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Author: Ernst G. Ulrich Publisher: Springer Science & Business Media ISBN: 1461527384 Category : Technology & Engineering Languages : en Pages : 199
Book Description
Concurrent simulation is over twenty years old. During that pe riod it has been widely adopted for the simulation of faults in digital circuits, for which it provides a combination of extreme efficiency and generality . Yet, it is remarkable that no book published so far presents a correct and sufficiently detailed treatment of concurrent simulation. A first reason to welcome into print the effort of the authors is, therefore, that it provides a much needed account of an important topic in design automation. This book is, however, unique for sev eral other reasons. It is safe to state that no individual has contrib uted more than Ernst Ulrich to the development of digital logic simulation. For concurrent simulation, one may say that Ernst has contributed more than the rest of the world. We would find such a claim difficult to dispute. The unique experience of the authors con fers a special character to this book: It is authoritative, inspired, and focused on what is conceptually important. Another unique aspect of this book, perhaps the one that will be the most surprising for many readers, is that it is strongly projected towards the future. Concurrent simulation is presented as a general experimentation methodology and new intriguing applications are analyzed. The discussion of multi-domain concurrent simulation-- recent work of Karen Panetta Lentz and Ernst Ulrich---is fascinat ing.
Author: Ernst G. Ulrich Publisher: Springer Science & Business Media ISBN: 1461527384 Category : Technology & Engineering Languages : en Pages : 199
Book Description
Concurrent simulation is over twenty years old. During that pe riod it has been widely adopted for the simulation of faults in digital circuits, for which it provides a combination of extreme efficiency and generality . Yet, it is remarkable that no book published so far presents a correct and sufficiently detailed treatment of concurrent simulation. A first reason to welcome into print the effort of the authors is, therefore, that it provides a much needed account of an important topic in design automation. This book is, however, unique for sev eral other reasons. It is safe to state that no individual has contrib uted more than Ernst Ulrich to the development of digital logic simulation. For concurrent simulation, one may say that Ernst has contributed more than the rest of the world. We would find such a claim difficult to dispute. The unique experience of the authors con fers a special character to this book: It is authoritative, inspired, and focused on what is conceptually important. Another unique aspect of this book, perhaps the one that will be the most surprising for many readers, is that it is strongly projected towards the future. Concurrent simulation is presented as a general experimentation methodology and new intriguing applications are analyzed. The discussion of multi-domain concurrent simulation-- recent work of Karen Panetta Lentz and Ernst Ulrich---is fascinat ing.
Author: Christos G. Cassandras Publisher: Springer Nature ISBN: 3030722740 Category : Computers Languages : en Pages : 821
Book Description
This unique textbook comprehensively introduces the field of discrete event systems, offering a breadth of coverage that makes the material accessible to readers of varied backgrounds. The book emphasizes a unified modeling framework that transcends specific application areas, linking the following topics in a coherent manner: language and automata theory, supervisory control, Petri net theory, Markov chains and queueing theory, discrete-event simulation, and concurrent estimation techniques. Topics and features: detailed treatment of automata and language theory in the context of discrete event systems, including application to state estimation and diagnosis comprehensive coverage of centralized and decentralized supervisory control of partially-observed systems timed models, including timed automata and hybrid automata stochastic models for discrete event systems and controlled Markov chains discrete event simulation an introduction to stochastic hybrid systems sensitivity analysis and optimization of discrete event and hybrid systems new in the third edition: opacity properties, enhanced coverage of supervisory control, overview of latest software tools This proven textbook is essential to advanced-level students and researchers in a variety of disciplines where the study of discrete event systems is relevant: control, communications, computer engineering, computer science, manufacturing engineering, transportation networks, operations research, and industrial engineering. Christos G. Cassandras is Distinguished Professor of Engineering, Professor of Systems Engineering, and Professor of Electrical and Computer Engineering at Boston University. Stéphane Lafortune is Professor of Electrical Engineering and Computer Science at the University of Michigan, Ann Arbor.
Author: M. Bushnell Publisher: Springer Science & Business Media ISBN: 0306470403 Category : Technology & Engineering Languages : en Pages : 690
Book Description
The modern electronic testing has a forty year history. Test professionals hold some fairly large conferences and numerous workshops, have a journal, and there are over one hundred books on testing. Still, a full course on testing is offered only at a few universities, mostly by professors who have a research interest in this area. Apparently, most professors would not have taken a course on electronic testing when they were students. Other than the computer engineering curriculum being too crowded, the major reason cited for the absence of a course on electronic testing is the lack of a suitable textbook. For VLSI the foundation was provided by semiconductor device techn- ogy, circuit design, and electronic testing. In a computer engineering curriculum, therefore, it is necessary that foundations should be taught before applications. The field of VLSI has expanded to systems-on-a-chip, which include digital, memory, and mixed-signalsubsystems. To our knowledge this is the first textbook to cover all three types of electronic circuits. We have written this textbook for an undergraduate “foundations” course on electronic testing. Obviously, it is too voluminous for a one-semester course and a teacher will have to select from the topics. We did not restrict such freedom because the selection may depend upon the individual expertise and interests. Besides, there is merit in having a larger book that will retain its usefulness for the owner even after the completion of the course. With equal tenacity, we address the needs of three other groups of readers.
Author: Zainalabedin Navabi Publisher: Springer Science & Business Media ISBN: 1441975489 Category : Technology & Engineering Languages : en Pages : 452
Book Description
This book is about digital system testing and testable design. The concepts of testing and testability are treated together with digital design practices and methodologies. The book uses Verilog models and testbenches for implementing and explaining fault simulation and test generation algorithms. Extensive use of Verilog and Verilog PLI for test applications is what distinguishes this book from other test and testability books. Verilog eliminates ambiguities in test algorithms and BIST and DFT hardware architectures, and it clearly describes the architecture of the testability hardware and its test sessions. Describing many of the on-chip decompression algorithms in Verilog helps to evaluate these algorithms in terms of hardware overhead and timing, and thus feasibility of using them for System-on-Chip designs. Extensive use of testbenches and testbench development techniques is another unique feature of this book. Using PLI in developing testbenches and virtual testers provides a powerful programming tool, interfaced with hardware described in Verilog. This mixed hardware/software environment facilitates description of complex test programs and test strategies.
Author: Mohammad Tehranipoor Publisher: Springer Science & Business Media ISBN: 1441982973 Category : Technology & Engineering Languages : en Pages : 228
Book Description
This book will introduce new techniques for detecting and diagnosing small-delay defects in integrated circuits. Although this sort of timing defect is commonly found in integrated circuits manufactured with nanometer technology, this will be the first book to introduce effective and scalable methodologies for screening and diagnosing small-delay defects, including important parameters such as process variations, crosstalk, and power supply noise.
Author: Shi-Yu Huang Publisher: Springer Science & Business Media ISBN: 1461556937 Category : Technology & Engineering Languages : en Pages : 238
Book Description
Formal Equivalence Checking and Design Debugging covers two major topics in design verification: logic equivalence checking and design debugging. The first part of the book reviews the design problems that require logic equivalence checking and describes the underlying technologies that are used to solve them. Some novel approaches to the problems of verifying design revisions after intensive sequential transformations such as retiming are described in detail. The second part of the book gives a thorough survey of previous and recent literature on design error diagnosis and design error correction. This part also provides an in-depth analysis of the algorithms used in two logic debugging software programs, ErrorTracer and AutoFix, developed by the authors. From the Foreword: `With the adoption of the static sign-off approach to verifying circuit implementations the application-specific integrated circuit (ASIC) industry will experience the first radical methodological revolution since the adoption of logic synthesis. Equivalence checking is one of the two critical elements of this methodological revolution. This book is timely for either the designer seeking to better understand the mechanics of equivalence checking or for the CAD researcher who wishes to investigate well-motivated research problems such as equivalence checking of retimed designs or error diagnosis in sequential circuits.' Kurt Keutzer, University of California, Berkeley
Author: Gabriel A. Wainer Publisher: CRC Press ISBN: 1351835351 Category : Technology & Engineering Languages : en Pages : 694
Book Description
Complex artificial dynamic systems require advanced modeling techniques that can accommodate their asynchronous, concurrent, and highly non-linear nature. Discrete Event systems Specification (DEVS) provides a formal framework for hierarchical construction of discrete-event models in a modular manner, allowing for model re-use and reduced development time. Discrete Event Modeling and Simulation presents a practical approach focused on the creation of discrete-event applications. The book introduces the CD++ tool, an open-source framework that enables the simulation of discrete-event models. After setting up the basic theory of DEVS and Cell-DEVS, the author focuses on how to use the CD++ tool to define a variety of models in biology, physics, chemistry, and artificial systems. They also demonstrate how to map different modeling techniques, such as Finite State Machines and VHDL, to DEVS. The in-depth coverage elaborates on the creation of simulation software for DEVS models and the 3D visualization environments associated with these tools. A much-needed practical approach to creating discrete-event applications, this book offers world-class instruction on the field’s most useful modeling tools.
Author: Ernst G. Ulrich
Author: Ernst G. Ulrich
Author: Christos G. Cassandras
Author: Edward William Vopata
Author: M. Bushnell
Author: Zainalabedin Navabi
Author: 
Author: Mohammad Tehranipoor
Author: Shi-Yu Huang
Author: Gabriel A. Wainer
Author: Allen Kent