Author: Ronny Dwain HarrisPublisher:
ISBN:
Category :
Languages : en
Pages : 298
Book Description
Cluster Projectiles for ToF-secondary Ion Mass Spectrometry
Author: Ronny Dwain HarrisCluster Secondary Ion Mass Spectrometry
Author: Christine M. MahoneyPublisher: John Wiley & Sons
ISBN: 1118589246
Category : Science
Languages : en
Pages : 325
Book Description
Explores the impact of the latest breakthroughs in cluster SIMS technology Cluster secondary ion mass spectrometry (SIMS) is a high spatial resolution imaging mass spectrometry technique, which can be used to characterize the three-dimensional chemical structure in complex organic and molecular systems. It works by using a cluster ion source to sputter desorb material from a solid sample surface. Prior to the advent of the cluster source, SIMS was severely limited in its ability to characterize soft samples as a result of damage from the atomic source. Molecular samples were essentially destroyed during analysis, limiting the method's sensitivity and precluding compositional depth profiling. The use of new and emerging cluster ion beam technologies has all but eliminated these limitations, enabling researchers to enter into new fields once considered unattainable by the SIMS method. With contributions from leading mass spectrometry researchers around the world, Cluster Secondary Ion Mass Spectrometry: Principles and Applications describes the latest breakthroughs in instrumentation, and addresses best practices in cluster SIMS analysis. It serves as a compendium of knowledge on organic and polymeric surface and in-depth characterization using cluster ion beams. It covers topics ranging from the fundamentals and theory of cluster SIMS, to the important chemistries behind the success of the technique, as well as the wide-ranging applications of the technology. Examples of subjects covered include: Cluster SIMS theory and modeling Cluster ion source types and performance expectations Cluster ion beams for surface analysis experiments Molecular depth profiling and 3-D analysis with cluster ion beams Specialty applications ranging from biological samples analysis to semiconductors/metals analysis Future challenges and prospects for cluster SIMS This book is intended to benefit any scientist, ranging from beginning to advanced in level, with plenty of figures to help better understand complex concepts and processes. In addition, each chapter ends with a detailed reference set to the primary literature, facilitating further research into individual topics where desired. Cluster Secondary Ion Mass Spectrometry: Principles and Applications is a must-have read for any researcher in the surface analysis and/or imaging mass spectrometry fields.
ToF-SIMS
Author: J. C. VickermanPublisher: IM Publications
ISBN: 1906715173
Category : Mass spectrometry
Languages : en
Pages : 742
Book Description
Time-of-flight secondary ion mass spectrometry (ToF-SIMS) is the most versatile of the surface analysis techniques that have been developed during the last 30 years. This is the Second Edition of the first book ToF-SIMS: Surface analysis by Mass Spectrometry to be dedicated to the subject and the treatment is comprehensive
Mass Spectrometry Handbook
Author: Mike S. LeePublisher: John Wiley & Sons
ISBN: 1118180720
Category : Science
Languages : en
Pages : 1362
Book Description
Due to its enormous sensitivity and ease of use, mass spectrometry has grown into the analytical tool of choice in most industries and areas of research. This unique reference provides an extensive library of methods used in mass spectrometry, covering applications of mass spectrometry in fields as diverse as drug discovery, environmental science, forensic science, clinical analysis, polymers, oil composition, doping, cellular research, semiconductor, ceramics, metals and alloys, and homeland security. The book provides the reader with a protocol for the technique described (including sampling methods) and explains why to use a particular method and not others. Essential for MS specialists working in industrial, environmental, and clinical fields.
Characterization and Quantification of Biological Surfaces Using Cluster ToF-Sims with the Event-by-event Bombardment/detection Mode
Author: Li-Jung ChenPublisher:
ISBN:
Category :
Languages : en
Pages :
Book Description
Cluster ToF-SIMS (time-of-flight secondary ion mass spectrometry) operated in the event-by-event bombardment/detection mode has been applied to: 1) evaluate and screen the manufacturing quality of step-wise prepared micropatterned biointerfaces; 2) quantify the binding density of Au nanoparticles (AuNPs)-antiCD4 conjugates selectively attached on the cell surface; 3) elucidate the biological interaction of proteins and molecules by quantifying the fractional coverage of immobilized biomolecules; 4) enhance the accuracy of secondary ion identification of specific molecules. Briefly, our method consists of recording the secondary ions, SIs, individually emitted from a single projectile impact (C601̕ 2, Au4004). From the set of individual mass data, we select events where a specific SI was detected. The selected records reveal the SIs co-ejected from the nanovolume impacted by an individual cluster projectile from an emission area of 10-20 nm in diameter and an emission depth of 5-10 nm. The approach for quantifying the number of AuNPs or that of specific nanodomains is via the concept of the fractional coverage. The latter is the ratio of the effective number of projectile impacts on a specified sampling area (Ne) to the total number of impacts (N0). The methodology has been validated with the determination of the number of antibody-AuNP conjugates on a cell, i.e. the number of disease related antigens on a cell via their specific binding sites with the AuNP-labeled antibodies. The number of AuNP-antibodies measured, ~42000 per cell, is in good agreement with literature results. The fractional coverage concept was also used to quantify several variants of biointerfaces. An example is the quantification of biotin and avidin immobilization as a function of the composition of silane substrates. The data collected in the event-by-event bombardment/detection mode expands the scope and quality of analytical information. One can identify SIs co-emitted with two specified SIs (double coincidence mass spectrometry) to inspect a specific stratum of a biointerface. A further refinement is the selection of events meeting a double coincidence emission condition. This mode enables the identification of nano-object of a few nm in size, which eliminates (anticoincidence) interferences from substrates.
Surface Analysis
Author: J. C. VickermanPublisher:
ISBN:
Category : Spectrum analysis
Languages : en
Pages : 457
Book Description
Secondary Ion Mass Spectrometry
Author: A. BenninghovenPublisher: Elsevier Science & Technology
ISBN:
Category : Science
Languages : en
Pages : 1092
Book Description
Hardbound. This biennial conference series is the first international forum covering developments in Secondary Ion Mass Spectrometry. All aspects of the most recent developments in SIMS were covered by the scientific program: fundamentals, instrumentation, methodology, and analytical applications in different fields (semiconductors, polymer and organic materials, life sciences, environmental sciences, earth sciences, materials science). Related techniques and topics were also included.
An Introduction to Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and its Application to Materials Science
Author: Sarah FearnPublisher: Morgan & Claypool Publishers
ISBN: 1681740885
Category : Technology & Engineering
Languages : en
Pages : 67
Book Description
This book highlights the application of Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) for high-resolution surface analysis and characterization of materials. While providing a brief overview of the principles of SIMS, it also provides examples of how dual-beam ToF-SIMS is used to investigate a range of materials systems and properties. Over the years, SIMS instrumentation has dramatically changed since the earliest secondary ion mass spectrometers were first developed. Instruments were once dedicated to either the depth profiling of materials using high-ion-beam currents to analyse near surface to bulk regions of materials (dynamic SIMS), or time-of-flight instruments that produced complex mass spectra of the very outer-most surface of samples, using very low-beam currents (static SIMS). Now, with the development of dual-beam instruments these two very distinct fields now overlap.
Characterization of Nanoparticles
Author: Ing. V.-D. HodoroabaPublisher: Elsevier
ISBN: 0128141832
Category : Science
Languages : en
Pages : 566
Book Description
Characterization of Nanoparticles: Measurement Processes for Nanoparticles surveys this fast growing field, including established methods for the physical and chemical characterization of nanoparticles. The book focuses on sample preparation issues (including potential pitfalls), with measurement procedures described in detail. In addition, the book explores data reduction, including the quantitative evaluation of the final result and its uncertainty of measurement. The results of published inter-laboratory comparisons are referred to, along with the availability of reference materials necessary for instrument calibration and method validation. The application of these methods are illustrated with practical examples on what is routine and what remains a challenge. In addition, this book summarizes promising methods still under development and analyzes the need for complementary methods to enhance the quality of nanoparticle characterization with solutions already in operation. Helps readers decide which nanocharacterization method is best for each measurement problem, including limitations, advantages and disadvantages Shows which nanocharacterization methods are best for different classes of nanomaterial Demonstrates the practical use of a method based on selected case studies
Surface Analysis and Techniques in Biology
Author: Vincent S. SmentkowskiPublisher: Springer Science & Business Media
ISBN: 3319013602
Category : Science
Languages : en
Pages : 333
Book Description
This book summarizes the main surface analysis techniques that are being used to study biological specimens/systems. The compilation of chapters in this book highlight the benefits that surface analysis provides. The outer layer of bulk solid or liquid samples is referred to as the surface of the sample/material. At the surface, the composition, microstructure, phase, chemical bonding, electronic states, and/or texture is often different than that of the bulk material. The outer surface is where many material interactions/reactions take place. This is especially true biomaterials which may be fabricated into bio-devices and in turn implanted into tissues and organs. Surfaces of biomaterials (synthetic or modified natural materials) are of critical importance since the surface is typically the only part of the biomaterial/bio-device that comes in contact with the biological system. Analytical techniques are required to characterize the surface of biomaterials and quantify their impact in real-world biological systems. Surface analysis of biological materials started in the 1960’s and the number of researchers working in this area have increased very rapidly since then, a number of advances have been made to standard surface analytical instrumentation, and a number of new instruments have been introduced.