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Book Description
UNE MODELISATION APPROFONDIE DE L'INTERACTION LASER-SEMICONDUCTEUR PERMET L'ETUDE DE L'INFLUENCE DES PARAMETRES PHYSIQUES ET TECHNOLOGIQUES SUR L'EFFET PHOTOELECTRIQUE INDUIT. LES RESULTATS EXPERIMENTAUX SUR LA LOCALISATION ET LA CARACTERISATION DES STRUCTURES BIPOLAIRES PARASITES INHERENTES A LA TECHNOLOGIE CMOS SONT CONFIRMES SIMULATION ELECTRIQUE. UNE SECONDE APPLICATION DEMONTRE LA FAISABILITE D'UNE ANALYSE D'ETATS LOGIQUES INTERNES SANS CONTACT DANS LES CIRCUITS INTEGRES. LE BANC DE TEST PAR FAISCEAU LASER EST COMPARE AUX AUTRES TECHNIQUES DE TEST SANS CONTACT ET SES PERSPECTIVES D'EVOLUTION SONT EVALUEES
Book Description
UNE MODELISATION APPROFONDIE DE L'INTERACTION LASER-SEMICONDUCTEUR PERMET L'ETUDE DE L'INFLUENCE DES PARAMETRES PHYSIQUES ET TECHNOLOGIQUES SUR L'EFFET PHOTOELECTRIQUE INDUIT. LES RESULTATS EXPERIMENTAUX SUR LA LOCALISATION ET LA CARACTERISATION DES STRUCTURES BIPOLAIRES PARASITES INHERENTES A LA TECHNOLOGIE CMOS SONT CONFIRMES SIMULATION ELECTRIQUE. UNE SECONDE APPLICATION DEMONTRE LA FAISABILITE D'UNE ANALYSE D'ETATS LOGIQUES INTERNES SANS CONTACT DANS LES CIRCUITS INTEGRES. LE BANC DE TEST PAR FAISCEAU LASER EST COMPARE AUX AUTRES TECHNIQUES DE TEST SANS CONTACT ET SES PERSPECTIVES D'EVOLUTION SONT EVALUEES
Author: Hossein Bidgoli Publisher: John Wiley & Sons ISBN: 0470051213 Category : Business & Economics Languages : en Pages : 1154
Book Description
The Handbook of Information Security is a definitive 3-volume handbook that offers coverage of both established and cutting-edge theories and developments on information and computer security. The text contains 180 articles from over 200 leading experts, providing the benchmark resource for information security, network security, information privacy, and information warfare.
Author: Konstantinos Markantonakis Publisher: Springer Science & Business Media ISBN: 1461479150 Category : Computers Languages : en Pages : 599
Book Description
New generations of IT users are increasingly abstracted from the underlying devices and platforms that provide and safeguard their services. As a result they may have little awareness that they are critically dependent on the embedded security devices that are becoming pervasive in daily modern life. Secure Smart Embedded Devices, Platforms and Applications provides a broad overview of the many security and practical issues of embedded devices, tokens, and their operation systems, platforms and main applications. It also addresses a diverse range of industry/government initiatives and considerations, while focusing strongly on technical and practical security issues. The benefits and pitfalls of developing and deploying applications that rely on embedded systems and their security functionality are presented. A sufficient level of technical detail to support embedded systems is provided throughout the text, although the book is quite readable for those seeking awareness through an initial overview of the topics. This edited volume benefits from the contributions of industry and academic experts and helps provide a cross-discipline overview of the security and practical issues for embedded systems, tokens, and platforms. It is an ideal complement to the earlier work, Smart Cards Tokens, Security and Applications from the same editors.
Author: Keith Mayes Publisher: Springer ISBN: 3319505009 Category : Computers Languages : en Pages : 552
Book Description
This book provides a broad overview of the many card systems and solutions that are in practical use today. This new edition adds content on RFIDs, embedded security, attacks and countermeasures, security evaluation, javacards, banking or payment cards, identity cards and passports, mobile systems security, and security management. A step-by-step approach educates the reader in card types, production, operating systems, commercial applications, new technologies, security design, attacks, application development, deployment and lifecycle management. By the end of the book the reader should be able to play an educated role in a smart card related project, even to programming a card application. This book is designed as a textbook for graduate level students in computer science. It is also as an invaluable post-graduate level reference for professionals and researchers. This volume offers insight into benefits and pitfalls of diverse industry, government, financial and logistics aspects while providing a sufficient level of technical detail to support technologists, information security specialists, engineers and researchers.
Book Description
CE TRAVAIL CONSISTE EN LA RECHERCHE DES POSSIBILITES D'UTILISATION, COMME MOYEN DE TEST DE CIRCUITS INTEGRES, DE L'EFFET PHOTOELECTRIQUE INDUIT PAR UN FAISCEAU LASER. LA PARTIE EXPERIMENTALE COMPORTE LA REALISATION D'UNE STATION DE MESURE, SA MISE AU POINT OPTIQUE, ELECTRONIQUE, AINSI QUE LA CONCEPTION DE SON INFORMATIQUE DE COMMANDE. L'ETUDE ET LA MODELISATION DE L'INTERACTION RAYONNEMENT-SEMICONDUCTEUR A APPORTE DES ELEMENTS D'EXPLICATION AUX REPONSES DES CIRCUITS A L'EXCITATION LUMINEUSE. UNE EVALUATION APPROFONDIE DU COMPORTEMENT DE CIRCUITS DE DIVERSES TECHNOLOGIES A ETE EFFECTUEE POUR DES FONCTIONNEMENTS EN TENSION MARGINALE ET VIS-A-VIS DE L'AUTO-AMORCAGE (LATCH-UP). LES CONCLUSIONS ONT PERMIS DE DEFINIR DES PROCEDURES SIGNIFICATIVES DE TEST.
Author: Marc Joye Publisher: Springer Science & Business Media ISBN: 3642296564 Category : Computers Languages : en Pages : 352
Book Description
In the 1970s researchers noticed that radioactive particles produced by elements naturally present in packaging material could cause bits to flip in sensitive areas of electronic chips. Research into the effect of cosmic rays on semiconductors, an area of particular interest in the aerospace industry, led to methods of hardening electronic devices designed for harsh environments. Ultimately various mechanisms for fault creation and propagation were discovered, and in particular it was noted that many cryptographic algorithms succumb to so-called fault attacks. Preventing fault attacks without sacrificing performance is nontrivial and this is the subject of this book. Part I deals with side-channel analysis and its relevance to fault attacks. The chapters in Part II cover fault analysis in secret key cryptography, with chapters on block ciphers, fault analysis of DES and AES, countermeasures for symmetric-key ciphers, and countermeasures against attacks on AES. Part III deals with fault analysis in public key cryptography, with chapters dedicated to classical RSA and RSA-CRT implementations, elliptic curve cryptosystems and countermeasures using fault detection, devices resilient to fault injection attacks, lattice-based fault attacks on signatures, and fault attacks on pairing-based cryptography. Part IV examines fault attacks on stream ciphers and how faults interact with countermeasures used to prevent power analysis attacks. Finally, Part V contains chapters that explain how fault attacks are implemented, with chapters on fault injection technologies for microprocessors, and fault injection and key retrieval experiments on a widely used evaluation board. This is the first book on this topic and will be of interest to researchers and practitioners engaged with cryptographic engineering.
Author: Pascal Fouillat (professeur d'électronique)
Author: Pascal Fouillat (professeur d'électronique)
Author: Pascal Fouillat
Author: Hossein Bidgoli
Author: Konstantinos Markantonakis
Author: Keith Mayes
Author: Bertrand Simonin
Author: Marc Joye