review software that was used for the electronic s- mission and review of the submitted papers, and we thank the International Association for Cryptologic Research (IACR) for Web hosting of the software.
Author: Mary Mehrnoosh Eshaghian-Wilner Publisher: John Wiley & Sons ISBN: 0470429976 Category : Technology & Engineering Languages : en Pages : 573
Book Description
Brings the latest advances in nanotechnology and biology to computing This pioneering book demonstrates how nanotechnology can create even faster, denser computing architectures and algorithms. Furthermore, it draws from the latest advances in biology with a focus on bio-inspired computing at the nanoscale, bringing to light several new and innovative applications such as nanoscale implantable biomedical devices and neural networks. Bio-Inspired and Nanoscale Integrated Computing features an expert team of interdisciplinary authors who offer readers the benefit of their own breakthroughs in integrated computing as well as a thorough investigation and analyses of the literature. Carefully edited, the book begins with an introductory chapter providing a general overview of the field. It ends with a chapter setting forth the common themes that tie the chapters together as well as a forecast of emerging avenues of research. Among the important topics addressed in the book are modeling of nano devices, quantum computing, quantum dot cellular automata, dielectrophoretic reconfigurable nano architectures, multilevel and three-dimensional nanomagnetic recording, spin-wave architectures and algorithms, fault-tolerant nanocomputing, molecular computing, self-assembly of supramolecular nanostructures, DNA nanotechnology and computing, nanoscale DNA sequence matching, medical nanorobotics, heterogeneous nanostructures for biomedical diagnostics, biomimetic cortical nanocircuits, bio-applications of carbon nanotubes, and nanoscale image processing. Readers in electrical engineering, computer science, and computational biology will gain new insights into how bio-inspired and nanoscale devices can be used to design the next generation of enhanced integrated circuits.
Author: C.H. Stapper
Author: Israel Koren
Author: C.H. Stapper
Author: C. H. Stapper
Author: Israel Koren
Author: Israel Koren
Author: Robert Aitken
Author: Daniel Sorin
Author: Olga Goloubeva
Author: Swee-Huay Heng
Author: Mary Mehrnoosh Eshaghian-Wilner