Author: Tak-Kei Lam
Publisher: John Wiley & Sons
ISBN: 111875011X
Category : Technology & Engineering
Languages : en
Pages : 234
Book Description
Demonstrates techniques which will allow rewiring rates of over 95%, enabling adoption of deep sub-micron chips for industrial applications Logic synthesis is an essential part of the modern digital IC design process in semi-conductor industry. This book discusses a logic synthesis technique called “rewiring” and its latest technical advancement in term of rewirability. Rewiring technique has surfaced in academic research since 1993 and there is currently no book available on the market which systematically and comprehensively discusses this rewiring technology. The authors cover logic transformation techniques with concentration on rewiring. For many decades, the effect of wiring on logic structures has been ignored due to an ideal view of wires and their negligible role in the circuit performance. However in today’s semiconductor technology wiring is the major player in circuit performance degeneration and logic synthesis engines can be improved to deal with this through wire-based transformations. This book introduces the automatic test pattern generation (ATPG)-based rewiring techniques, which are recently active in the realm of logic synthesis/verification of VLSI/SOC designs. Unique comprehensive coverage of semiconductor rewiring techniques written by leading researchers in the field Provides complete coverage of rewiring from an introductory to intermediate level Rewiring is explained as a flexible technique for Boolean logic synthesis, introducing the concept of Boolean circuit transformation and testing, with examples Readers can directly apply the described techniques to real-world VLSI design issues Focuses on the automatic test pattern generation (ATPG) based rewiring methods although some non-ATPG based rewiring methods such as graph based alternative wiring (GBAW), and “set of pairs of functions to be distinguished” (SPFD) based rewiring are also discussed A valuable resource for researchers and postgraduate students in VLSI and SoC design, as well as digital design engineers, EDA software developers, and design automation experts that specialize in the synthesis and optimization of logical circuits.
Boolean Circuit Rewiring
Author: Tak-Kei Lam
Publisher: John Wiley & Sons
ISBN: 111875011X
Category : Technology & Engineering
Languages : en
Pages : 234
Book Description
Demonstrates techniques which will allow rewiring rates of over 95%, enabling adoption of deep sub-micron chips for industrial applications Logic synthesis is an essential part of the modern digital IC design process in semi-conductor industry. This book discusses a logic synthesis technique called “rewiring” and its latest technical advancement in term of rewirability. Rewiring technique has surfaced in academic research since 1993 and there is currently no book available on the market which systematically and comprehensively discusses this rewiring technology. The authors cover logic transformation techniques with concentration on rewiring. For many decades, the effect of wiring on logic structures has been ignored due to an ideal view of wires and their negligible role in the circuit performance. However in today’s semiconductor technology wiring is the major player in circuit performance degeneration and logic synthesis engines can be improved to deal with this through wire-based transformations. This book introduces the automatic test pattern generation (ATPG)-based rewiring techniques, which are recently active in the realm of logic synthesis/verification of VLSI/SOC designs. Unique comprehensive coverage of semiconductor rewiring techniques written by leading researchers in the field Provides complete coverage of rewiring from an introductory to intermediate level Rewiring is explained as a flexible technique for Boolean logic synthesis, introducing the concept of Boolean circuit transformation and testing, with examples Readers can directly apply the described techniques to real-world VLSI design issues Focuses on the automatic test pattern generation (ATPG) based rewiring methods although some non-ATPG based rewiring methods such as graph based alternative wiring (GBAW), and “set of pairs of functions to be distinguished” (SPFD) based rewiring are also discussed A valuable resource for researchers and postgraduate students in VLSI and SoC design, as well as digital design engineers, EDA software developers, and design automation experts that specialize in the synthesis and optimization of logical circuits.
Publisher: John Wiley & Sons
ISBN: 111875011X
Category : Technology & Engineering
Languages : en
Pages : 234
Book Description
Demonstrates techniques which will allow rewiring rates of over 95%, enabling adoption of deep sub-micron chips for industrial applications Logic synthesis is an essential part of the modern digital IC design process in semi-conductor industry. This book discusses a logic synthesis technique called “rewiring” and its latest technical advancement in term of rewirability. Rewiring technique has surfaced in academic research since 1993 and there is currently no book available on the market which systematically and comprehensively discusses this rewiring technology. The authors cover logic transformation techniques with concentration on rewiring. For many decades, the effect of wiring on logic structures has been ignored due to an ideal view of wires and their negligible role in the circuit performance. However in today’s semiconductor technology wiring is the major player in circuit performance degeneration and logic synthesis engines can be improved to deal with this through wire-based transformations. This book introduces the automatic test pattern generation (ATPG)-based rewiring techniques, which are recently active in the realm of logic synthesis/verification of VLSI/SOC designs. Unique comprehensive coverage of semiconductor rewiring techniques written by leading researchers in the field Provides complete coverage of rewiring from an introductory to intermediate level Rewiring is explained as a flexible technique for Boolean logic synthesis, introducing the concept of Boolean circuit transformation and testing, with examples Readers can directly apply the described techniques to real-world VLSI design issues Focuses on the automatic test pattern generation (ATPG) based rewiring methods although some non-ATPG based rewiring methods such as graph based alternative wiring (GBAW), and “set of pairs of functions to be distinguished” (SPFD) based rewiring are also discussed A valuable resource for researchers and postgraduate students in VLSI and SoC design, as well as digital design engineers, EDA software developers, and design automation experts that specialize in the synthesis and optimization of logical circuits.
Functional Design Errors in Digital Circuits
Author: Kai-hui Chang
Publisher: Springer Science & Business Media
ISBN: 1402093659
Category : Technology & Engineering
Languages : en
Pages : 213
Book Description
Functional Design Errors in Digital Circuits Diagnosis covers a wide spectrum of innovative methods to automate the debugging process throughout the design flow: from Register-Transfer Level (RTL) all the way to the silicon die. In particular, this book describes: (1) techniques for bug trace minimization that simplify debugging; (2) an RTL error diagnosis method that identifies the root cause of errors directly; (3) a counterexample-guided error-repair framework to automatically fix errors in gate-level and RTL designs; (4) a symmetry-based rewiring technology for fixing electrical errors; (5) an incremental verification system for physical synthesis; and (6) an integrated framework for post-silicon debugging and layout repair. The solutions provided in this book can greatly reduce debugging effort, enhance design quality, and ultimately enable the design and manufacture of more reliable electronic devices.
Publisher: Springer Science & Business Media
ISBN: 1402093659
Category : Technology & Engineering
Languages : en
Pages : 213
Book Description
Functional Design Errors in Digital Circuits Diagnosis covers a wide spectrum of innovative methods to automate the debugging process throughout the design flow: from Register-Transfer Level (RTL) all the way to the silicon die. In particular, this book describes: (1) techniques for bug trace minimization that simplify debugging; (2) an RTL error diagnosis method that identifies the root cause of errors directly; (3) a counterexample-guided error-repair framework to automatically fix errors in gate-level and RTL designs; (4) a symmetry-based rewiring technology for fixing electrical errors; (5) an incremental verification system for physical synthesis; and (6) an integrated framework for post-silicon debugging and layout repair. The solutions provided in this book can greatly reduce debugging effort, enhance design quality, and ultimately enable the design and manufacture of more reliable electronic devices.
Digest of Technical Papers
Author:
Publisher:
ISBN:
Category : Computer-aided design
Languages : en
Pages : 698
Book Description
Publisher:
ISBN:
Category : Computer-aided design
Languages : en
Pages : 698
Book Description
Functional Design Error Diagnosis, Correction and Layout Repair of Digital Circuits
Advances in Cryptology – ASIACRYPT 2020
Author: Shiho Moriai
Publisher: Springer Nature
ISBN: 3030648400
Category : Computers
Languages : en
Pages : 912
Book Description
The three-volume proceedings LNCS 12491, 12492, and 12493 constitutes the proceedings of the 26th International Conference on the Theory and Application of Cryptology and Information Security, ASIACRYPT 2020, which was held during December 7-11, 2020. The conference was planned to take place in Daejeon, South Korea, but changed to an online format due to the COVID-19 pandemic. The total of 85 full papers presented in these proceedings was carefully reviewed and selected from 316 submissions. The papers were organized in topical sections as follows: Part I: Best paper awards; encryption schemes.- post-quantum cryptography; cryptanalysis; symmetric key cryptography; message authentication codes; side-channel analysis. Part II: public key cryptography; lattice-based cryptography; isogeny-based cryptography; quantum algorithms; authenticated key exchange. Part III: multi-party computation; secret sharing; attribute-based encryption; updatable encryption; zero knowledge; blockchains and contact tracing.
Publisher: Springer Nature
ISBN: 3030648400
Category : Computers
Languages : en
Pages : 912
Book Description
The three-volume proceedings LNCS 12491, 12492, and 12493 constitutes the proceedings of the 26th International Conference on the Theory and Application of Cryptology and Information Security, ASIACRYPT 2020, which was held during December 7-11, 2020. The conference was planned to take place in Daejeon, South Korea, but changed to an online format due to the COVID-19 pandemic. The total of 85 full papers presented in these proceedings was carefully reviewed and selected from 316 submissions. The papers were organized in topical sections as follows: Part I: Best paper awards; encryption schemes.- post-quantum cryptography; cryptanalysis; symmetric key cryptography; message authentication codes; side-channel analysis. Part II: public key cryptography; lattice-based cryptography; isogeny-based cryptography; quantum algorithms; authenticated key exchange. Part III: multi-party computation; secret sharing; attribute-based encryption; updatable encryption; zero knowledge; blockchains and contact tracing.
Proceedings, ... International Symposium on VLSI Design
Author:
Publisher:
ISBN:
Category : Electronic digital computers
Languages : en
Pages : 638
Book Description
Publisher:
ISBN:
Category : Electronic digital computers
Languages : en
Pages : 638
Book Description
Computer Security – ESORICS 2020
Author: Liqun Chen
Publisher: Springer Nature
ISBN: 3030590135
Category : Computers
Languages : en
Pages : 769
Book Description
The two volume set, LNCS 12308 + 12309, constitutes the proceedings of the 25th European Symposium on Research in Computer Security, ESORICS 2020, which was held in September 2020. The conference was planned to take place in Guildford, UK. Due to the COVID-19 pandemic, the conference changed to an online format. The total of 72 full papers included in these proceedings was carefully reviewed and selected from 366 submissions. The papers were organized in topical sections named: database and Web security; system security; network security; software security; machine learning security; privacy; formal modelling; applied cryptography; analyzing attacks; post-quantum cryptogrphy; security analysis; and blockchain.
Publisher: Springer Nature
ISBN: 3030590135
Category : Computers
Languages : en
Pages : 769
Book Description
The two volume set, LNCS 12308 + 12309, constitutes the proceedings of the 25th European Symposium on Research in Computer Security, ESORICS 2020, which was held in September 2020. The conference was planned to take place in Guildford, UK. Due to the COVID-19 pandemic, the conference changed to an online format. The total of 72 full papers included in these proceedings was carefully reviewed and selected from 366 submissions. The papers were organized in topical sections named: database and Web security; system security; network security; software security; machine learning security; privacy; formal modelling; applied cryptography; analyzing attacks; post-quantum cryptogrphy; security analysis; and blockchain.
IEEE International Conference on Electronics, Circuits and Systems
Author:
Publisher:
ISBN:
Category : Electric filters, Digital
Languages : en
Pages : 444
Book Description
Publisher:
ISBN:
Category : Electric filters, Digital
Languages : en
Pages : 444
Book Description
FPGA ...
Author:
Publisher:
ISBN:
Category : Field programmable gate arrays
Languages : en
Pages : 280
Book Description
Publisher:
ISBN:
Category : Field programmable gate arrays
Languages : en
Pages : 280
Book Description
Proceedings, 1997 International Symposium on Low Power Electronics and Design
Author: IEEE Circuits and Systems Society
Publisher: Institute of Electrical & Electronics Engineers(IEEE)
ISBN:
Category : Technology & Engineering
Languages : en
Pages : 350
Book Description
Publisher: Institute of Electrical & Electronics Engineers(IEEE)
ISBN:
Category : Technology & Engineering
Languages : en
Pages : 350
Book Description