Author: Symposium on Applications of Electron MicrofractogPublisher: ASTM International
ISBN:
Category :
Languages : en
Pages : 103
Book Description
Applications of Electron Microfractography to Materials Research
Author: Symposium on Applications of Electron MicrofractogPublisher: ASTM International
ISBN:
Category :
Languages : en
Pages : 103
Book Description
Applications of Electron Microfractography to Materials Research
Author: Publisher: ASTM International
ISBN:
Category : Electron microscopes
Languages : en
Pages : 108
Book Description
Applications of Electron Microfractography to Materials Research
Author: W. WiebePublisher:
ISBN: 9780803107465
Category : Aluminum alloys
Languages : en
Pages : 96
Book Description
Applications of Electron Microfractography to Materials Research
Author: Nuclear Science Abstracts
Author: Paperbound Books in Print
Author: Books in Print
Author: Publisher:
ISBN:
Category : American literature
Languages : en
Pages : 2132
Book Description
Systematic Materials Analysis
Author: J.H. RichardsonPublisher: Elsevier
ISBN: 0323147569
Category : Science
Languages : en
Pages : 512
Book Description
Systematic Materials Analysis, Volume IV presents refined instrumental methods available for materials analysis, which involves the complete characterization of a material, including structural and textural analyses in addition to chemical analysis. This volume is composed of 11 chapters. Each chapter on specific instruments outlines the theories of operation and describes their capability for qualitative and quantitative measurements of chemical composition, structure, and texture. The sensitivity and selectivity of each method are emphasized. The specific techniques and instruments covered in this book include the atomic-absorption and atomic-fluorescence flame photometry, ion microprobe, mass spectrometry, neutron diffractometry, polarimetry, polarography, dynamic thermal analysis, and transmission electron microscopy. This book is intended primarily to materials analysts, engineers, researchers, and undergraduate and graduate level students.
Author: 
Author: