Author: National Measurement Laboratory (U.S.). Office of Standard Reference DataPublisher:
ISBN:
Category : Chemistry, Physical and theoretical
Languages : en
Pages : 204
Book Description
Annotated Accession List of Data Compilations of the Office of Standard Reference Data
Author: National Measurement Laboratory (U.S.). Office of Standard Reference DataPublisher:
ISBN:
Category : Chemistry, Physical and theoretical
Languages : en
Pages : 204
Book Description
Charged Particle Cross Sections
Author: Los Alamos Scientific LaboratoryPublisher:
ISBN:
Category : Cross sections (Nuclear physics)
Languages : en
Pages : 470
Book Description
Nuclear Cross Sections for Technology
Author: Joseph L. FowlerPublisher:
ISBN:
Category : Cross sections (Nuclear physics)
Languages : en
Pages : 1062
Book Description
Nuclear Science Abstracts
Author: NBS Special Publication
Author: Publisher:
ISBN:
Category : Weights and measures
Languages : en
Pages : 800
Book Description
Publications
Author: United States. National Bureau of StandardsPublisher:
ISBN:
Category : Government publications
Languages : en
Pages : 362
Book Description
Publications of the National Bureau of Standards ... Catalog
Author: United States. National Bureau of StandardsPublisher:
ISBN:
Category :
Languages : en
Pages : 788
Book Description
Analytical Mass Spectrometry Section: Instrumentation and Procedures for Isotopic Analysis
Author: William R. ShieldsPublisher:
ISBN:
Category : Mass spectrometry
Languages : en
Pages : 662
Book Description
Catalog of National Bureau of Standards Publications, 1966-1976: Key word index
Author: United States. National Bureau of Standards. Technical Information and Publications DivisionPublisher:
ISBN:
Category : Government publications
Languages : en
Pages : 788
Book Description
Advances in X-Ray Analysis
Author: Charles BarrettPublisher: Springer Science & Business Media
ISBN: 1461399661
Category : Science
Languages : en
Pages : 582
Book Description
The application of solid-state detectors of high energy resolution to x-ray spectrometry, and the increasing use of compu ters in both measurement and data evaluation, are giving a new stimulus to x-ray techniques in analytical chemistry. The Twentieth Annual Denver X-ray Conference reflects this renewed interest in several ways. The invited papers, grouped in Session I, review the charac teristics of the detectors used in the measurement of x-rays. One paper is dedicated to the detection of single ions. Although such a subject may appear to be marginal to the purposes of the Denver Conference, we must recognize the affinity of techniques applied to similar purposes. Ion probe mass spectrometry is dedicated to tasks similar to those performed by x-ray spectrometry with the electron probe microanalyzer. Scientists and technologists will see these two techniques discussed in the same meetings. The discussion of automation and programming is not limited to the two invited speakers, but extends to papers presented in more than one session. The matter of fluorescence analysis by isotope- and tube-excitation will also be of great interest to those concerned with the practical applications of x-ray techniques. The communications contained in this volume, and the lively discussions which frequently followed the presentation of papers, attest to the vitality of the subjects which are the concern of the Annual Denver X-ray Conference.