Author: G. E. Lee-WhitingPublisher:
ISBN:
Category :
Languages : en
Pages : 0
Book Description
Comparison of calculated third-order aberrations of a magnetic quadrupole lens
Author: G. E. Lee-WhitingThird-Order Aberrations of Magnetic Quadrupole Lens
Author: Atomic Energy of Canada LimitedPublisher:
ISBN:
Category :
Languages : en
Pages : 5
Book Description
Scaling Laws for Aberrations in Magnetic Quadrupole Lens Systems
Author: Publisher:
ISBN:
Category :
Languages : en
Pages :
Book Description
A comparison has been made of the third-order (spherical) abberrations in magnetic quadrupole lenses for use in conventional charged particle beam transport systems. An analytical description of the abberrations is presented and this is compared with the results of high order numerical integration. The dependence of the aberration strength on the system geometry and f number is given and a comparison of doublet and triplet systems made. The reduction of the aberrations in both doublet and triplet systems using embedded magnetic octupole lenses is also discussed and analytical predictions are given.
Nuclear Science Abstracts
Author: Nuclear Science Abstracts
Author: Proton Microprobe The Appln Biomedical Field
Author: Ronald D. VisPublisher: Springer
ISBN:
Category : Medical
Languages : en
Pages : 216
Book Description
Energy Research Abstracts
Author: Handbook of Charged Particle Optics
Author: Jon OrloffPublisher: CRC Press
ISBN: 9780849325137
Category : Science
Languages : en
Pages : 532
Book Description
This timely handbook contains chapters on the essential elements of high resolution charged particle optics and is written by many of the world's leading research scientists. It is a complete guide to understanding, designing, and using high resolution instrumentation such as transmission electron microscopes (TEMs), scanning electron microscopes (SEMs), scanning transmission electron microscopes (STEMs), and focused ion beam (FIB) systems. This handbook is evenly balanced between theory and application, and covers all the most important topics in this growing area. Handbook of High Resolution Charged Particle Optics explains how and why high resolution instruments work and how to apply this information when designing or using them.
Scientific and Technical Aerospace Reports
Author: Publisher:
ISBN:
Category : Aeronautics
Languages : en
Pages : 1282
Book Description
Lists citations with abstracts for aerospace related reports obtained from world wide sources and announces documents that have recently been entered into the NASA Scientific and Technical Information Database.
Principles of Electron Optics, Volume 1
Author: Peter W. HawkesPublisher: Elsevier
ISBN: 0081022573
Category : Science
Languages : en
Pages : 729
Book Description
Volume one of Principles of Electron Optics: Basic Geometrical Optics, Second Edition, explores the geometrical optics needed to analyze an extremely wide range of instruments: cathode-ray tubes; the family of electron microscopes, including the fixed-beam and scanning transmission instruments, the scanning electron microscope and the emission microscope; electron spectrometers and mass spectrograph; image converters; electron interferometers and diffraction devices; electron welding machines; and electron-beam lithography devices. The book provides a self-contained, detailed, modern account of electron optics for anyone involved with particle beams of modest current density in the energy range up to a few mega-electronvolts. You will find all the basic equations with their derivations, recent ideas concerning aberration studies, extensive discussion of the numerical methods needed to calculate the properties of specific systems and guidance to the literature of all the topics covered. A continuation of these topics can be found in volume two, Principles of Electron Optics: Applied Geometrical Optics. The book is intended for postgraduate students and teachers in physics and electron optics, as well as researchers and scientists in academia and industry working in the field of electron optics, electron and ion microscopy and nanolithography. Offers a fully revised and expanded new edition based on the latest research developments in electron optics Written by the top experts in the field Covers every significant advance in electron optics since the subject originated Contains exceptionally complete and carefully selected references and notes Serves both as a reference and text