Atomic Scale Structure and Chemistry of Interfaces by Z-contrast Imaging and Electron Energy Loss Spectroscopy in the Stem PDF Download
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Author: Publisher: ISBN: Category : Languages : en Pages : 7
Book Description
The macroscopic properties of many materials are controlled by the structure and chemistry at grain boundaries. A basic understanding of the structure-property relationship requires a technique which probes both composition and chemical bonding on an atomic scale. High-resolution Z-contrast imaging in the scanning transmission electron microscope (STEM) forms an incoherent image in which changes in atomic structure and composition across an interface can be interpreted directly without the need for preconceived atomic structure models. Since the Z-contrast image is formed by electrons scattered through high angles, parallel detection electron energy loss spectroscopy (PEELS) can be used simultaneously to provide complementary chemical information on an atomic scale. The fine structure in the PEEL spectra can be used to investigate the local electronic structure and the nature of the bonding across the interface. In this paper we use the complimentary techniques of high resolution Z-contrast imaging and PEELS to investigate the atomic structure and chemistry of a 25° symmetric tilt boundary in a bicrystal of the electroceramic SrTiO3.
Author: Publisher: ISBN: Category : Languages : en Pages : 7
Book Description
The macroscopic properties of many materials are controlled by the structure and chemistry at grain boundaries. A basic understanding of the structure-property relationship requires a technique which probes both composition and chemical bonding on an atomic scale. High-resolution Z-contrast imaging in the scanning transmission electron microscope (STEM) forms an incoherent image in which changes in atomic structure and composition across an interface can be interpreted directly without the need for preconceived atomic structure models. Since the Z-contrast image is formed by electrons scattered through high angles, parallel detection electron energy loss spectroscopy (PEELS) can be used simultaneously to provide complementary chemical information on an atomic scale. The fine structure in the PEEL spectra can be used to investigate the local electronic structure and the nature of the bonding across the interface. In this paper we use the complimentary techniques of high resolution Z-contrast imaging and PEELS to investigate the atomic structure and chemistry of a 25° symmetric tilt boundary in a bicrystal of the electroceramic SrTiO3.
Author: Publisher: ISBN: Category : Languages : en Pages : 3
Book Description
Combination of Z-contrast imaging and EELS (electron energy loss spectroscopy) allows the local structure and chemistry of interfaces to be determined on the atomic scale. In this paper, these two complementary techniques are used to analyze the structure and chemistry of a nominally 25 degree [100] symmetric tilt boundary in an electroceramic SrTiO3 bicrystal.
Author: Weronika Walkosz Publisher: Springer Science & Business Media ISBN: 1441978178 Category : Technology & Engineering Languages : en Pages : 114
Book Description
This thesis presents results from a combined atomic-resolution Z-contrast and annular bright-field imaging and electron energy loss spectroscopy in the Scanning Transmission Electron Microscopy, as well as first principles studies of the interfaces between crystalline β−Si3N4 and amorphous (i) CeO2-x as well as (ii) SiO2 intergranular film (IGF). These interfaces are of a great fundamental and technological interest because they play an important role in the microstructural evolution and mechanical properties of Si3N4 ceramics used in many high temperature and pressure applications. The main contribution of this work is its detailed description of the bonding characteristics of light atoms, in particular oxygen and nitrogen, at these interfaces, which has not been achieved before. The atomic-scale information on the arrangement of both light and heavy atoms is critical for realistic modeling of interface properties, such as interface strength and ion transport, and will facilitate increased control over the performance of ceramic and semiconductor materials for a wide-range of applications.
Author: Publisher: ISBN: Category : Languages : en Pages : 9
Book Description
Z-contrast scanning transmission electron microscopy (STEM) is a fundamentally new approach to high-resolution imaging which provides unambiguous, compositionally sensitive images on the atomic scale. Such images are intuitively interpretable, even in thick regions of the sample, tremendously simplifying determination of the structure and chemistry of defects and interfaces. To illustrate this, examples are presented of commonly observed planar defects in laser-ablated thin films of YBa2Cu3O{sub 7-x}. Film/substrate interfaces are shown to be chemically diffuse on the atomic scale and steps or undulations in the substrate need not result in defects in the film. Low-angle grain boundaries are found to be chemically clean, the drastic reductions in critical currents with tilt angle being due to the array of intrinsic structural defects comprising the boundary. 20 refs., 10 figs.
Author: Society for the Advancement of Material and Process Engineering Publisher: Society for the Advancement of Material & Process Engineering ISBN: Category : Technology & Engineering Languages : en Pages : 1744
Author: Y. Ito Publisher: ISBN: Category : Languages : en Pages : 6
Book Description
Gd(3+) doped Ce oxides are a major candidate for use as the electrolyte in solid oxide fuel cells operating at ^ 500 deg C. Here, the effect of the atomic structure on the local electronic properties, i.e., oxygen coordination and cation valence, at grain boundaries in the fluorite structured Gd(0.2)Ce(0.8)O(2-x) ceramic electrolyte is investigated by a combination of atomic resolution Z-contrast imaging and electron energy loss spectroscopy (EELS) in the scanning transmission electron microscope (STEM). In particular, EELS analyses from grain boundaries reveals a complex interaction between segregation of the dopant (Gd(3+)), oxygen vacancies and the valence state of Ce. These results are similar to observations from fluorite-structured Yttria-Stabilized Zirconium (YSZ) bicrystal grain boundaries.
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Author: Weronika Walkosz
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Author: Society for the Advancement of Material and Process Engineering
Author: Y. Ito
Author: James A. Schwarz
Author: David K. Fork