Author: Sam S. FisherPublisher:
ISBN:
Category :
Languages : en
Pages : 40
Book Description
Application of low-energy molecular beams to the determination of the surface phonon spectrum of a crystal
Author: Sam S. FisherScientific and Technical Aerospace Reports
Author: Grants and Awards for the Fiscal Year Ended ...
Author: National Science Foundation (U.S.)Publisher:
ISBN:
Category : Federal aid to research
Languages : en
Pages : 288
Book Description
Molecular Beam Studies of Surface Phonons and Gas Surface Interactions
Author: Steven J. SibenerPublisher:
ISBN:
Category :
Languages : en
Pages : 5
Book Description
Angle and velocity resolved inelastic helium scattering is becoming an incisive tool for probing the vibrational characteristics of clean and adsorbate covered surfaces. These experiments can be visualized as being a two-dimensional (i.e., surface sensitive) analog to inelastic neutron scattering, which has played such a crucial role in elucidating the nature of elementary excitations in bulk crystals. In this paper a general review is presented of our recent work which demonstrates how the surface vibrational properties of epitaxially grown rare gas films evolve, on a layer-by-layer basis, towards those characteristic of thick crystals. Lattice dynamics calculations are used to quantitatively analyze the data. Keywords: Surface phonon spectroscopy, Thin film dynamics, Phonon dispersion relations, Physisorption interactions, Gas-surface energy exchange, Inelastic single phonon scattering, Rare gas interaction potentials, Molecular beams. (jhd).
Nuclear Science Abstracts
Author: Energy Research Abstracts
Author: Auger Electron Spectroscopy
Author: Donald T. HawkinsPublisher: Springer Science & Business Media
ISBN: 1468413872
Category : Science
Languages : en
Pages : 305
Book Description
Auger electron spectroscopy is rapidly developing into the single most powerful analytical technique in basic and applied science.for investigating the chemical and structural properties of solids. Its ex plosive growth beginning in 1967 was triggered by the development of Auger analyzers capable of de tecting one atom layer of material in a fraction of a second. Continued growth was guaranteed firstly by the commercial availability of apparatus which combined the capabilities of scanning electron mi croscopy and ion-mill depth profiling with Auger analysis, and secondly by the increasing need to know the atomistics of many processes in fundamental research and engineering applications. The expanding use of Auger analysis was accompanied by an increase in the number of publications dealing with it. Because of the developing nature of Auger spectroscopy, the articles have appeared in many different sources covering diverse disciplines, so that it is extremely difficult to discover just what has or has not been subjected to Auger analysis. In this situation, a comprehensive bibliography is obviou-sly useful to those both inside and outside the field. For those in the field, this bibliography should be a wonderful time saver for locating certain references, in researching a particular topic, or when considering various aspects of instrumentation or data analysis. This bibliography not only provides the most complete listing of references pertinent to surface Auger analysis available today, but it is also a basis for extrapolating from past trends to future expectations.
Survey of Semiconductor Physics, Electrons and Other Particles in Semiconductors
Author: Karl W. BöerPublisher: Wiley-VCH
ISBN:
Category : Science
Languages : en
Pages : 1360
Book Description
A comprehensive treatment of the fundamentals of semiconductor physics and materials science The first edition of the Survey of Semiconductor Physics set the standard for the multifaceted exploration of semiconductor physics. Now, Dr. Karl Böer, one of the world’s leading experts in solid-state physics, with assistance from a team of the fields top researchers, expands this coverage in the Second Edition. Completely updated and substantially expanded, the Survey of Semiconductor Physics, Second Edition covers the basic elements in the entire field of semiconductor physics, emphasizing the materials and surface science involved. The Second Edition uses similar theoretical approaches and analyses for the basic material classes: crystalline, amorphous, quantum structures, and organics. The first volume provides thorough coverage of the structure of semiconductors, including: Phonons Energy bands Photons as they interact with the semiconductor and other particles Defects Generation and recombination Kinetics In both volumes, extensive appendices simplify searches for important formulae and tables. An elaborate word index and reference listings allow readers to use the reference in multiple ways to discover expanding literature; to explore similarities and connecting principles in other fields; to find out how others in adjacent fields came up with intriguing solutions to similar problems; and to obtain a broad overview of the entire field of semiconductor physics.
Physics Briefs
Author: Surface Characterization
Author: Dag BrunePublisher: John Wiley & Sons
ISBN: 3527612440
Category : Science
Languages : en
Pages : 715
Book Description
"Surface Characterization" provides an authoritative guide to the wide range of powerful techniques that are used to characterize the surfaces of materials. Practical in approach, it not only describes the major analytical techniques but emphasizes how they can be used to solve a multitude of chemical and physical problems. A special feature of the book is that the various techniques are grouped according to the material property under investigation. These parts are preceded by an overview comparing the capabilities of the characterization methods available. Extensive data tables allow the reader to assess rapidly the strengths as well as the pitfalls inherent in each method. Chapters on chemical composition, optical and crystallographic properties, microtopography, surface processes, tribological, electrical and magnetic properties of surface films are featured. In addition, chapters specializing on applications within the life sciences on the microscopic scale and chemometrics are included. "Surface Characterization" is addressed to both academic and industrial audiences. Scientists and engineers working on the production and development of new materials will find it an invaluable reference source. Physicist, chemists, chemical engineers, material scientists and engineers from every area of materials research will benefit from the wealth of practical advice the book provides.