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Author: Publisher: ISBN: Category : Languages : en Pages : 21
Book Description
An accelerated life testing problem in which the stress s can take only a fixed, finite number of values is known as accelerated life test with step stress. In general, the item under test is started under the lowest stress first and if an item has not failed until a certain specified time, then it is moved into the next level of stress. This process is continued until the item fails. Thus the life test duration of the item is shortened. A Bayesian formulation of the problem is given in this paper. It is assumed that there only two stress values under consideration (1) standard use environmental condition (ii) a higher level of stress that is fixed in advance and is the same for all items to be tested. However, the time at which an item on test is taken out of use environment and put under higher stress environment can be chosen by the experimenter subject to a cost structure. We consider the inference and the optimal design problem of when the change the stress as the test progress. Keywords: Accelerated life test, Step stress, Optimal design, Bayesian approach.
Author: Publisher: ISBN: Category : Languages : en Pages : 21
Book Description
An accelerated life testing problem in which the stress s can take only a fixed, finite number of values is known as accelerated life test with step stress. In general, the item under test is started under the lowest stress first and if an item has not failed until a certain specified time, then it is moved into the next level of stress. This process is continued until the item fails. Thus the life test duration of the item is shortened. A Bayesian formulation of the problem is given in this paper. It is assumed that there only two stress values under consideration (1) standard use environmental condition (ii) a higher level of stress that is fixed in advance and is the same for all items to be tested. However, the time at which an item on test is taken out of use environment and put under higher stress environment can be chosen by the experimenter subject to a cost structure. We consider the inference and the optimal design problem of when the change the stress as the test progress. Keywords: Accelerated life test, Step stress, Optimal design, Bayesian approach.
Author: Narayanaswamy Balakrishnan Publisher: John Wiley & Sons ISBN: 1119664012 Category : Mathematics Languages : en Pages : 240
Book Description
Provides authoritative guidance on statistical analysis techniques and inferential methods for one-shot device life-testing Estimating the reliability of one-shot devices—electro-expolsive devices, fire extinguishers, automobile airbags, and other units that perform their function only once—poses unique analytical challenges to conventional approaches. Due to how one-shot devices are censored, their precise failure times cannot be obtained from testing. The condition of a one-shot device can only be recorded at a specific inspection time, resulting in a lack of lifetime data collected in life-tests. Accelerated Life Testing of One-shot Devices: Data Collection and Analysis addresses the fundamental issues of statistical modeling based on data collected from accelerated life-tests of one-shot devices. The authors provide inferential methods and procedures for planning accelerated life-tests, and describe advanced statistical techniques to help reliability practitioners overcome estimation problems in the real world. Topics covered include likelihood inference, competing-risks models, one-shot devices with dependent components, model selection, and more. Enabling readers to apply the techniques to their own lifetime data and arrive at the most accurate inference possible, this practical resource: Provides expert guidance on comprehensive data analysis of one-shot devices under accelerated life-tests Discusses how to design experiments for data collection from efficient accelerated life-tests while conforming to budget constraints Helps readers develops optimal designs for constant-stress and step-stress accelerated life-tests, mainstream life-tests commonly used in reliability practice Includes R code in each chapter for readers to use in their own analyses of one-shot device testing data Features numerous case studies and practical examples throughout Highlights important issues, problems, and future research directions in reliability theory and practice Accelerated Life Testing of One-shot Devices: Data Collection and Analysis is essential reading for graduate students, researchers, and engineers working on accelerated life testing data analysis.
Author: Cabarbaye André Publisher: Cab Innovation Editeur ISBN: Category : Science Languages : en Pages : 128
Book Description
The accelerated life testing is used to quickly demonstrate the ability of a product to perform its role, by increasing the stress conditions compared to those of its operational life. This educational book on the implementation of accelerated life testing therefore explains its theoretical foundations and offers a practical application guide which covers state-of-the-art thinking on design techniques and optimal planning of tests.
Author: Wayne Nelson Publisher: Wiley-Interscience ISBN: Category : Mathematics Languages : en Pages : 626
Book Description
Accelerated Testing Statistical Models, Test Plans, and Data Analyses; Contents; Preface; 1. Introduction and Background; 2. Models for Life Tests with Constant Stress; 3. Graphical Data Analysis; 4. Complete Data and Least Squares Analyses; 5. Censored Data and Maximum Ukelihood Methods; 6. Test Plans; 7. Competing Failure Modes and Size Effect; 8. Least-Squares Comparisons for Complete Data; 9. Maximum Likelihood Comparisons for Censored and Other Data; 10. Models and Data Analyses for Step and Varying Stress; 11. Accelerated Degradation; Appendix A. Statistical Tables; References; Index
Author: Preeti Wanti Srivastava Publisher: World Scientific ISBN: 9813141271 Category : Technology & Engineering Languages : en Pages : 444
Book Description
Today's manufacturers are under tremendous pressure to develop new technological and high reliability products in record time. This has motivated reliability engineers to evaluate the reliabilities of such products. Reliability testing under accelerated environment — accelerated life testing helps to meet this challenge.This comprehensive and must-have edition provides a broad coverage of the optimal design of Accelerated Life Test Plans under time-varying stress loadings. It also focuses on the formulation of Accelerated Life Test Sampling Plans (ALTSPs) which integrate accelerated life tests with quality control technique of acceptance sampling plans. These plans help to determine optimal experimental variables such as appropriate stress levels, optimal allocation at each stress levels, stress change points, etc, depending on the stress loading scheme. ALTSPs determine optimal plans such that the producers' and consumers' risks are safeguarded.
Author: Debasis Kundu Publisher: Academic Press ISBN: 0081012403 Category : Mathematics Languages : en Pages : 188
Book Description
Analysis of Step-Stress Models: Existing Results and Some Recent Developments describes, in detail, the step-stress models and related topics that have received significant attention in the last few years. Although two books, Bagdonavicius and Nikulin (2001) and Nelson (1990), on general accelerated life testing models are available, no specific book is available on step-stress models. Due to the importance of this particular topic, Balakrishnan (2009) provided an excellent review for exponential step-stress models. The scope of this book is much more, providing the inferential issues for different probability models, both from the frequentist and Bayesian points-of-view. - Explains the different distributions of the Cumulative Exposure Mode - Covers many different models used for step-stress analysis - Discusses Step-stress life testing under the competing or complementary risk model
Author: Yao Zhang Publisher: ISBN: Category : Languages : en Pages : 198
Book Description
This dissertation, consisting of three separate papers, describes Bayesian methods for life test planning and accelerated life test planning with censored data from a log-location-scale distribution, when prior information of the model parameters is available. The first paper studies Bayesian life testing planning with Type II censored data from a Weibull distribution with given shape parameter, where closed form solutions are available. The second paper presents Bayesian methods for life test planning with a general distribution in a log-location-scale-family, in which a large sample approximation approach and a simulation approach are developed to evaluate the criterion and provide plan solutions. The third paper describes Bayesian optimum design methods for accelerated life tests with one accelerating variable and a linear acceleration model, where a large sample approximation is used for the test solutions and simulations are used to evaluate the resulting designs. Appropriate Bayes criteria are developed for each of the situations discussed, and numerical examples are used to illustrate the practical use of the Bayesian design methods.
Author: N. Balakrishnan Publisher: CRC Press ISBN: 1000948390 Category : Mathematics Languages : en Pages : 662
Book Description
This unique volume presents chapters written on the areas of life-testing and reliability by many well-known researchers who have contributed significantly to these two areas over the years. Chapters cover a wide range of topics such as inference under censoring and truncation, reliability growth models, designs to improve quality, prediction techniques, Bayesian analysis of reliability, multivariate methods, accelerated testing, and more. The book is written in an easy-to-follow style, first presenting the necessary theoretical details and then illustrating the methods with a numerical examples wherever possible. Many tables and graphs that are essential for the use of some of the new methodologies are presented throughout the volume. Numerous examples provide the reader with a clear understanding of the methods presented as well as with insight into the applications of these results.
Author: Michael S. Hamada Publisher: Springer Science & Business Media ISBN: 0387779507 Category : Mathematics Languages : en Pages : 445
Book Description
Bayesian Reliability presents modern methods and techniques for analyzing reliability data from a Bayesian perspective. The adoption and application of Bayesian methods in virtually all branches of science and engineering have significantly increased over the past few decades. This increase is largely due to advances in simulation-based computational tools for implementing Bayesian methods. The authors extensively use such tools throughout this book, focusing on assessing the reliability of components and systems with particular attention to hierarchical models and models incorporating explanatory variables. Such models include failure time regression models, accelerated testing models, and degradation models. The authors pay special attention to Bayesian goodness-of-fit testing, model validation, reliability test design, and assurance test planning. Throughout the book, the authors use Markov chain Monte Carlo (MCMC) algorithms for implementing Bayesian analyses -- algorithms that make the Bayesian approach to reliability computationally feasible and conceptually straightforward. This book is primarily a reference collection of modern Bayesian methods in reliability for use by reliability practitioners. There are more than 70 illustrative examples, most of which utilize real-world data. This book can also be used as a textbook for a course in reliability and contains more than 160 exercises. Noteworthy highlights of the book include Bayesian approaches for the following: Goodness-of-fit and model selection methods Hierarchical models for reliability estimation Fault tree analysis methodology that supports data acquisition at all levels in the tree Bayesian networks in reliability analysis Analysis of failure count and failure time data collected from repairable systems, and the assessment of various related performance criteria Analysis of nondestructive and destructive degradation data Optimal design of reliability experiments Hierarchical reliability assurance testing
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Author: 
Author: Narayanaswamy Balakrishnan
Author: Liu, Xi
Author: Cabarbaye André
Author: Wayne Nelson
Author: Preeti Wanti Srivastava
Author: Debasis Kundu
Author: Yao Zhang
Author: N. Balakrishnan
Author: Michael S. Hamada