Author: Publisher:
ISBN:
Category : Microelectronics
Languages : en
Pages : 142
Book Description
Center for Space Microelectronics Technology
Author: Space Microelectronics
Author: Monthly Catalog of United States Government Publications
Author: Publisher:
ISBN:
Category : Government publications
Languages : en
Pages : 1032
Book Description
NASA Activities
Author: United States. National Aeronautics and Space AdministrationPublisher:
ISBN:
Category : Aeronautics
Languages : en
Pages : 158
Book Description
Space Microelectronics Volume 1: Modern Spacecraft Classification, Failure, and Electrical Component Requirements
Author: Anatoly BelousPublisher: Artech House
ISBN: 1630814687
Category : Technology & Engineering
Languages : en
Pages : 415
Book Description
This authoritative first volume provides a solid understanding of modern spacecraft classification, failure, and electrical component requirements. This book focuses on the study of modern spacecraft, including their classification, packaging and protection, design versions, launch failure and accident analysis, and the main requirements of electronic components used. Readers find comprehensive coverage of the design and development of individual components as well as systems, their packaging, and how to make them last in space. This is a useful resource for military and civil applications. Specific topics include: The manufacturing of electronics for space; The main physical mechanisms of the impact of destabilizing factors of outer space, including various kinds of radiation, high-energy galactic icons, and particles of cosmic dust;The design of advanced space-grade microelectronic products such as memory microcircuits, microprocessors, interface and logic of microcircuits and power control microcircuits;Facts and features about the “space race” that have not been available until now.
Large Space Structures & Systems in the Space Station Era
Author: Publisher:
ISBN:
Category : Large space structures (Astronautics)
Languages : en
Pages : 1042
Book Description
Monthly Catalogue, United States Public Documents
Author: Publisher:
ISBN:
Category : Government publications
Languages : en
Pages : 1830
Book Description
Scanning Tunneling Microscopy
Author: Joseph A. StroscioPublisher: Academic Press
ISBN: 1483292878
Category : Science
Languages : en
Pages : 481
Book Description
Scanning tunneling microscopy (STM) and its extensions have become revolutionary tools in the fields of physics, materials science, chemistry, and biology. These new microscopies have evolved from their beginnings asresearch aids to their current use as commercial tools in the laboratory and on the factory floor. New wonders continue to unfold as STM delivers atomic scale imaging and electrical characterization of the newly emerging nanometer world. This volume in the METHODS OF EXPERIMENTAL PHYSICS Series describes the basics of scanning tunneling microscopy, provides a fundamental theoretical understanding of the technique and a thorough description of the instrumentation, and examines numerous examples and applications. Written by the pioneers of the field, this volume is an essential handbook for researchers and users of STM, as well as a valuable resource for libraries.
Scientific and Technical Aerospace Reports
Author: Scanning Probe Microscopy and Spectroscopy
Author: Dawn BonnellPublisher: John Wiley & Sons
ISBN: 047124824X
Category : Science
Languages : en
Pages : 520
Book Description
A practical introduction to basic theory and contemporary applications across a wide range of research disciplines Over the past two decades, scanning probe microscopies and spectroscopies have gained acceptance as indispensable characterization tools for an array of disciplines. This book provides novices and experienced researchers with a highly accessible treatment of basic theory, alongside detailed examples of current applications of both scanning tunneling and force microscopies and spectroscopies. Like its popular predecessor, Scanning Probe Microscopy and Spectroscopy, Second Edition features contributions from distinguished scientists working in a wide range of specialties at university, commercial, and government research labs around the world. Chapters have been edited for clarity, conciseness, and uniformity of presentation to provide professionals with a concise working reference to scanning probe microscopic and spectroscopic principles, techniques, and practices. This Second Edition has been substantially revised and expanded to reflect important advances and new applications. In addition to numerous examples, the Second Edition features expanded coverage of electrostatic and magnetic force microscopies, near-field optical microscopies, and new applications of buried interfaces in nanomechanics, electrochemistry, and biology. Scanning Probe Microscopy and Spectroscopy, Second Edition is an indispensable working resource for surface scientists, microscopists, and spectroscopists in materials science, chemistry, engineering, biochemistry, physics, and the life sciences. It is also an unparalleled reference text for advanced undergraduates and graduate students in those fields.