Author:
Publisher:
ISBN:
Category : Periodicals
Languages : en
Pages : 1860
Book Description
A union list of serials commencing publication after Dec. 31, 1949.
New Serial Titles
Author:
Publisher:
ISBN:
Category : Periodicals
Languages : en
Pages : 1860
Book Description
A union list of serials commencing publication after Dec. 31, 1949.
Publisher:
ISBN:
Category : Periodicals
Languages : en
Pages : 1860
Book Description
A union list of serials commencing publication after Dec. 31, 1949.
Truck and Van Manual, 1991-1995
Author: Chilton Automotive Books
Publisher:
ISBN: 9780801979118
Category : Education
Languages : en
Pages : 1668
Book Description
Documents specifications repairs, and servicing procedures for individual models, and provides information on component repair and overhaul.
Publisher:
ISBN: 9780801979118
Category : Education
Languages : en
Pages : 1668
Book Description
Documents specifications repairs, and servicing procedures for individual models, and provides information on component repair and overhaul.
Books in Print
Author:
Publisher:
ISBN:
Category : American literature
Languages : en
Pages : 1756
Book Description
Publisher:
ISBN:
Category : American literature
Languages : en
Pages : 1756
Book Description
Chilton's General Motors Full Size Trucks
Author: Thomas A. Mellon
Publisher:
ISBN:
Category : GMC trucks
Languages : en
Pages : 0
Book Description
"Covers all U.S. and Canadian models of Chevrolet/GMC pick-ups, Sierra, Blazer, Tahoe, Yukon and Suburban; 2 and 4 wheel drive, gasoline and diesel engines"--Cover
Publisher:
ISBN:
Category : GMC trucks
Languages : en
Pages : 0
Book Description
"Covers all U.S. and Canadian models of Chevrolet/GMC pick-ups, Sierra, Blazer, Tahoe, Yukon and Suburban; 2 and 4 wheel drive, gasoline and diesel engines"--Cover
Wound Care
Author: Carrie Sussman
Publisher: Lippincott Williams & Wilkins
ISBN: 9780781774444
Category : Medical
Languages : en
Pages : 786
Book Description
Designed for health care professionals in multiple disciplines and clinical settings, this comprehensive, evidence-based wound care text provides basic and advanced information on wound healing and therapies and emphasizes clinical decision-making. The text integrates the latest scientific findings with principles of good wound care and provides a complete set of current, evidence-based practices. This edition features a new chapter on wound pain management and a chapter showing how to use negative pressure therapy on many types of hard-to-heal wounds. Technological advances covered include ultrasound for wound debridement, laser treatments, and a single-patient-use disposable device for delivering pulsed radio frequency.
Publisher: Lippincott Williams & Wilkins
ISBN: 9780781774444
Category : Medical
Languages : en
Pages : 786
Book Description
Designed for health care professionals in multiple disciplines and clinical settings, this comprehensive, evidence-based wound care text provides basic and advanced information on wound healing and therapies and emphasizes clinical decision-making. The text integrates the latest scientific findings with principles of good wound care and provides a complete set of current, evidence-based practices. This edition features a new chapter on wound pain management and a chapter showing how to use negative pressure therapy on many types of hard-to-heal wounds. Technological advances covered include ultrasound for wound debridement, laser treatments, and a single-patient-use disposable device for delivering pulsed radio frequency.
Meteorological monitoring guidance for regulatory modeling applications
Author:
Publisher: DIANE Publishing
ISBN: 1428901949
Category : Air quality
Languages : en
Pages : 171
Book Description
Publisher: DIANE Publishing
ISBN: 1428901949
Category : Air quality
Languages : en
Pages : 171
Book Description
Semiconductor Material and Device Characterization
Author: Dieter K. Schroder
Publisher: John Wiley & Sons
ISBN: 0471739065
Category : Technology & Engineering
Languages : en
Pages : 800
Book Description
This Third Edition updates a landmark text with the latest findings The Third Edition of the internationally lauded Semiconductor Material and Device Characterization brings the text fully up-to-date with the latest developments in the field and includes new pedagogical tools to assist readers. Not only does the Third Edition set forth all the latest measurement techniques, but it also examines new interpretations and new applications of existing techniques. Semiconductor Material and Device Characterization remains the sole text dedicated to characterization techniques for measuring semiconductor materials and devices. Coverage includes the full range of electrical and optical characterization methods, including the more specialized chemical and physical techniques. Readers familiar with the previous two editions will discover a thoroughly revised and updated Third Edition, including: Updated and revised figures and examples reflecting the most current data and information 260 new references offering access to the latest research and discussions in specialized topics New problems and review questions at the end of each chapter to test readers' understanding of the material In addition, readers will find fully updated and revised sections in each chapter. Plus, two new chapters have been added: Charge-Based and Probe Characterization introduces charge-based measurement and Kelvin probes. This chapter also examines probe-based measurements, including scanning capacitance, scanning Kelvin force, scanning spreading resistance, and ballistic electron emission microscopy. Reliability and Failure Analysis examines failure times and distribution functions, and discusses electromigration, hot carriers, gate oxide integrity, negative bias temperature instability, stress-induced leakage current, and electrostatic discharge. Written by an internationally recognized authority in the field, Semiconductor Material and Device Characterization remains essential reading for graduate students as well as for professionals working in the field of semiconductor devices and materials. An Instructor's Manual presenting detailed solutions to all the problems in the book is available from the Wiley editorial department.
Publisher: John Wiley & Sons
ISBN: 0471739065
Category : Technology & Engineering
Languages : en
Pages : 800
Book Description
This Third Edition updates a landmark text with the latest findings The Third Edition of the internationally lauded Semiconductor Material and Device Characterization brings the text fully up-to-date with the latest developments in the field and includes new pedagogical tools to assist readers. Not only does the Third Edition set forth all the latest measurement techniques, but it also examines new interpretations and new applications of existing techniques. Semiconductor Material and Device Characterization remains the sole text dedicated to characterization techniques for measuring semiconductor materials and devices. Coverage includes the full range of electrical and optical characterization methods, including the more specialized chemical and physical techniques. Readers familiar with the previous two editions will discover a thoroughly revised and updated Third Edition, including: Updated and revised figures and examples reflecting the most current data and information 260 new references offering access to the latest research and discussions in specialized topics New problems and review questions at the end of each chapter to test readers' understanding of the material In addition, readers will find fully updated and revised sections in each chapter. Plus, two new chapters have been added: Charge-Based and Probe Characterization introduces charge-based measurement and Kelvin probes. This chapter also examines probe-based measurements, including scanning capacitance, scanning Kelvin force, scanning spreading resistance, and ballistic electron emission microscopy. Reliability and Failure Analysis examines failure times and distribution functions, and discusses electromigration, hot carriers, gate oxide integrity, negative bias temperature instability, stress-induced leakage current, and electrostatic discharge. Written by an internationally recognized authority in the field, Semiconductor Material and Device Characterization remains essential reading for graduate students as well as for professionals working in the field of semiconductor devices and materials. An Instructor's Manual presenting detailed solutions to all the problems in the book is available from the Wiley editorial department.
Onsite Wastewater Treatment Systems Manual
Author:
Publisher:
ISBN:
Category : Sewage
Languages : en
Pages : 378
Book Description
"This manual contains overview information on treatment technologies, installation practices, and past performance."--Introduction.
Publisher:
ISBN:
Category : Sewage
Languages : en
Pages : 378
Book Description
"This manual contains overview information on treatment technologies, installation practices, and past performance."--Introduction.
American Book Publishing Record
Author:
Publisher:
ISBN:
Category : American literature
Languages : en
Pages : 1714
Book Description
Publisher:
ISBN:
Category : American literature
Languages : en
Pages : 1714
Book Description