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Author: Publisher: ISBN: Category : Languages : en Pages :
Book Description
The versatility of surface acoustic wave (SAW) devices stems from the accessibility of the propagation path to modification and detection. This has led to the integration of SAWs in a variety of novel fields, including quantum information processing. The development of technologically competitive devices requires the use of gigahertz frequency SAWs. This thesis develops fabrication processes for high frequency interdigital transducers on gallium arsenide. Optically lithography was used to create linear and stepped transducers, with a minimum feature size of 2 um, that were driven at their fifth harmonic. The highest frequency achieved was 1435 MHz, but the power absorbed was less than 3% and insertion losses were greater than -80 dB. Further improvements in the design and fabrication are required if optically fabricated transducers are to be an alternative to transducers with narrower finger widths. Electron-beam lithography techniques were developed and used to create transducers with finger widths of 500 and 400 nm, with fundamental resonance frequencies of 1387 and 1744 MHz, respectively. The power absorbed was 3 to 6% with insertion losses greater than -45 dB. The performance characteristics can be improved by the removal of residual resist on the surface of the transducer. An indispensable tool for the characterization of one-port transducers is an all optical probe to measure the displacement field of a SAW. This work details the design and construction of a scanning Sagnac interferometer, that is capable of measuring the outward displacement of a surface. The spatial resolution of the interferometer was 2.4 +/- 0.2 um and the displacement sensitivity was determined to be 4 +/- 1 pm. The instrument was used to map the SAW displacement field from a 358 MHz transducer, with results showing the resonant cavity behaviour of the fingers due to Bragg reflections. It also allowed for the direct detection of the SAW amplitude as a function of the driving frequency of.
Author: Publisher: ISBN: Category : Languages : en Pages :
Book Description
The versatility of surface acoustic wave (SAW) devices stems from the accessibility of the propagation path to modification and detection. This has led to the integration of SAWs in a variety of novel fields, including quantum information processing. The development of technologically competitive devices requires the use of gigahertz frequency SAWs. This thesis develops fabrication processes for high frequency interdigital transducers on gallium arsenide. Optically lithography was used to create linear and stepped transducers, with a minimum feature size of 2 um, that were driven at their fifth harmonic. The highest frequency achieved was 1435 MHz, but the power absorbed was less than 3% and insertion losses were greater than -80 dB. Further improvements in the design and fabrication are required if optically fabricated transducers are to be an alternative to transducers with narrower finger widths. Electron-beam lithography techniques were developed and used to create transducers with finger widths of 500 and 400 nm, with fundamental resonance frequencies of 1387 and 1744 MHz, respectively. The power absorbed was 3 to 6% with insertion losses greater than -45 dB. The performance characteristics can be improved by the removal of residual resist on the surface of the transducer. An indispensable tool for the characterization of one-port transducers is an all optical probe to measure the displacement field of a SAW. This work details the design and construction of a scanning Sagnac interferometer, that is capable of measuring the outward displacement of a surface. The spatial resolution of the interferometer was 2.4 +/- 0.2 um and the displacement sensitivity was determined to be 4 +/- 1 pm. The instrument was used to map the SAW displacement field from a 358 MHz transducer, with results showing the resonant cavity behaviour of the fingers due to Bragg reflections. It also allowed for the direct detection of the SAW amplitude as a function of the driving frequency of.
Author: Joseph Andrew Petrus Publisher: ISBN: Category : Languages : en Pages : 286
Book Description
The unique frequency range and robustness of surface acoustic wave (SAW) devices has been a catalyst for their adoption as integral components in a range of consumer and military electronics. Furthermore, the strain and piezoelectric fields associated with SAWs are finding novel applications in nanostructured devices. In this thesis, the interaction of SAWs with periodic elastic structures, such as photonic or phononic crystals (PnCs), is studied both computationally and experimentally. To predict the behaviour of elastic waves in PnCs, a finite-difference time-domain simulator (PnCSim) was developed using C++. PnCSim was designed to calculate band structures and transmission spectra of elastic waves through two-dimensional PnCs. By developing appropriate boundary conditions, bulk waves, surface acoustic waves, and plate waves can be simulated. Results obtained using PnCSim demonstrate good agreement with theoretical data reported in the literature. To experimentally investigate the behaviour of SAWs in PnCs, fabrication procedures were developed to create interdigitated transducers (IDTs) and PnCs. Using lift-off photolithography, IDTs with finger widths as low as 1.8 um were fabricated on gallium arsenide (GaAs), corresponding to a SAW frequency of 397 MHz. A citric acid and hydrogen peroxide wet-etching solution was used to create shallow air hole PnCs in square and triangular lattice configurations, with lattice constants of 8 um and 12 um, respectively. The relative transmission of SAWs through these PnCs as a function of frequency was determined by comparing the insertion losses before and after etching the PnCs. In addition, using a scanning Sagnac interferometer, displacement maps were measured for SAWs incident on square lattice PnCs by Mathew (Creating and Imaging Surface Acoustic Waves on GaAs, Master's Thesis). Reasonable agreement was found between simulations and measurements. Additional simulations indicate that SAW waveguiding should be possible with a PnC consiting of air holes in GaAs. The phononic properties of a commonly used photonic plate were also determined. Band structure simulations of the plate displayed no complete elastic band gaps. However, transmission simulations indicated that a pseudo-gap may form for elastic waves polarized in the sagittal plane.
Author: Sergey V. Biryukov Publisher: Springer Science & Business Media ISBN: 3642577679 Category : Science Languages : en Pages : 398
Book Description
Surface Acoustic Waves in Inhomogeneous Media covers almost all important problems of the interaction of different types of surface acoustic waves with surface inhomogeneities. The problems of surface acoustic wave interaction with periodic topographic gratings widely used in filters and resonators are under careful consideration. The most important results of surface wave scattering by local defects such as grooves, random roughness, elastic wedges are given. Different theoretical approaches and practical rules for solving the surface wave problems are presented.
Author: Colin Campbell Publisher: Elsevier ISBN: 0323148662 Category : Technology & Engineering Languages : en Pages : 485
Book Description
Surface Acoustic Wave Devices and Their Signal Processing Applications is a textbook that combines experiment and theory in assessing the signal processing applications of surface acoustic wave (SAW) devices. The operating principles of SAW devices are described from a circuit design viewpoint. This book is comprised of 18 chapters and begins with a historical background on surface acoustic waves and a discussion on the merits of SAW devices as well as their applications. The next chapter introduces the reader to the basics of acoustic waves and piezoelectricity, together with the effect of acoustic bulk waves on the performance of SAW filters. The principles of linear phase SAW filter design and equivalent circuit models for a SAW filter are then described. The remaining chapters focus on trade-offs in linear phase SAW filter design; compensation for second-order effects; harmonic SAW delay lines for gigahertz frequencies; and coding techniques using linear SAW transducers. The final chapter highlights Some other significant alternative design techniques and applications for SAW devices. This monograph will be suitable for engineering or physics students as well as engineers, scientists, and technical staff in industry who seek further information on SAW-based circuits, systems, and applications.
Author: G.M. Crean Publisher: Elsevier ISBN: 044459664X Category : Technology & Engineering Languages : en Pages : 413
Book Description
This volume focuses on a variety of novel non-destructive techniques for the characterization of materials, processes and devices. Emphasis is placed on probe-specimen interactions, in-situ diagnosis, instrumentation developments and future trends. This was the first time a symposium on this topic had been held, making the response particularly gratifying. The high quality of the contributions are a clear indication that non-destructive materials characterization is becoming a dynamic research area in Europe at the present time.A selection of contents: The role of acoustic properties in designs of acoustic and optical fibers (C.K. Jen). Observation of stable crack growth in Al2O3 ceramics using a scanning acoustic microscope (A. Quinten, W. Arnold). Mechanical characterization by acoustic techniques of SIC chemical vapour deposited thin films (J.M. Saurel et al.). Efficient generation of acoustic pressure waves by short laser pulses (S. Fassbender et al.). Use of scanning electron acoustic microscopy for the analysis of III-V compound devices (J.F. Bresse). Waves and vibrations in periodic piezoelectric composite materials (B.A. Auld). Precision ultrasonic velocity measurements for the study of the low temperature acoustic properties in defective materials (A. Vanelstraete, C. Laermans). Thermally induced concentration wave imaging (P. Korpiun et al.). Interferometric measurement of thermal expansion (V. Kurzmann et al.). Quantitative analyses of power loss mechanisms in semiconductor devices by thermal wave calorimetry (B. Büchner et al.). Thermal wave probing of the optical electronic and thermal properties of semiconductors (D. Fournier, A. Boccara). Thermal wave measurements in ion-implanted silicon (G. Queirola et al.). Optical-thermal non-destructive examination of surface coatings (R.E. Imhof et al.). Bonding analysis of layered materials by photothermal radiometry (M. Heuret et al.). Thermal non-linearities of semiconductor-doped glasses in the near-IR region (M. Bertolotti et al.). Theory of picosecond transient reflectance measurement of thermal and eisatic properties of thin metal films (Z. Bozóki et al.). The theory and application of contactless microwave lifetime measurement (T. Otaredian et al.). Ballistic phonon signal for imaging crystal properties (R.P. Huebener et al.). Determination of the elastic constants of a polymeric Langmuir-Blodgett film by Briliouin spectroscopy (F. Nizzoli et al.). Quantum interference effects in the optical second-harmonic response tensor of a metal surface (O. Keller). Study of bulk and surface phonons and plasmons in GaAs/A1As superlattices by far-IR and Raman spectroscopy (T. Dumslow et al.). Far-IR spectroscopy of bulk and surface phonon-polaritons on epitaxial layers of CdTe deposited by plasma MOCVD on GaAs substrates (T. Dumelow et al.). In-situ characterization by reflectance difference spectroscopy of III-V materials and heterojunctions grown by low pressure metal organic chemical vapour deposition (O. Acher et al.). Optical evidence of precipitates in arsenic-implanted silicon (A. Borghesi et al.). Polarized IR reflectivity of CdGeAs2 (L. Artús et al.). Raman and IR spectroscopies: a useful combination to study semiconductor interfaces (D.R.T. Zahn et al.). Silicon implantation of GaAs at low and medium doses: Raman assessment of the dopant activation (S. Zakang et al.). Ellipsometric characterization of thin films and superlattices (J. Bremer et al.). Ellipsometric characterization of multilayer transistor structures (J.A. Woollam et al.). Quality of molecular-beam-epitaxy-grown GaAs on Si(100) studied by ellipsometry (U. Rossow et al.). An ellipsometric and RBS study of TiSi2 formation (J.M.M. de Nijs, A. van Silfhout). A new microscope for semiconductor luminescence studies (P.S. Aplin, J.C. Day). Structural analysis of optical fibre preforms fabricated by the sol-gel process (A.M. Elas et al.). Author index.
Author: J. Doneker Publisher: Routledge ISBN: 1351456466 Category : Science Languages : en Pages : 552
Book Description
Defect Recognition and Image Processing in Semiconductors 1997 provides a valuable overview of current techniques used to assess, monitor, and characterize defects from the atomic scale to inhomogeneities in complete silicon wafers. This volume addresses advances in defect analyzing techniques and instrumentation and their application to substrates, epilayers, and devices. The book discusses the merits and limits of characterization techniques; standardization; correlations between defects and device performance, including degradation and failure analysis; and the adaptation and application of standard characterization techniques to new materials. It also examines the impressive advances made possible by the increase in the number of nanoscale scanning techniques now available. The book investigates defects in layers and devices, and examines the problems that have arisen in characterizing gallium nitride and silicon carbide.
Author: Publisher: ISBN: Category : Aeronautics Languages : en Pages : 804
Book Description
Lists citations with abstracts for aerospace related reports obtained from world wide sources and announces documents that have recently been entered into the NASA Scientific and Technical Information Database.
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Author: Joseph Andrew Petrus
Author: Robert Ellsworth Vines
Author: Sergey V. Biryukov
Author: Colin Campbell
Author: G.M. Crean
Author: J. Doneker
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Author: Paul Louis Adams