Author:
Publisher:
ISBN:
Category : Aeronautics
Languages : en
Pages : 628
Book Description
Proceedings in Print
List of Accessions to the Library
Author: Science Museum (Great Britain). Library
Publisher:
ISBN:
Category : Science
Languages : en
Pages : 502
Book Description
Publisher:
ISBN:
Category : Science
Languages : en
Pages : 502
Book Description
Corrosion Abstracts
Author:
Publisher:
ISBN:
Category : Corrosion and anti-corrosives
Languages : en
Pages : 728
Book Description
Publisher:
ISBN:
Category : Corrosion and anti-corrosives
Languages : en
Pages : 728
Book Description
American Book Publishing Record
Failure Analysis
Author: Marius Bazu
Publisher: John Wiley & Sons
ISBN: 1119990009
Category : Technology & Engineering
Languages : en
Pages : 372
Book Description
Failure analysis is the preferred method to investigate product or process reliability and to ensure optimum performance of electrical components and systems. The physics-of-failure approach is the only internationally accepted solution for continuously improving the reliability of materials, devices and processes. The models have been developed from the physical and chemical phenomena that are responsible for degradation or failure of electronic components and materials and now replace popular distribution models for failure mechanisms such as Weibull or lognormal. Reliability engineers need practical orientation around the complex procedures involved in failure analysis. This guide acts as a tool for all advanced techniques, their benefits and vital aspects of their use in a reliability programme. Using twelve complex case studies, the authors explain why failure analysis should be used with electronic components, when implementation is appropriate and methods for its successful use. Inside you will find detailed coverage on: a synergistic approach to failure modes and mechanisms, along with reliability physics and the failure analysis of materials, emphasizing the vital importance of cooperation between a product development team involved the reasons why failure analysis is an important tool for improving yield and reliability by corrective actions the design stage, highlighting the ‘concurrent engineering' approach and DfR (Design for Reliability) failure analysis during fabrication, covering reliability monitoring, process monitors and package reliability reliability resting after fabrication, including reliability assessment at this stage and corrective actions a large variety of methods, such as electrical methods, thermal methods, optical methods, electron microscopy, mechanical methods, X-Ray methods, spectroscopic, acoustical, and laser methods new challenges in reliability testing, such as its use in microsystems and nanostructures This practical yet comprehensive reference is useful for manufacturers and engineers involved in the design, fabrication and testing of electronic components, devices, ICs and electronic systems, as well as for users of components in complex systems wanting to discover the roots of the reliability flaws for their products.
Publisher: John Wiley & Sons
ISBN: 1119990009
Category : Technology & Engineering
Languages : en
Pages : 372
Book Description
Failure analysis is the preferred method to investigate product or process reliability and to ensure optimum performance of electrical components and systems. The physics-of-failure approach is the only internationally accepted solution for continuously improving the reliability of materials, devices and processes. The models have been developed from the physical and chemical phenomena that are responsible for degradation or failure of electronic components and materials and now replace popular distribution models for failure mechanisms such as Weibull or lognormal. Reliability engineers need practical orientation around the complex procedures involved in failure analysis. This guide acts as a tool for all advanced techniques, their benefits and vital aspects of their use in a reliability programme. Using twelve complex case studies, the authors explain why failure analysis should be used with electronic components, when implementation is appropriate and methods for its successful use. Inside you will find detailed coverage on: a synergistic approach to failure modes and mechanisms, along with reliability physics and the failure analysis of materials, emphasizing the vital importance of cooperation between a product development team involved the reasons why failure analysis is an important tool for improving yield and reliability by corrective actions the design stage, highlighting the ‘concurrent engineering' approach and DfR (Design for Reliability) failure analysis during fabrication, covering reliability monitoring, process monitors and package reliability reliability resting after fabrication, including reliability assessment at this stage and corrective actions a large variety of methods, such as electrical methods, thermal methods, optical methods, electron microscopy, mechanical methods, X-Ray methods, spectroscopic, acoustical, and laser methods new challenges in reliability testing, such as its use in microsystems and nanostructures This practical yet comprehensive reference is useful for manufacturers and engineers involved in the design, fabrication and testing of electronic components, devices, ICs and electronic systems, as well as for users of components in complex systems wanting to discover the roots of the reliability flaws for their products.
EPA 600/1
Zirconium in the Nuclear Industry
Author: Gerry D. Moan
Publisher: ASTM International
ISBN: 0803128959
Category : Nuclear fuel claddings
Languages : en
Pages : 891
Book Description
Annotation The 41 papers of this proceedings volume were first presented at the 13th symposium on Zirconium in the Nuclear Industry held in Annecy, France in June of 2001. Many of the papers are devoted to material related issues, corrosion and hydriding behavior, in-reactor studies, and the behavior and properties of Zr alloys used in storing spent fuel. Some papers report on studies of second phase particles, irradiation creep and growth, and material performance during loss of coolant and reactivity initiated accidents. Annotation copyrighted by Book News, Inc., Portland, OR.
Publisher: ASTM International
ISBN: 0803128959
Category : Nuclear fuel claddings
Languages : en
Pages : 891
Book Description
Annotation The 41 papers of this proceedings volume were first presented at the 13th symposium on Zirconium in the Nuclear Industry held in Annecy, France in June of 2001. Many of the papers are devoted to material related issues, corrosion and hydriding behavior, in-reactor studies, and the behavior and properties of Zr alloys used in storing spent fuel. Some papers report on studies of second phase particles, irradiation creep and growth, and material performance during loss of coolant and reactivity initiated accidents. Annotation copyrighted by Book News, Inc., Portland, OR.
Synthesis of Solid Catalysts
Author: Krijn P. de Jong
Publisher: John Wiley & Sons
ISBN: 3527320407
Category : Science
Languages : en
Pages : 436
Book Description
This practical book combines recent progress with a discussion of the general aspects of catalyst preparation. The first part deals with the basic principles of solid catalyst preparation, explaining the main aspects of sol-gel chemistry and interfacial chemistry, followed by such techniques as co-precipitation and immobilization. New tools for catalyst preparation research, including microspectroscopy and high-throughput experimentation, are also taken into account. The second part heightens the practical relevance by providing six case studies on such topics as the preparation of zeolites, hydrotreating catalysts, methanol catalysts and gold catalysts
Publisher: John Wiley & Sons
ISBN: 3527320407
Category : Science
Languages : en
Pages : 436
Book Description
This practical book combines recent progress with a discussion of the general aspects of catalyst preparation. The first part deals with the basic principles of solid catalyst preparation, explaining the main aspects of sol-gel chemistry and interfacial chemistry, followed by such techniques as co-precipitation and immobilization. New tools for catalyst preparation research, including microspectroscopy and high-throughput experimentation, are also taken into account. The second part heightens the practical relevance by providing six case studies on such topics as the preparation of zeolites, hydrotreating catalysts, methanol catalysts and gold catalysts
Future Trends in Microelectronics
Author: S. Luryi
Publisher: Springer
ISBN: 9780792341697
Category : Science
Languages : en
Pages : 440
Book Description
Silicon technology has developed along virtually one single line: reducing the minimal size of lithographic features. But has this taken us to the point of diminishing returns? Are we now at a turning point in the logical evolution of microelectronics? Some believe that the semiconductor microelectronics industry has matured: the research game is over (comparisons with the steel industry are being made). Others believe that qualitative progress in hardware technology will come roaring back, based on innovative research. This debate, spirited as it is, is reflected in the pages of Future Trends in Microelectronics, where such questions are discussed. What kind of research does the silicon industry need to continue its expansion? What is the technical limit to shrinking Si devices? Is there any economic sense in pursuing this limit? What are the most attractive applications of optoelectronic hybrid systems? Are there any green pastures beyond the traditional semiconductor technologies? Identifying the scenario for the future evolution of microelectronics will present a tremendous opportunity for constructive action today.
Publisher: Springer
ISBN: 9780792341697
Category : Science
Languages : en
Pages : 440
Book Description
Silicon technology has developed along virtually one single line: reducing the minimal size of lithographic features. But has this taken us to the point of diminishing returns? Are we now at a turning point in the logical evolution of microelectronics? Some believe that the semiconductor microelectronics industry has matured: the research game is over (comparisons with the steel industry are being made). Others believe that qualitative progress in hardware technology will come roaring back, based on innovative research. This debate, spirited as it is, is reflected in the pages of Future Trends in Microelectronics, where such questions are discussed. What kind of research does the silicon industry need to continue its expansion? What is the technical limit to shrinking Si devices? Is there any economic sense in pursuing this limit? What are the most attractive applications of optoelectronic hybrid systems? Are there any green pastures beyond the traditional semiconductor technologies? Identifying the scenario for the future evolution of microelectronics will present a tremendous opportunity for constructive action today.
Annual Report FY...
Author: National Institutes of Health (U.S.). Biomedical Engineering and Instrumentation Branch
Publisher:
ISBN:
Category : Biomedical engineering
Languages : en
Pages : 140
Book Description
Publisher:
ISBN:
Category : Biomedical engineering
Languages : en
Pages : 140
Book Description