Author:
Publisher:
ISBN:
Category :
Languages : en
Pages : 416
Book Description
TENNESSEE: 2000, SUMMARY SOCIAL, ECONOMIC, AND HOUSING CHARACTERISTICS, PHC-2-44, 2000 CENSUS OF POPULATION AND HOUSING, ISSUED APRIL 2003, *
Tennessee, 2000
Oregon, 2000
Idaho, 2000
Florida, 2000
Georgia, 2000
Psychometrics
Author: R. Michael Furr
Publisher: SAGE
ISBN: 1452256802
Category : Psychology
Languages : en
Pages : 473
Book Description
In Psychometrics, R Michael Furr and Verne R Bacharach centre their presentation of material around a conceptual understanding of psychometric issues, such as validity and reliability, and on purpose rather than procedure, the ′why′ rather than the ′how to′. By emphasizing concepts over mathematical proofs and by focusing on practical significance, this book will assist students in appreciating not just how measurement problems can be addressed but why it is important to address them. The Second Edition has been thoroughly revised to improve the clarity and accessibility of key concepts and to increase the depth of discussions. Many new tables and figures have been added and the references have been significanly updated and expanded. An entirely new chapter on confirmatory factor analysis has also been added to this edition. This new chapter focuses on the use of CFA to evaluate measurement models, including in-depth discussion of the logic and interpretation of the process. Key features of this volume: - presents information in a clear, easy-to-read, conversational style: the authors introduce concepts in a way that is accessible to non-professionals without sacrificing the academic integrity of the material - highlights practical applications: intended to enhance readers′ appreciation of the importance of psychometrics, the book provides examples that will resonate with students - offers an up-to-date treatment of topics in psychometrics: the book offers readers the most contemporary views of topics in psychometrics available in the non-technical psychometric literature - introduces statistical procedures in the context of their use rather than in a separate chapter: the authors integrate statistics with a discussion of their use as tools to solve particular psychometric problems, encouraging a more complete understanding of both.
Publisher: SAGE
ISBN: 1452256802
Category : Psychology
Languages : en
Pages : 473
Book Description
In Psychometrics, R Michael Furr and Verne R Bacharach centre their presentation of material around a conceptual understanding of psychometric issues, such as validity and reliability, and on purpose rather than procedure, the ′why′ rather than the ′how to′. By emphasizing concepts over mathematical proofs and by focusing on practical significance, this book will assist students in appreciating not just how measurement problems can be addressed but why it is important to address them. The Second Edition has been thoroughly revised to improve the clarity and accessibility of key concepts and to increase the depth of discussions. Many new tables and figures have been added and the references have been significanly updated and expanded. An entirely new chapter on confirmatory factor analysis has also been added to this edition. This new chapter focuses on the use of CFA to evaluate measurement models, including in-depth discussion of the logic and interpretation of the process. Key features of this volume: - presents information in a clear, easy-to-read, conversational style: the authors introduce concepts in a way that is accessible to non-professionals without sacrificing the academic integrity of the material - highlights practical applications: intended to enhance readers′ appreciation of the importance of psychometrics, the book provides examples that will resonate with students - offers an up-to-date treatment of topics in psychometrics: the book offers readers the most contemporary views of topics in psychometrics available in the non-technical psychometric literature - introduces statistical procedures in the context of their use rather than in a separate chapter: the authors integrate statistics with a discussion of their use as tools to solve particular psychometric problems, encouraging a more complete understanding of both.
National Optical Astronomy Observatories Newsletter
Author:
Publisher:
ISBN:
Category : Astronomical observatories
Languages : en
Pages : 370
Book Description
Publisher:
ISBN:
Category : Astronomical observatories
Languages : en
Pages : 370
Book Description
75th Anniversary of the Transistor
Author: Arokia Nathan
Publisher: John Wiley & Sons
ISBN: 1394202466
Category : Technology & Engineering
Languages : en
Pages : 469
Book Description
75th Anniversary of the Transistor 75th anniversary commemorative volume reflecting the transistor's development since inception to current state of the art 75th Anniversary of the Transistor is a commemorative anniversary volume to celebrate the invention of the transistor. The anniversary volume was conceived by the IEEE Electron Devices Society (EDS) to provide comprehensive yet compact coverage of the historical perspectives underlying the invention of the transistor and its subsequent evolution into a multitude of integration and manufacturing technologies and applications. The book reflects the transistor's development since inception to the current state of the art that continues to enable scaling to very large-scale integrated circuits of higher functionality and speed. The stages in this evolution covered are in chronological order to reflect historical developments. Narratives and experiences are provided by a select number of venerated industry and academic leaders, and retired veterans, of the semiconductor industry. 75th Anniversary of the Transistor highlights: Historical perspectives of the state-of-the-art pre-solid-state-transistor world (pre-1947) leading to the invention of the transistor Invention of the bipolar junction transistor (BJT) and analytical formulations by Shockley (1948) and their impact on the semiconductor industry Large scale integration, Moore's Law (1965) and transistor scaling (1974), and MOS/LSI, including flash memories — SRAMs, DRAMs (1963), and the Toshiba NAND flash memory (1989) Image sensors (1986), including charge-coupled devices, and related microsensor applications With comprehensive yet succinct and accessible coverage of one of the cornerstones of modern technology, 75th Anniversary of the Transistor is an essential reference for engineers, researchers, and undergraduate students looking for historical perspective from leaders in the field.
Publisher: John Wiley & Sons
ISBN: 1394202466
Category : Technology & Engineering
Languages : en
Pages : 469
Book Description
75th Anniversary of the Transistor 75th anniversary commemorative volume reflecting the transistor's development since inception to current state of the art 75th Anniversary of the Transistor is a commemorative anniversary volume to celebrate the invention of the transistor. The anniversary volume was conceived by the IEEE Electron Devices Society (EDS) to provide comprehensive yet compact coverage of the historical perspectives underlying the invention of the transistor and its subsequent evolution into a multitude of integration and manufacturing technologies and applications. The book reflects the transistor's development since inception to the current state of the art that continues to enable scaling to very large-scale integrated circuits of higher functionality and speed. The stages in this evolution covered are in chronological order to reflect historical developments. Narratives and experiences are provided by a select number of venerated industry and academic leaders, and retired veterans, of the semiconductor industry. 75th Anniversary of the Transistor highlights: Historical perspectives of the state-of-the-art pre-solid-state-transistor world (pre-1947) leading to the invention of the transistor Invention of the bipolar junction transistor (BJT) and analytical formulations by Shockley (1948) and their impact on the semiconductor industry Large scale integration, Moore's Law (1965) and transistor scaling (1974), and MOS/LSI, including flash memories — SRAMs, DRAMs (1963), and the Toshiba NAND flash memory (1989) Image sensors (1986), including charge-coupled devices, and related microsensor applications With comprehensive yet succinct and accessible coverage of one of the cornerstones of modern technology, 75th Anniversary of the Transistor is an essential reference for engineers, researchers, and undergraduate students looking for historical perspective from leaders in the field.
Scientific and Technical Aerospace Reports
Author:
Publisher:
ISBN:
Category : Aeronautics
Languages : en
Pages : 1024
Book Description
Lists citations with abstracts for aerospace related reports obtained from world wide sources and announces documents that have recently been entered into the NASA Scientific and Technical Information Database.
Publisher:
ISBN:
Category : Aeronautics
Languages : en
Pages : 1024
Book Description
Lists citations with abstracts for aerospace related reports obtained from world wide sources and announces documents that have recently been entered into the NASA Scientific and Technical Information Database.