Author: Publisher:
ISBN:
Category :
Languages : en
Pages :
Book Description
ANNUAL NEW YORK CONFERENCE on ELECTRONIC RELIABILITY.
Author: PROCEEDINGS OF THE 6TH ANNUAL NEW YORK CONFERENCE ON ELECTRONIC RELIABILITY.
Author: Proceedings
Author: Institute of Electrical and Electronics EngineersPublisher:
ISBN:
Category :
Languages : en
Pages : 55
Book Description
Seventh annual New York Conference on Electronic Reliability
Author: 1966 IEEE Conference Record
Author: Publisher:
ISBN:
Category : Electronic apparatus and appliances
Languages : en
Pages :
Book Description
Proceedings
Author: Institute of Electrical and Electronics EngineersPublisher:
ISBN:
Category : Electric apparatus and appliances
Languages : en
Pages :
Book Description
Reliability Abstracts and Technical Reviews
Author: Publisher:
ISBN:
Category : Reliability (Engineering)
Languages : en
Pages : 920
Book Description
High-level Estimation and Exploration of Reliability for Multi-Processor System-on-Chip
Author: Zheng WangPublisher: Springer
ISBN: 9811010730
Category : Technology & Engineering
Languages : en
Pages : 210
Book Description
This book introduces a novel framework for accurately modeling the errors in nanoscale CMOS technology and developing a smooth tool flow at high-level design abstractions to estimate and mitigate the effects of errors. The book presents novel techniques for high-level fault simulation and reliability estimation as well as architecture-level and system-level fault tolerant designs. It also presents a survey of state-of-the-art problems and solutions, offering insights into reliability issues in digital design and their cross-layer countermeasures.
New York Review of the Telegraph and Telephone and Electrical Journal
Author: Publisher:
ISBN:
Category : Electrical engineering
Languages : en
Pages : 1096
Book Description
Author: