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Author: Shojiro Asai Publisher: Springer ISBN: 4431565949 Category : Technology & Engineering Languages : en Pages : 792
Book Description
This book discusses the new roles that the VLSI (very-large-scale integration of semiconductor circuits) is taking for the safe, secure, and dependable design and operation of electronic systems. The book consists of three parts. Part I, as a general introduction to this vital topic, describes how electronic systems are designed and tested with particular emphasis on dependability engineering, where the simultaneous assessment of the detrimental outcome of failures and cost of their containment is made. This section also describes the related research project “Dependable VLSI Systems,” in which the editor and authors of the book were involved for 8 years. Part II addresses various threats to the dependability of VLSIs as key systems components, including time-dependent degradations, variations in device characteristics, ionizing radiation, electromagnetic interference, design errors, and tampering, with discussion of technologies to counter those threats. Part III elaborates on the design and test technologies for dependability in such applications as control of robots and vehicles, data processing, and storage in a cloud environment and heterogeneous wireless telecommunications. This book is intended to be used as a reference for engineers who work on the design and testing of VLSI systems with particular attention to dependability. It can be used as a textbook in graduate courses as well. Readers interested in dependable systems from social and industrial–economic perspectives will also benefit from the discussions in this book.
Author: Shojiro Asai Publisher: Springer ISBN: 4431565949 Category : Technology & Engineering Languages : en Pages : 792
Book Description
This book discusses the new roles that the VLSI (very-large-scale integration of semiconductor circuits) is taking for the safe, secure, and dependable design and operation of electronic systems. The book consists of three parts. Part I, as a general introduction to this vital topic, describes how electronic systems are designed and tested with particular emphasis on dependability engineering, where the simultaneous assessment of the detrimental outcome of failures and cost of their containment is made. This section also describes the related research project “Dependable VLSI Systems,” in which the editor and authors of the book were involved for 8 years. Part II addresses various threats to the dependability of VLSIs as key systems components, including time-dependent degradations, variations in device characteristics, ionizing radiation, electromagnetic interference, design errors, and tampering, with discussion of technologies to counter those threats. Part III elaborates on the design and test technologies for dependability in such applications as control of robots and vehicles, data processing, and storage in a cloud environment and heterogeneous wireless telecommunications. This book is intended to be used as a reference for engineers who work on the design and testing of VLSI systems with particular attention to dependability. It can be used as a textbook in graduate courses as well. Readers interested in dependable systems from social and industrial–economic perspectives will also benefit from the discussions in this book.
Author: Slawomir Koziel Publisher: Springer Science & Business Media ISBN: 1461475511 Category : Mathematics Languages : en Pages : 413
Book Description
Contemporary engineering design is heavily based on computer simulations. Accurate, high-fidelity simulations are used not only for design verification but, even more importantly, to adjust parameters of the system to have it meet given performance requirements. Unfortunately, accurate simulations are often computationally very expensive with evaluation times as long as hours or even days per design, making design automation using conventional methods impractical. These and other problems can be alleviated by the development and employment of so-called surrogates that reliably represent the expensive, simulation-based model of the system or device of interest but they are much more reasonable and analytically tractable. This volume features surrogate-based modeling and optimization techniques, and their applications for solving difficult and computationally expensive engineering design problems. It begins by presenting the basic concepts and formulations of the surrogate-based modeling and optimization paradigm and then discusses relevant modeling techniques, optimization algorithms and design procedures, as well as state-of-the-art developments. The chapters are self-contained with basic concepts and formulations along with applications and examples. The book will be useful to researchers in engineering and mathematics, in particular those who employ computationally heavy simulations in their design work.
Author: Swarup Bhunia Publisher: Springer Science & Business Media ISBN: 1441974180 Category : Technology & Engineering Languages : en Pages : 444
Book Description
Design considerations for low-power operations and robustness with respect to variations typically impose contradictory requirements. Low-power design techniques such as voltage scaling, dual-threshold assignment and gate sizing can have large negative impact on parametric yield under process variations. This book focuses on circuit/architectural design techniques for achieving low power operation under parameter variations. We consider both logic and memory design aspects and cover modeling and analysis, as well as design methodology to achieve simultaneously low power and variation tolerance, while minimizing design overhead. This book will discuss current industrial practices and emerging challenges at future technology nodes.
Author: Publisher: I E E E ISBN: 9780769508870 Category : Business & Economics Languages : en Pages : 524
Book Description
These conference proceedings cover such topics as: analogue and mixed signal tests; memory built-in self-test and self-diagnosis; fault simulation and timing simulation; fault analysis; test generation; functional testing; and memory testing.
Author: Mohammad Tehranipoor Publisher: Springer Science & Business Media ISBN: 1441982973 Category : Technology & Engineering Languages : en Pages : 228
Book Description
This book will introduce new techniques for detecting and diagnosing small-delay defects in integrated circuits. Although this sort of timing defect is commonly found in integrated circuits manufactured with nanometer technology, this will be the first book to introduce effective and scalable methodologies for screening and diagnosing small-delay defects, including important parameters such as process variations, crosstalk, and power supply noise.
Author: Paul D. Franzon Publisher: John Wiley & Sons ISBN: 3527697063 Category : Technology & Engineering Languages : en Pages : 655
Book Description
This fourth volume of the landmark handbook focuses on the design, testing, and thermal management of 3D-integrated circuits, both from a technological and materials science perspective. Edited and authored by key contributors from top research institutions and high-tech companies, the first part of the book provides an overview of the latest developments in 3D chip design, including challenges and opportunities. The second part focuses on the test methods used to assess the quality and reliability of the 3D-integrated circuits, while the third and final part deals with thermal management and advanced cooling technologies and their integration.
Author: Wiktor B. Daszczuk Publisher: Springer ISBN: 3030128350 Category : Technology & Engineering Languages : en Pages : 248
Book Description
In modern distributed systems, such as the Internet of Things or cloud computing, verifying their correctness is an essential aspect. This requires modeling approaches that reflect the natural characteristics of such systems: the locality of their components, autonomy of their decisions, and their asynchronous communication. However, most of the available verifiers are unrealistic because one or more of these features are not reflected. Accordingly, in this book we present an original formalism: the Integrated Distributed Systems Model (IMDS), which defines a system as two sets (states and messages), and a relation of the "actions" between these sets. The server view and the traveling agent’s view of the system provide communication duality, while general temporal formulas for the IMDS allow automatic verification. The features that the model checks include: partial deadlock and partial termination, communication deadlock and resource deadlock. Automatic verification can support the rapid development of distributed systems. Further, on the basis of the IMDS, the Dedan tool for automatic verification of distributed systems has been developed.
Author: George A. Tsihrintzis Publisher: Springer ISBN: 3030156281 Category : Technology & Engineering Languages : en Pages : 552
Book Description
This book is the inaugural volume in the new Springer series on Learning and Analytics in Intelligent Systems. The series aims at providing, in hard-copy and soft-copy form, books on all aspects of learning, analytics, advanced intelligent systems and related technologies. These disciplines are strongly related and mutually complementary; accordingly, the new series encourages an integrated approach to themes and topics in these disciplines, which will result in significant cross-fertilization, research advances and new knowledge creation. To maximize the dissemination of research findings, the series will publish edited books, monographs, handbooks, textbooks and conference proceedings. This book is intended for professors, researchers, scientists, engineers and students. An extensive list of references at the end of each chapter allows readers to probe further into those application areas that interest them most.
Author: Ashutosh Kumar Singh Publisher: Springer ISBN: 9811388210 Category : Technology & Engineering Languages : en Pages : 268
Book Description
The book compiles efficient design and test methodologies for the implementation of reversible logic circuits. The methodologies covered in the book are design approaches, test approaches, fault tolerance in reversible circuits and physical implementation techniques. The book also covers the challenges and the reversible logic circuits to meet these challenges stimulated during each stage of work cycle. The novel computing paradigms are being explored to serve as a basis for fast and low power computation.
Author: Shojiro Asai
Author: Shojiro Asai
Author: Slawomir Koziel
Author: 
Author: Swarup Bhunia
Author: 
Author: Mohammad Tehranipoor
Author: Paul D. Franzon
Author: Wiktor B. Daszczuk
Author: George A. Tsihrintzis
Author: Ashutosh Kumar Singh