Considerations for the Precise Measurement of Amplifier Noise PDF Download

Author: D. F. Wait
Publisher:
ISBN:
Category : Amplifiers (Electronics)
Languages : en
Pages : 236

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Author: David F. Wait
Publisher:
ISBN:
Category : Amplifiers (Electronics)
Languages : en
Pages : 136

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Author: M. G. Arthur
Publisher:
ISBN:
Category : Noise
Languages : en
Pages : 214

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Book Description
The metrology guide provides the basis for critical comparisons among seven measurement techniques for average noise factor and effective input noise temperature. The techniques that are described, discussed, and analyzed include the (1) Y-Factor, (2) 3-dB, (3) Automatic, (4) Gain Control, (5) CW, (6) Tangential, and (7) Cmparison Techniques. The analyses yield working equations and error equations by which accuracy capabilities are compared. Each technique is also analyzed for (a) frequency range for best measurement results, (b) special instrumentation requirements, (c) speed and convenience, (d) operator skill required, and (e) special measurement problems. General instrumentation requirements and practical measurement problems are discussed for the benefit of the non-expert metrologist. (Modified author abstract).

Author:
Publisher:
ISBN:
Category : Physical instruments
Languages : en
Pages : 212

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Author: United States. Superintendent of Documents
Publisher:
ISBN:
Category : Government publications
Languages : en
Pages : 1446

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February issue includes Appendix entitled Directory of United States Government periodicals and subscription publications; September issue includes List of depository libraries; June and December issues include semiannual index

Author: James Randa
Publisher: John Wiley & Sons
ISBN: 1119910099
Category : Technology & Engineering
Languages : en
Pages : 180

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Book Description
Precision Measurement of Microwave Comprehensive resource covering the foundations and analysis of precision noise measurements with a detailed treatment of their uncertainties Precision Measurement of Microwave Thermal Noise presents the basics of precise measurements of thermal noise at microwave frequencies and guides readers through how to evaluate the uncertainties in such measurement. The focus is on measurement methods used at the U.S. National Institute of Standards and Technology (NIST), but the general principles and methods are useful in a wide range of applications. Readers will learn how to perform accurate microwave noise measurements using the respected author’s expertise of calculations to aid understanding of the challenges and solutions. The text covers the background required for the analysis of the measurements and the standards employed to calibrate radiofrequency and microwave radiometers. It also covers measurements of noise temperature (power) and the noise characteristics of amplifiers and transistors. In addition to the usual room-temperature two-port devices, cryogenic devices and multiport amplifiers are also discussed. Finally, the connection of these lab-based measurements to remote-sensing measurement (especially from space) is considered, and possible contributions of the lab-based measurements to remote-sensing applications are discussed. Specific topics and concepts covered in the text include: Noise-temperature standards, covering ambient standards, hot (oven) standards, cryogenic standards, and other standards and noise sources Amplifier noise, covering definition of noise parameters, measurement of noise parameters, uncertainty analysis for noise-parameter measurements, and simulations and strategies On-wafer noise measurements, covering on-wafer microwave formalism, noise temperature, on-wafer noise-parameter measurements, and uncertainties Multiport amplifiers, covering formalism and noise matrix, definition of noise figure for multiports, and degradation of signal-to-noise ratio Containing some introductory material, Precision Measurement of Microwave Thermal Noise is an invaluable resource on the subject for advanced students and all professionals working in (or entering) the field of microwave noise measurements, be it in a standards lab, a commercial lab, or academic research.

Author:
Publisher:
ISBN:
Category : Government publications
Languages : en
Pages : 1386

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Author:
Publisher:
ISBN:
Category : Technology
Languages : en
Pages : 24

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Author: United States. National Bureau of Standards
Publisher:
ISBN:
Category : Chemistry
Languages : en
Pages : 1634

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Author:
Publisher:
ISBN:
Category : Electronic measurements
Languages : en
Pages : 310

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