Application of Ion Beam Milling to the Characterization of Cracks in Metals (Classic Reprint) PDF Download
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Author: Lewis K. Ives Publisher: Forgotten Books ISBN: 9780331414028 Category : Technology & Engineering Languages : en Pages : 38
Book Description
Excerpt from Application of Ion Beam Milling to the Characterization of Cracks in Metals Ion beam milling as a surface preparation method appears to be less subject to the deficiencies noted above. With sufficiently low ion energies, radiation damage that occurs does not extend more than ahundred atomic layers below the surface. Any radiation damage effect could be minimized by maintaining the specimen at a low temperature. Care should be taken not to allow the specimen temperature to rise during ion bombardment. This paper describes the results of a study of ion beam milling at cracks under controlled conditions. About the Publisher Forgotten Books publishes hundreds of thousands of rare and classic books. Find more at www.forgottenbooks.com This book is a reproduction of an important historical work. Forgotten Books uses state-of-the-art technology to digitally reconstruct the work, preserving the original format whilst repairing imperfections present in the aged copy. In rare cases, an imperfection in the original, such as a blemish or missing page, may be replicated in our edition. We do, however, repair the vast majority of imperfections successfully; any imperfections that remain are intentionally left to preserve the state of such historical works.
Author: Lewis K. Ives Publisher: Forgotten Books ISBN: 9780331414028 Category : Technology & Engineering Languages : en Pages : 38
Book Description
Excerpt from Application of Ion Beam Milling to the Characterization of Cracks in Metals Ion beam milling as a surface preparation method appears to be less subject to the deficiencies noted above. With sufficiently low ion energies, radiation damage that occurs does not extend more than ahundred atomic layers below the surface. Any radiation damage effect could be minimized by maintaining the specimen at a low temperature. Care should be taken not to allow the specimen temperature to rise during ion bombardment. This paper describes the results of a study of ion beam milling at cracks under controlled conditions. About the Publisher Forgotten Books publishes hundreds of thousands of rare and classic books. Find more at www.forgottenbooks.com This book is a reproduction of an important historical work. Forgotten Books uses state-of-the-art technology to digitally reconstruct the work, preserving the original format whilst repairing imperfections present in the aged copy. In rare cases, an imperfection in the original, such as a blemish or missing page, may be replicated in our edition. We do, however, repair the vast majority of imperfections successfully; any imperfections that remain are intentionally left to preserve the state of such historical works.
Author: John Carpenter Publisher: Springer ISBN: 3319481916 Category : Technology & Engineering Languages : en Pages : 773
Book Description
This collection focuses on the characterization of minerals, metals, and materials as well as the application of characterization results on the processing of these materials. Papers cover topics such as clays, ceramics, composites, ferrous metals, non-ferrous metals, minerals, electronic materials, magnetic materials, environmental materials, advanced materials, and soft materials. In addition, papers covering materials extraction, materials processing, corrosion, welding, solidification, and method development are included. This book provides a current snapshot of characterization in materials science and its role in validating, informing, and driving current theories in the field of materials science. This volume will serve the dual purpose of furnishing a broad introduction of the field to novices while simultaneously serving to keep subject matter experts up-to-date.
Author: Yang Leng Publisher: John Wiley & Sons ISBN: 0470822996 Category : Technology & Engineering Languages : en Pages : 384
Book Description
This book covers state-of-the-art techniques commonly used in modern materials characterization. Two important aspects of characterization, materials structures and chemical analysis, are included. Widely used techniques, such as metallography (light microscopy), X-ray diffraction, transmission and scanning electron microscopy, are described. In addition, the book introduces advanced techniques, including scanning probe microscopy. The second half of the book accordingly presents techniques such as X-ray energy dispersive spectroscopy (commonly equipped in the scanning electron microscope), fluorescence X-ray spectroscopy, and popular surface analysis techniques (XPS and SIMS). Finally, vibrational spectroscopy (FTIR and Raman) and thermal analysis are also covered.
Author: David Brandon Publisher: John Wiley & Sons ISBN: 1118681487 Category : Technology & Engineering Languages : en Pages : 517
Book Description
Microstructural characterization is usually achieved by allowing some form of probe to interact with a carefully prepared specimen. The most commonly used probes are visible light, X-ray radiation, a high-energy electron beam, or a sharp, flexible needle. These four types of probe form the basis for optical microscopy, X-ray diffraction, electron microscopy, and scanning probe microscopy. Microstructural Characterization of Materials, 2nd Edition is an introduction to the expertise involved in assessing the microstructure of engineering materials and to the experimental methods used for this purpose. Similar to the first edition, this 2nd edition explores the methodology of materials characterization under the three headings of crystal structure, microstructural morphology, and microanalysis. The principal methods of characterization, including diffraction analysis, optical microscopy, electron microscopy, and chemical microanalytical techniques are treated both qualitatively and quantitatively. An additional chapter has been added to the new edition to cover surface probe microscopy, and there are new sections on digital image recording and analysis, orientation imaging microscopy, focused ion-beam instruments, atom-probe microscopy, and 3-D image reconstruction. As well as being fully updated, this second edition also includes revised and expanded examples and exercises, with a solutions manual available at http://develop.wiley.co.uk/microstructural2e/ Microstructural Characterization of Materials, 2nd Edition will appeal to senior undergraduate and graduate students of material science, materials engineering, and materials chemistry, as well as to qualified engineers and more advanced researchers, who will find the book a useful and comprehensive general reference source.
Author: Charles A. Evans Publisher: Gulf Professional Publishing ISBN: 9780750691680 Category : Science Languages : en Pages : 784
Book Description
"This is a comprehensive volume on analytical techniques used in materials science for the characterization of surfaces, interfaces and thin films. This flagship volume is a unique, stand-alone reference for materials science practitioners, process engineers, students and anyone with a need to know about the capabilities available in materials analysis. An encyclopedia of 50 concise articles, this book will also be a practical companion to the forthcoming books in the series."--Knovel.
Author: Bhagwan D. Agarwal Publisher: Wiley-Interscience ISBN: Category : Technology & Engineering Languages : en Pages : 480
Book Description
Having fully established themselves as workable engineering materials, composite materials are now increasingly commonplace around the world. Serves as both a text and reference guide to the behavior of composite materials in different engineering applications. Revised for this Second Edition, the text includes a general discussion of composites as material, practical aspects of design and performance, and further analysis that will be helpful to those engaged in research on composites. Each chapter closes with references for further reading and a set of problems that will be useful in developing a better understanding of the subject.
Author: Lewis K. Ives
Author: Lewis K. Ives
Author: Institute for Materials Research (U.S.) Metallurgy Division
Author: I. K.. Ives
Author: Lauralice de Campos Franceschini Canale
Author: John Carpenter
Author: Yang Leng
Author: David Brandon
Author: Charles A. Evans
Author: Van Derck Frechette
Author: Bhagwan D. Agarwal