Fundamentals of Energy Dispersive X-Ray Analysis PDF Download

Author: John C. Russ
Publisher: Butterworth-Heinemann
ISBN: 1483164004
Category : Science
Languages : en
Pages : 315

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Book Description
Fundamentals of Energy Dispersive X-ray Analysis provides an introduction to the fundamental principles of dispersive X-ray analysis. It presents descriptions, equations, and graphs to enable the users of these techniques to develop an intuitive and conceptual image of the physical processes involved in the generation and detection of X-rays. The book begins with a discussion of X-ray detection and measurement, which is accomplished by one of two types of X-ray spectrometer: energy dispersive or wavelength dispersive. The emphasis is on energy dispersive spectrometers, given their rather widespread use compared to the wavelength dispersive type. This is followed by separate chapters on techniques such as X-ray absorption; spectrum processing; and elimination of spectrum background produced by electron excitation. Subsequent chapters cover X-ray fluorescence; the use of regression models; hardware for X-ray fluorescence analysis; scattering, background, and trace element analysis; and methods for producing inner shell excitation of atoms in a sample of interest. The final chapter deals with applications of X-ray analysis.

Author:
Publisher:
ISBN:
Category : X-ray spectroscopy
Languages : en
Pages : 12

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Book Description

Author: E.P. Bertin
Publisher: Springer Science & Business Media
ISBN: 1461344166
Category : Science
Languages : en
Pages : 1098

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Book Description
Since the first edition of this book was published early in 1970, three major developments have occurred in the field of x-ray spectrochemical analysis. First, wavelength-dispersive spectrometry, in 1970 already securely established among instrumental analytical methods, has matured. Highly sophisticated, miniaturized, modular, solid-state circuitry has replaced elec tron-tube circuitry in the readout system. Computers are now widely used to program and control fully automated spectrometers and to store, process, and compute analytical concentrations directly and immediately from ac cumulated count data. Matrix effects have largely yielded to mathematical treatment. The problems associated with the ultralong-wavelength region have been largely surmounted. Indirect (association) methods have extended the applicability of x-ray spectrometry to the entire periodic table and even to certain classes of compounds. Modern commercial, computerized, auto matic, simultaneous x-ray spectrometers can index up to 60 specimens in turn into the measurement position and for each collect count data for up to 30 elements and read out the analytical results in 1--4 min-all corrected for absorption-enhancement and particle-size or surface-texture effects and wholly unattended. Sample preparation has long been the time-limiting step in x-ray spectrochemical analysis. Second, energy-dispersive spectrometry, in 1970 only beginning to assume its place among instrumental analytical methods, has undergone phenomenal development and application and, some believe, may supplant wavelength spectrometry for most applications in the foreseeable future.

Author: DAISUKE Shindo
Publisher: Springer Science & Business Media
ISBN: 4431669884
Category : Science
Languages : en
Pages : 162

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Book Description
Analytical electron microscopy is one of the most powerful tools today for characterization of the advanced materials that support the nanotechnology of the twenty-first century. In this book the authors clearly explain both the basic principles and the latest developments in the field. In addition to a fundamental description of the inelastic scattering process, an explanation of the constituent hardware is provided. Standard quantitative analytical techniques employing electron energy-loss spectroscopy and energy-dispersive X-ray spectroscopy are also explained, along with elemental mapping techniques. Included are sections on convergent beam electron diffraction and electron holography utilizing the field emission gun. With generous use of illustrations and experimental data, this book is a valuable resource for anyone concerned with materials characterization, electron microscopy, materials science, crystallography, and instrumentation.

Author: Lawrence C. Wagner
Publisher: Springer Science & Business Media
ISBN: 1461549191
Category : Technology & Engineering
Languages : en
Pages : 256

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Book Description
This "must have" reference work for semiconductor professionals and researchers provides a basic understanding of how the most commonly used tools and techniques in silicon-based semiconductors are applied to understanding the root cause of electrical failures in integrated circuits.

Author: DC Bell
Publisher: Garland Science
ISBN: 1135331391
Category : Science
Languages : en
Pages : 270

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Book Description
This book provides an in-depth description of x-ray microanalysis in the electron microscope. It is sufficiently detailed to ensure that novices will understand the nuances of high-quality EDX analysis. Includes information about hardware design as well as the physics of x-ray generation, absorption and detection, and most post-detection data processing. Details on electron optics and electron probe formation allow the novice to make sensible adjustments to the electron microscope in order to set up a system which optimises analysis. It also helps the reader determine which microanalytical method is more suitable for their planned application.

Author: Joseph Goldstein
Publisher: Springer Science & Business Media
ISBN: 1461332737
Category : Science
Languages : en
Pages : 679

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Book Description
This book has evolved by processes of selection and expansion from its predecessor, Practical Scanning Electron Microscopy (PSEM), published by Plenum Press in 1975. The interaction of the authors with students at the Short Course on Scanning Electron Microscopy and X-Ray Microanalysis held annually at Lehigh University has helped greatly in developing this textbook. The material has been chosen to provide a student with a general introduction to the techniques of scanning electron microscopy and x-ray microanalysis suitable for application in such fields as biology, geology, solid state physics, and materials science. Following the format of PSEM, this book gives the student a basic knowledge of (1) the user-controlled functions of the electron optics of the scanning electron microscope and electron microprobe, (2) the characteristics of electron-beam-sample inter actions, (3) image formation and interpretation, (4) x-ray spectrometry, and (5) quantitative x-ray microanalysis. Each of these topics has been updated and in most cases expanded over the material presented in PSEM in order to give the reader sufficient coverage to understand these topics and apply the information in the laboratory. Throughout the text, we have attempted to emphasize practical aspects of the techniques, describing those instru ment parameters which the microscopist can and must manipulate to obtain optimum information from the specimen. Certain areas in particular have been expanded in response to their increasing importance in the SEM field. Thus energy-dispersive x-ray spectrometry, which has undergone a tremendous surge in growth, is treated in substantial detail.

Author: Kenneth P. Severin
Publisher: Springer Science & Business Media
ISBN: 1402028415
Category : Science
Languages : en
Pages : 228

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Book Description
This book provides a very basic introduction to electron microscopy and energy dispersive spectrometry (EDS). It has the largest compiled collection of EDS spectra ever published and covers most common rock forming minerals. In addition, it provides a key to help the novice wade through the large number of spectra.

Author: Bohdan Dziunikowski
Publisher: Pwn
ISBN:
Category : Analytical chemistry
Languages : en
Pages : 460

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Book Description
Hardbound. In Volume IIC of the series, G.L. Macdonald contributed a chapter on X-Ray Spectrometry in which the principles of X-ray fluorescence analysis were presented with great clarity. Since that contribution appeared in 1971 tremendous developments have taken place with one of the most important new features being the appearance of energy-dispersive methods.This new volume gives a detailed and up-to-date account of this important technique. It covers the various physical and technical problems associated with this analytical method, with emphasis on explaining the interferences due to matrix and particle size effects. Methods for overcoming these interferences are described and other sources of errors and the processing of measurement data are discussed. Also described are numerous applications of EDXRF analysis in a variety of fields including geological prospecting and mining, trace element analysis, biology, medicine, environmental pollution con

Author: Eugene P. Bertin
Publisher: Springer Science & Business Media
ISBN: 1489922040
Category : Science
Languages : en
Pages : 494

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Book Description
X-ray fluorescence spectrometry has been an established, widely practiced method of instrumental chemical analysis for about 30 years. However, although many colleges and universities offer full-semester courses in optical spectrometric methods of instrumental analysis and in x-ray dif fraction, very few offer full courses in x-ray spectrometric analysis. Those courses that are given are at the graduate level. Consequently, proficiency in this method must still be acquired by: self-instruction; on-the-job training and experience; "workshops" held by the x-ray instrument manu facturers; the one- or two-week summer courses offered by a few uni versities; and certain university courses in analytical and clinical chemistry, metallurgy, mineralogy. geology, ceramics. etc. that devote a small portion of their time to applications of x-ray spectrometry to those respective disciplines. Moreover, with all due respect to the books on x-ray spectrometric analysis now in print, in my opinion none is really suitable as a text or manual for beginners in the discipline. In 1968, when I undertook the writing of the first edition of my previous book, Principles and Practice of X-Ray Spectrometric Analysis,* my objective was to provide a student text. However, when all the material was compiled, I decided to provide a more comprehensive book, which was also lacking at that time. Although that book explains principles, instrumentation, and methods at the begin ner's level, this material is distributed throughout a mass of detail and more advanced material.