Author: Publisher:
ISBN:
Category :
Languages : en
Pages :
Book Description
Atomic-resolution Characterization of Interface Structure and Chemistry in the STEM.
Author: Scientific and Technical Aerospace Reports
Author: Atomic Scale Characterization and First-Principles Studies of Si3N4 Interfaces
Author: Weronika WalkoszPublisher: Springer Science & Business Media
ISBN: 1441978178
Category : Technology & Engineering
Languages : en
Pages : 114
Book Description
This thesis presents results from a combined atomic-resolution Z-contrast and annular bright-field imaging and electron energy loss spectroscopy in the Scanning Transmission Electron Microscopy, as well as first principles studies of the interfaces between crystalline β−Si3N4 and amorphous (i) CeO2-x as well as (ii) SiO2 intergranular film (IGF). These interfaces are of a great fundamental and technological interest because they play an important role in the microstructural evolution and mechanical properties of Si3N4 ceramics used in many high temperature and pressure applications. The main contribution of this work is its detailed description of the bonding characteristics of light atoms, in particular oxygen and nitrogen, at these interfaces, which has not been achieved before. The atomic-scale information on the arrangement of both light and heavy atoms is critical for realistic modeling of interface properties, such as interface strength and ion transport, and will facilitate increased control over the performance of ceramic and semiconductor materials for a wide-range of applications.
Energy Research Abstracts
Author: Atomic Scale Structure and Chemistry of Interfaces by Z-contrast Imaging and Electron Energy Loss Spectroscopy in the Stem
Author: Publisher:
ISBN:
Category :
Languages : en
Pages : 7
Book Description
The macroscopic properties of many materials are controlled by the structure and chemistry at grain boundaries. A basic understanding of the structure-property relationship requires a technique which probes both composition and chemical bonding on an atomic scale. High-resolution Z-contrast imaging in the scanning transmission electron microscope (STEM) forms an incoherent image in which changes in atomic structure and composition across an interface can be interpreted directly without the need for preconceived atomic structure models. Since the Z-contrast image is formed by electrons scattered through high angles, parallel detection electron energy loss spectroscopy (PEELS) can be used simultaneously to provide complementary chemical information on an atomic scale. The fine structure in the PEEL spectra can be used to investigate the local electronic structure and the nature of the bonding across the interface. In this paper we use the complimentary techniques of high resolution Z-contrast imaging and PEELS to investigate the atomic structure and chemistry of a 25° symmetric tilt boundary in a bicrystal of the electroceramic SrTiO3.
Transmission Electron Energy Loss Spectrometry in Materials Science and the EELS Atlas
Author: Channing C. AhnPublisher: John Wiley & Sons
ISBN: 3527604774
Category : Science
Languages : en
Pages : 472
Book Description
This book/CD package provides a reference on electron energy loss spectrometry (EELS) with the transmission electron microscope, an established technique for chemical and structural analysis of thin specimens in a transmission electron microscope. Describing the issues of instrumentation, data acquisition, and data analysis, the authors apply this technique to several classes of materials, namely ceramics, metals, polymers, minerals, semiconductors, and magnetic materials. The accompanying CD-ROM consists of a compendium of experimental spectra.
Encyclopedia of Interfacial Chemistry
Author: Publisher: Elsevier
ISBN: 0128098945
Category : Science
Languages : en
Pages : 5276
Book Description
Encyclopedia of Interfacial Chemistry: Surface Science and Electrochemistry, Seven Volume Set summarizes current, fundamental knowledge of interfacial chemistry, bringing readers the latest developments in the field. As the chemical and physical properties and processes at solid and liquid interfaces are the scientific basis of so many technologies which enhance our lives and create new opportunities, its important to highlight how these technologies enable the design and optimization of functional materials for heterogeneous and electro-catalysts in food production, pollution control, energy conversion and storage, medical applications requiring biocompatibility, drug delivery, and more. This book provides an interdisciplinary view that lies at the intersection of these fields. Presents fundamental knowledge of interfacial chemistry, surface science and electrochemistry and provides cutting-edge research from academics and practitioners across various fields and global regions
Government Reports Announcements & Index
Author: Atomic-scale Characterization of Interfaces and Defects in Electronic Heterostructures
Author: Lianfeng FuFast Ionic Conductors and Solid-Solid Interfaces Designed for Next Generation Solid-State Batteries
Author: Fuminori MizunoPublisher: Frontiers Media SA
ISBN: 2889456471
Category :
Languages : en
Pages : 136
Book Description