Author: Zhang ZhangPublisher:
ISBN:
Category :
Languages : en
Pages : 254
Book Description
Coherence Techniques at Extreme Ultraviolet Wavelengths
Author: Zhang ZhangLagar, Celso, 1891-1967
Author: Publisher:
ISBN:
Category :
Languages : en
Pages :
Book Description
The folder may include clippings, announcements, small exhibition catalogs, and other ephemeral items.
Nanoscale Photonic Imaging
Author: Tim SaldittPublisher: Springer Nature
ISBN: 3030344134
Category : Science
Languages : en
Pages : 634
Book Description
This open access book, edited and authored by a team of world-leading researchers, provides a broad overview of advanced photonic methods for nanoscale visualization, as well as describing a range of fascinating in-depth studies. Introductory chapters cover the most relevant physics and basic methods that young researchers need to master in order to work effectively in the field of nanoscale photonic imaging, from physical first principles, to instrumentation, to mathematical foundations of imaging and data analysis. Subsequent chapters demonstrate how these cutting edge methods are applied to a variety of systems, including complex fluids and biomolecular systems, for visualizing their structure and dynamics, in space and on timescales extending over many orders of magnitude down to the femtosecond range. Progress in nanoscale photonic imaging in Göttingen has been the sum total of more than a decade of work by a wide range of scientists and mathematicians across disciplines, working together in a vibrant collaboration of a kind rarely matched. This volume presents the highlights of their research achievements and serves as a record of the unique and remarkable constellation of contributors, as well as looking ahead at the future prospects in this field. It will serve not only as a useful reference for experienced researchers but also as a valuable point of entry for newcomers.
X-Rays and Extreme Ultraviolet Radiation
Author: David AttwoodPublisher: Cambridge University Press
ISBN: 1316810666
Category : Technology & Engineering
Languages : en
Pages :
Book Description
With this fully updated second edition, readers will gain a detailed understanding of the physics and applications of modern X-ray and EUV radiation sources. Taking into account the most recent improvements in capabilities, coverage is expanded to include new chapters on free electron lasers (FELs), laser high harmonic generation (HHG), X-ray and EUV optics, and nanoscale imaging; a completely revised chapter on spatial and temporal coherence; and extensive discussion of the generation and applications of femtosecond and attosecond techniques. Readers will be guided step by step through the mathematics of each topic, with over 300 figures, 50 reference tables and 600 equations enabling easy understanding of key concepts. Homework problems, a solutions manual for instructors, and links to YouTube lectures accompany the book online. This is the 'go-to' guide for graduate students, researchers and industry practitioners interested in X-ray and EUV interaction with matter.
Coherence, Tunability, Spectral and Spatial Properties of Femtosecond Extreme-ultraviolet Light Sources
Author: Benoît MahieuExtreme Ultraviolet Imaging and Resist Characterization Using Spatial Filtering Techniques
Author: Michael David ShumwayPublisher:
ISBN:
Category :
Languages : en
Pages : 336
Book Description
Phase-modulated Coherent Time-domain Spectroscopy in the Extreme Ultraviolet Regime
Author: Andreas WituschekGeneration and Application of Coherent Extreme Ultraviolet Radiation
Author: Hoang Vu LePublisher: LAP Lambert Academic Publishing
ISBN: 9783659749360
Category :
Languages : en
Pages : 136
Book Description
High harmonic generation featuring ultra-short pulses, short wavelengths and highly coherent radiation in a table-top setup has become one of the most versatile and affordable tools for studies of atomic and molecular dynamics as well as for nano-scale coherent diffractive imaging. In this book, we show the background and technical aspects of the generation and enhancement of high order harmonic radiations down to the water window region (2.3 - 4.4 nm). The source is specifically tailored and developed for imaging applications. By controlling and stabilizing the phase-matching condition in a gas cell, an extreme ultra-violet source which satisfies these requirements has been generated. Using a harmonic source with wavelengths around 30 nm, a resolution of 45 nm for a micrometer-size transmission sample has been obtained and biological-like absorption samples are also successfully reconstructed. A phase retrieval algorithm with a phase-curvature correction is developed to take advantage of the higher photon flux when placing the sample near the focus point.
Extreme Ultraviolet (EUV) Holographic Metrology for Lithography Applications
Author: Sang-hun YiSoft X-Rays and Extreme Ultraviolet Radiation
Author: David AttwoodPublisher: Cambridge University Press
ISBN: 1139643428
Category : Technology & Engineering
Languages : en
Pages : 611
Book Description
This detailed, comprehensive book describes the fundamental properties of soft X-rays and extreme ultraviolet (EUV) radiation and discusses their applications in a wide variety of fields, including EUV lithography for semiconductor chip manufacture and soft X-ray biomicroscopy. The author begins by presenting the relevant basic principles such as radiation and scattering, wave propagation, diffraction, and coherence. He then goes on to examine a broad range of phenomena and applications. The topics covered include spectromicroscopy, EUV astronomy, synchrotron radiation, and soft X-ray lasers. The author also provides a wealth of useful reference material such as electron binding energies, characteristic emission lines and photo-absorption cross-sections. The book will be of great interest to graduate students and researchers in engineering, physics, chemistry, and the life sciences. It will also appeal to practising engineers involved in semiconductor fabrication and materials science.