Author: Richard L. MattisPublisher:
ISBN:
Category : Photoconductivity
Languages : en
Pages : 56
Book Description
Carrier Lifetime Measurement by the Photoconductive Decay Method
Author: Richard L. MattisPublisher:
ISBN:
Category : Photoconductivity
Languages : en
Pages : 56
Book Description
Measurement of Carrier Lifetime in Semiconductors
Author: W. Murray BullisPublisher:
ISBN:
Category : Semiconductors
Languages : en
Pages : 68
Book Description
About 300 papers concerned with the measurement and interpretation of carrier lifetime in semiconductors are listed together with key words and a brief comment for each. Eight types of entries are included: Description of Methods, Analysis of Results, Standard Methods, Experimental Results, Theroetical Models, Auxiliary Procedures and Data, Reviews, and Books. Emphasis is placed on methods of carrying out measurements of carrier lifetime. Hence complete coverage was attempted and nearly two thirds of the entries appear in the first three categories. A large fraction of the papers listed describe the photoconductivity or photoconductive decay methods. The other most popular methods are based on diode characteristics or the photomagnetoelectric effect. In all, 35 methods for measuring carrier lifetime are represented by entries. In addition, representative papers which describe various models for recombination are included together with a number of papers which discuss the influence of surface recombination and trapping phenomena. Auxiliary procedures such as surface preparation, formation of ohmic contacts, control of temperature, and the like are described in some of the entries. Two indexes, a Key Word Index and an Author Index, are provided together with a classification of the various methods for measuring carrier lifetime. (Author).
NBS Technical Note
Author: Methods of measurement for semiconductor materials, process control, and devices
Author: W. Murray BullisMethods of Measurement for Semiconductor Materials, Process Control, and Devices; Quarterly Report
Author: United States. National Bureau of StandardsPublisher:
ISBN:
Category : Semiconductors
Languages : en
Pages : 78
Book Description
Journal of Research of the National Bureau of Standards
Author: United States. National Bureau of StandardsPublisher:
ISBN:
Category : Engineering
Languages : en
Pages : 578
Book Description
Measurement Methods for the Semiconductor Device Industry
Author: W. Murray BullisPublisher:
ISBN:
Category : Semiconductor industry
Languages : en
Pages : 28
Book Description
Methods of Measurement for Semiconductor Materials, Process Control, and Devices
Author: United States. National Bureau of StandardsPublisher:
ISBN:
Category : Semiconductors
Languages : en
Pages : 60
Book Description
Methods of Measurement for Semiconductor Materials, Process Control, and Devices. Quarterly Report, October 1 to December 31, 1970
Author: W. Murray BullisPublisher:
ISBN:
Category : Semiconductors
Languages : en
Pages : 80
Book Description
Narrow Gap Semiconductors 1995
Author: J.L RenoPublisher: CRC Press
ISBN: 1000112403
Category : Science
Languages : en
Pages : 401
Book Description
Narrow Gap Semiconductors 1995 contains the invited and contributed papers presented at the Seventh International Conference on Narrow Gap Semiconductors, held in January 1995. The invited review papers provide an overview and the contributed papers provide in-depth coverage of research results across the whole field.