Author: William Abraham KassisPublisher:
ISBN:
Category : Analog computers
Languages : en
Pages : 398
Book Description
Automatic Testing of Analog Circuits and Systems
Author: William Abraham KassisPublisher:
ISBN:
Category : Analog computers
Languages : en
Pages : 398
Book Description
Testing and Diagnosis of Analog Circuits and Systems
Author: Ruey-wen LiuPublisher: Springer Science & Business Media
ISBN: 1461597471
Category : Computers
Languages : en
Pages : 290
Book Description
IS THE TOPIC ANALOG TESTING AND DIAGNOSIS TIMELY? Yes, indeed it is. Testing and Diagnosis is an important topic and fulfills a vital need for the electronic industry. The testing and diagnosis of digital electronic circuits has been successfuIly developed to the point that it can be automated. Unfortu nately, its development for analog electronic circuits is still in its Stone Age. The engineer's intuition is still the most powerful tool used in the industry! There are two reasons for this. One is that there has been no pressing need from the industry. Analog circuits are usuaIly small in size. Sometimes, the engineer's experience and intuition are sufficient to fulfill the need. The other reason is that there are no breakthrough results from academic re search to provide the industry with critical ideas to develop tools. This is not because of a lack of effort. Both academic and industrial research groups have made major efforts to look into this problem. Unfortunately, the prob lem for analog circuits is fundamentally different from and much more diffi cult than its counterpart for digital circuits. These efforts have led to some important findings, but are still not at the point of being practicaIly useful. However, these situations are now changing. The current trend for the design of VLSI chips is to use analog/digital hybrid circuits, instead of digital circuits from the past. Therefore, even Ix x Preface though the analog circuit may be small, the total circuit under testing is large.
Testing and Diagnosis of Analog Circuits and Systems
Author: 3Island PressPublisher:
ISBN: 9781461597483
Category :
Languages : en
Pages : 304
Book Description
Test and Diagnosis of Analogue, Mixed-signal and RF Integrated Circuits
Author: Yichuang SunPublisher: IET
ISBN: 0863417450
Category : Technology & Engineering
Languages : en
Pages : 411
Book Description
This book provides a comprehensive discussion of automatic testing, diagnosis and tuning of analogue, mixed-signal and RF integrated circuits, and systems in a single source. As well as fundamental concepts and techniques, the book reports systematically the state of the arts and future research directions of those areas. A complete range of circuit components are covered and test issues from the SoC perspective. An essential reference for researchers and engineers in mixed signal testing, postgraduate and senior undergraduate students.
1983 IEEE ATPG Workshop Proceedings
Author: Automatic Testing and Evaluation of Digital Integrated Circuits
Author: James T. HealyPublisher:
ISBN:
Category : Technology & Engineering
Languages : en
Pages : 264
Book Description
Automatic Test Equipment
Author: Fred LiguoriPublisher: IEEE Computer Society Press
ISBN:
Category : Technology & Engineering
Languages : en
Pages : 268
Book Description
Computer-Aided Design of Analog Integrated Circuits and Systems
Author: Rob A. RutenbarPublisher: John Wiley & Sons
ISBN: 047122782X
Category : Technology & Engineering
Languages : en
Pages : 773
Book Description
The tools and techniques you need to break the analog design bottleneck! Ten years ago, analog seemed to be a dead-end technology. Today, System-on-Chip (SoC) designs are increasingly mixed-signal designs. With the advent of application-specific integrated circuits (ASIC) technologies that can integrate both analog and digital functions on a single chip, analog has become more crucial than ever to the design process. Today, designers are moving beyond hand-crafted, one-transistor-at-a-time methods. They are using new circuit and physical synthesis tools to design practical analog circuits; new modeling and analysis tools to allow rapid exploration of system level alternatives; and new simulation tools to provide accurate answers for analog circuit behaviors and interactions that were considered impossible to handle only a few years ago. To give circuit designers and CAD professionals a better understanding of the history and the current state of the art in the field, this volume collects in one place the essential set of analog CAD papers that form the foundation of today's new analog design automation tools. Areas covered are: * Analog synthesis * Symbolic analysis * Analog layout * Analog modeling and analysis * Specialized analog simulation * Circuit centering and yield optimization * Circuit testing Computer-Aided Design of Analog Integrated Circuits and Systems is the cutting-edge reference that will be an invaluable resource for every semiconductor circuit designer and CAD professional who hopes to break the analog design bottleneck.
Electronic Design Automation for IC System Design, Verification, and Testing
Author: Luciano LavagnoPublisher: CRC Press
ISBN: 1482254638
Category : Technology & Engineering
Languages : en
Pages : 644
Book Description
The first of two volumes in the Electronic Design Automation for Integrated Circuits Handbook, Second Edition, Electronic Design Automation for IC System Design, Verification, and Testing thoroughly examines system-level design, microarchitectural design, logic verification, and testing. Chapters contributed by leading experts authoritatively discuss processor modeling and design tools, using performance metrics to select microprocessor cores for integrated circuit (IC) designs, design and verification languages, digital simulation, hardware acceleration and emulation, and much more. New to This Edition: Major updates appearing in the initial phases of the design flow, where the level of abstraction keeps rising to support more functionality with lower non-recurring engineering (NRE) costs Significant revisions reflected in the final phases of the design flow, where the complexity due to smaller and smaller geometries is compounded by the slow progress of shorter wavelength lithography New coverage of cutting-edge applications and approaches realized in the decade since publication of the previous edition—these are illustrated by new chapters on high-level synthesis, system-on-chip (SoC) block-based design, and back-annotating system-level models Offering improved depth and modernity, Electronic Design Automation for IC System Design, Verification, and Testing provides a valuable, state-of-the-art reference for electronic design automation (EDA) students, researchers, and professionals.
Automated Testing and Fault Isolation of a Low Frequency Analog Circuit Card Assembly
Author: Michael David PilkentonPublisher:
ISBN:
Category : Electric circuit analysis
Languages : en
Pages : 524
Book Description
This thesis describes the automated testing and fault isolation which is performed on a Circuit Card Assembly (CCA) used in a complex naval weapons system. The automated testing is performed using a Hewlett Packard 9826 computer and IEEE-488 bus compatible equipment which comprise the Test Set known as the TE304. A complete circuit analysis of the CCA being tested is included in this thesis as well as program descriptions of the Acceptance Test Program and the Fault Isolation Program. Also included in this thesis is background information on the TE304 Automated Test Set, the equipment which make it up, and the software which is used to control it. This thesis was made possible through a U.S. Navy contract between the University of Louisville Electrical Engineering Department and the Naval Ordnance Station in Louisville. (Author).