Author: Elizabeth Miller
Publisher: Princeton Review
ISBN: 9780375755842
Category : Achievement tests
Languages : en
Pages : 0
Book Description
The Princeton Review realizes that acing the TAAS Exit-Level Math exam is very different from getting straight As in school. TPR doesn't try to teach students everything there is to know about math -- only what they'll need to know to score higher on this exam. "There's a big difference. In Cracking the TAAS: Exit-Level Math, The Princeton Review will teach test takers how to think like the test makers. This is accomplished by teaching students how to: Eliminate answer choices using Process of Elimination and other techniques Use techniques such as Ballparking to save time and raise scores Improve scores by focusing on the material most likely to appear on the test Test one's knowledge with review questions for each math concept covered Nail even the toughest questions: fractions, word problems, algebra, geometry, and more Dodge the traps and pitfalls that cost test takers points *This book includes 2 full-length simulated Exit-Level Math exams. All of TPR's sample test questions are just like the ones test takers see on the actual exams, and every solution is fully explained. "Contents Include: Part I: Introduction About the TAAS Exams Structure and Strategies Part II: Math Review The Basics Exponents, Ratios, Probabilities, and More Geometry Analyzing Data Part III: The Princeton Review Practice Tests
Cracking the TAAS
Author: Elizabeth Miller
Publisher: Princeton Review
ISBN: 9780375755842
Category : Achievement tests
Languages : en
Pages : 0
Book Description
The Princeton Review realizes that acing the TAAS Exit-Level Math exam is very different from getting straight As in school. TPR doesn't try to teach students everything there is to know about math -- only what they'll need to know to score higher on this exam. "There's a big difference. In Cracking the TAAS: Exit-Level Math, The Princeton Review will teach test takers how to think like the test makers. This is accomplished by teaching students how to: Eliminate answer choices using Process of Elimination and other techniques Use techniques such as Ballparking to save time and raise scores Improve scores by focusing on the material most likely to appear on the test Test one's knowledge with review questions for each math concept covered Nail even the toughest questions: fractions, word problems, algebra, geometry, and more Dodge the traps and pitfalls that cost test takers points *This book includes 2 full-length simulated Exit-Level Math exams. All of TPR's sample test questions are just like the ones test takers see on the actual exams, and every solution is fully explained. "Contents Include: Part I: Introduction About the TAAS Exams Structure and Strategies Part II: Math Review The Basics Exponents, Ratios, Probabilities, and More Geometry Analyzing Data Part III: The Princeton Review Practice Tests
Publisher: Princeton Review
ISBN: 9780375755842
Category : Achievement tests
Languages : en
Pages : 0
Book Description
The Princeton Review realizes that acing the TAAS Exit-Level Math exam is very different from getting straight As in school. TPR doesn't try to teach students everything there is to know about math -- only what they'll need to know to score higher on this exam. "There's a big difference. In Cracking the TAAS: Exit-Level Math, The Princeton Review will teach test takers how to think like the test makers. This is accomplished by teaching students how to: Eliminate answer choices using Process of Elimination and other techniques Use techniques such as Ballparking to save time and raise scores Improve scores by focusing on the material most likely to appear on the test Test one's knowledge with review questions for each math concept covered Nail even the toughest questions: fractions, word problems, algebra, geometry, and more Dodge the traps and pitfalls that cost test takers points *This book includes 2 full-length simulated Exit-Level Math exams. All of TPR's sample test questions are just like the ones test takers see on the actual exams, and every solution is fully explained. "Contents Include: Part I: Introduction About the TAAS Exams Structure and Strategies Part II: Math Review The Basics Exponents, Ratios, Probabilities, and More Geometry Analyzing Data Part III: The Princeton Review Practice Tests
Cracking the Taas Exit Level Reading and Writing
Author: Gloria Levine
Publisher: Princeton Review
ISBN: 9780375755835
Category : Achievement tests
Languages : en
Pages : 0
Book Description
Provides strategies designed to help students score higher on the TAAS exit-level reading and writing exam.
Publisher: Princeton Review
ISBN: 9780375755835
Category : Achievement tests
Languages : en
Pages : 0
Book Description
Provides strategies designed to help students score higher on the TAAS exit-level reading and writing exam.
Cracking the Texas EOC
Author: Jeff Mandell
Publisher: Princeton Review
ISBN: 9780375755729
Category : Education
Languages : en
Pages : 228
Book Description
Contains strategies and techniques designed to help students score higher on the Texas EOC exam in United States history.
Publisher: Princeton Review
ISBN: 9780375755729
Category : Education
Languages : en
Pages : 228
Book Description
Contains strategies and techniques designed to help students score higher on the Texas EOC exam in United States history.
Chemistry for Electronic Materials
Author: K.F. Jensen
Publisher: Elsevier
ISBN: 0444596909
Category : Science
Languages : en
Pages : 215
Book Description
The chemical aspects of materials processing used for electronic applications, e.g. Si, III-V compounds, superconductors, metallization materials, are covered in this volume. Significant recent advances have occurred in the development of new volatile precursors for the fabrication of III-V semiconductor and metal [Cu, W] films by OMCVD. Some fundamentally new and wide-ranging applications have been introduced in recent times. Experimental and modeling studies regarding deposition kinetics, operating conditions and transport as well as properties of films produced by PVD, CVD and PECVD are discussed. The thirty papers in this volume report on many other significant topics also. Research workers involved in these aspects of materials technology may find here some new perspectives with which to augment their projects.
Publisher: Elsevier
ISBN: 0444596909
Category : Science
Languages : en
Pages : 215
Book Description
The chemical aspects of materials processing used for electronic applications, e.g. Si, III-V compounds, superconductors, metallization materials, are covered in this volume. Significant recent advances have occurred in the development of new volatile precursors for the fabrication of III-V semiconductor and metal [Cu, W] films by OMCVD. Some fundamentally new and wide-ranging applications have been introduced in recent times. Experimental and modeling studies regarding deposition kinetics, operating conditions and transport as well as properties of films produced by PVD, CVD and PECVD are discussed. The thirty papers in this volume report on many other significant topics also. Research workers involved in these aspects of materials technology may find here some new perspectives with which to augment their projects.
Cracking the Texas EOC
Author: John Haumann
Publisher: Princeton Review
ISBN: 9780375755705
Category : Education
Languages : en
Pages : 228
Book Description
Proven techniques for scoring higher from the world's #1 test-prep company.
Publisher: Princeton Review
ISBN: 9780375755705
Category : Education
Languages : en
Pages : 228
Book Description
Proven techniques for scoring higher from the world's #1 test-prep company.
The Southwestern Reporter
Author:
Publisher:
ISBN:
Category : Law reports, digests, etc
Languages : en
Pages : 2318
Book Description
Publisher:
ISBN:
Category : Law reports, digests, etc
Languages : en
Pages : 2318
Book Description
Forthcoming Books
Author: Rose Arny
Publisher:
ISBN:
Category : American literature
Languages : en
Pages : 1546
Book Description
Publisher:
ISBN:
Category : American literature
Languages : en
Pages : 1546
Book Description
Technical Information Indexes
Author:
Publisher:
ISBN:
Category : Aeronautics, Military
Languages : en
Pages : 150
Book Description
Publisher:
ISBN:
Category : Aeronautics, Military
Languages : en
Pages : 150
Book Description
American Negligence Reports, Current Series
Cracking the AP Statistics Exam, 2012 Edition
Author: Madhuri S. Mulekar
Publisher: Princeton Review
ISBN: 037542735X
Category : Advanced placement programs (Education)
Languages : en
Pages : 418
Book Description
Provides techniques for achieving high scores on the AP statistics exam and includes two full-length practice tests.
Publisher: Princeton Review
ISBN: 037542735X
Category : Advanced placement programs (Education)
Languages : en
Pages : 418
Book Description
Provides techniques for achieving high scores on the AP statistics exam and includes two full-length practice tests.